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Category: Profilometry | Flatness and Warpage

 

Roughness Mapping Inspection using 3D Profilometry

ROUGHNESS MAPPING INSPECTION

USING 3D PROFILOMETRY

Prepared by

DUANJIE, PhD

INTRODUCTION

Surface roughness and texture are critical factors that impact the final quality and performance of a product. A thorough understanding of surface roughness, texture, and consistency is essential for selecting the best processing and control measures. Fast, quantifiable, and reliable inline inspection of product surfaces is in need to identify the defective products in time and optimize production line conditions.

IMPORTANCE OF 3D NON-CONTACT PROFILOMETER FOR IN-LINE SURFACE INSPECTION

Surface defects in products result from materials processing and product manufacturing. Inline surface quality inspection ensures the tightest quality control of the end products. NANOVEA 3D Non-Contact Optical Profilers utilize Chromatic Light technology with unique capability to determine the roughness of a sample without contact. The line sensor enables scanning of the 3D profile of a large surface at a high speed. The roughness threshold, calculated in real-time by the analysis software, serves as a fast and reliable pass/fail tool.

MEASUREMENT OBJECTIVE

In this study, the NANOVEA ST400 equipped with a high-speed sensor is used to inspect the surface of a Teflon sample with defect to showcase the capability of NANOVEA

Non-Contact Profilometers in providing fast and reliable surface inspection in a production line.

NANOVEA

ST400

RESULTS & DISCUSSION

3D Surface Analysis of the Roughness Standard Sample

The surface of a Roughness Standard was scanned using a NANOVEA ST400 equipped with a high-speed sensor that generates a bright line of 192 points, as shown in FIGURE 1. These 192 points scan the sample surface at the same time, leading to significantly increased scan speed.

FIGURE 2 shows false color views of the Surface Height Map and Roughness Distribution Map of the Roughness Standard Sample. In FIGURE 2a, the Roughness Standard exhibits a slightly slanted surface as represented by the varied color gradient in each of the standard roughness blocks. In FIGURE 2b, homogeneous roughness distribution is shown in different roughness blocks, the color of which represents the roughness in the blocks.

FIGURE 3 shows the examples of the Pass/Fail Maps generated by the Analysis Software based on different Roughness Thresholds. The roughness blocks are highlighted in red when their surface roughness is above a certain set threshold value. This provides a tool for the user to set up a roughness threshold to determine the quality of a sample surface finish.

FIGURE 1: Optical line sensor scanning on the Roughness Standard sample

a. Surface Height Map:

b. Roughness Map:

FIGURE 2: False color views of the Surface Height Map and Roughness Distribution Map of the Roughness Standard Sample.

FIGURE 3: Pass/Fail Map based on the Roughness Threshold.

Surface Inspection of a Teflon Sample with Defects

Surface Height Map, Roughness Distribution Map and Pass/Fail Roughness Threshold Map of the Teflon sample surface are shown in FIGURE 4. The Teflon Sample has a ridge form at the right center of the sample as shown in the Surface Height Map.

a. Surface Height Map:

The different colors in the pallet of FIGURE 4b represents the roughness value on the local surface. The Roughness Map exhibits a homogeneous roughness in the intact area of the Teflon sample. However, the defects, in the forms of an indented ring and a wear scar are highlighted in bright color. The user can easily set up a Pass/Fail roughness threshold to locate the surface defects as shown in FIGURE 4c. Such a tool allows users to monitor in situ the product surface quality in the production line and discover defective products in time. The real-time roughness value is calculated and recorded as the products pass by the in-line optical sensor, which can serve as a fast but reliable tool for quality control.

b. Roughness Map:

c. Pass/Fail Roughness Threshold Map:

FIGURE 4: Surface Height Map, Roughness Distribution Map and Pass/Fail Roughness Threshold Map of the Teflon sample surface.

CONCLUSION

In this application, we have shown how the NANOVEA ST400 3D Non-Contact Optical Profiler equipped with an optical line sensor works as a reliable quality control tool in an effective and efficient manner.

The optical line sensor generates a bright line of 192 points that scan the sample surface at the same time, leading to significantly increased scan speed. It can be installed in the production line to monitor the surface roughness of the products in situ. The roughness threshold works as a dependable criteria to determine the surface quality of the products, allowing users to notice the defective products in time.

The data shown here represents only a portion of the calculations available in the analysis software. NANOVEA Profilometers measure virtually any surface in fields including Semiconductor, Microelectronics, Solar, Fiber Optics, Automotive, Aerospace, Metallurgy, Machining, Coatings, Pharmaceutical, Biomedical, Environmental and many others.

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Weld Surface Inspection Using a Portable 3D Profilometer

WELd surface inspection

using a portable 3d profilometer

Prepared by

CRAIG LEISING

INTRODUCTION

It may become critical for a particular weld, typically done by visual inspection, to be investigated with an extreme level of precision. Specific areas of interest for precise analysis include surface cracks, porosity and unfilled craters, regardless of subsequent inspection procedures. Weld characteristics such as dimension/shape, volume, roughness, size etc. can all be measured for critical evaluation.

IMPORTANCE OF 3D NON-CONTACT PROFILOMETER FOR WELD SURFACE INSPECTION

Unlike other techniques such as touch probes or interferometry, the NANOVEA 3D Non-Contact Profilometer, using axial chromatism, can measure nearly any surface, sample sizes can vary widely due to open staging and there is no sample preparation needed. Nano through macro range is obtained during surface profile measurement with zero influence from sample reflectivity or absorption, has advanced ability to measure high surface angles and there is no software manipulation of results. Easily measure any material: transparent, opaque, specular, diffusive, polished, rough etc. The 2D and 2D capabilities of the NANOVEA Portable Profilometers make them ideal instruments for full complete weld surface inspection both in the lab and in the field.

MEASUREMENT OBJECTIVE

In this application, the NANOVEA JR25 Portable Profiler is used to measure the surface roughness, shape and volume of a weld, as well as the surrounding area. This information can provide critical information to properly investigate the quality of the weld and weld process.

NANOVEA

JR25

TEST RESULTS

The image below shows the full 3D view of the weld and the surrounding area along with the surface parameters of the weld only. The 2D cross section profile is shown below.

the sample

With the above 2D cross section profile removed from the 3D, dimensional information of the weld is calculated below. Surface area and volume of material calculated for the weld only below.

 HOLEPEAK
SURFACE1.01 mm214.0 mm2
VOLUME8.799e-5 mm323.27 mm3
MAX DEPTH/HEIGHT0.0276 mm0.6195 mm
MEAN DEPTH/HEIGHT 0.004024 mm 0.2298 mm

CONCLUSION

In this application, we have shown how the NANOVEA 3D Non-Contact Profiler can precisely characterize critical characteristics of a weld and the surrounding surface area. From the roughness, dimensions and volume, a quantitative method for quality and repeatability can be determined and or further investigated. Sample welds, such as the example in this app note, can be easily analyzed, with a standard tabletop or portable NANOVEA Profiler for in-house or field testing

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Fiberglass Surface Topography Using 3D Profilometry

FIBERGLASS SURFACE TOPOGRAPHY

USING 3D PROFILOMETRY

Prepared by

CRAIG LEISING

INTRODUCTION

Fiberglass is a material made from extremely fine fibers of glass. It is used as a reinforcing agent for many polymer products; the resulting composite material, properly known as fiber-reinforced polymer (FRP) or glass-reinforced plastic (GRP), is called “fiberglass” in popular usage.

IMPORTANCE OF SURFACE METROLOGY INSPECTION FOR QUALITY CONTROL

Although there are many uses for Fiberglass reinforcement, in most applications it is crucial that they are as strong as possible. Fiberglass composites have one of the highest strength to weight ratios available and in some cases, pound for pound it is stronger than steel. Aside from high strength, it is also important to have the smallest possible exposed surface area. Large fiberglass surfaces can make the structure more vulnerable to chemical attack and possibly material expansion. Therefore, surface inspection is critical to quality control production.

MEASUREMENT OBJECTIVE

In this application, the NANOVEA ST400 is used to measure a Fiberglass Composite surface for roughness and flatness. By quantifying these surface features it is possible to create or optimize a stronger, longer lasting fiberglass composite material.

NANOVEA

ST400

MEASUREMENT PARAMETERS

PROBE 1 mm
ACQUISITION RATE300 Hz
AVERAGING1
MEASURED SURFACE5 mm x 2 mm
STEP SIZE5 µm x 5 µm
SCANNING MODEConstant speed

PROBE SPECIFICATIONS

MEASUREMENT RANGE1 mm
Z RESOLUTION 25 nm
Z ACCURACY200 nm
LATERAL RESOLUTION 2 μm

RESULTS

FALSE COLOR VIEW

3D Surface Flatness

3D Surface Roughness

Sa15.716 μmArithmetical Mean Height
Sq19.905 μmRoot Mean Square Height
Sp116.74 μmMaximum Peak Height
Sv136.09 μmMaximum Pit Height
Sz252.83 μmMaximum Height
Ssk0.556Skewness
Ssu3.654Kurtosis

CONCLUSION

As shown in the results, the NANOVEA ST400 Optical Profiler was able to accurately measure the roughness and flatness of the fiberglass composite surface. Data can be measured over multiple batches of fiber composites and or a given time period to provide crucial information about different fiberglass manufacturing processes and how they react over time. Thus, the ST400 is a viable option for strengthening the quality control process of fiberglass composite materials.

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Processed Leather Surface Finish using 3D Profilometry

PROCESSED LEATHER

SURFACE FINISH USING 3D PROFILOMETRY

Prepared by

CRAIG LEISING

INTRODUCTION

Once the tanning process of a leather hide is complete the leather surface can undergo several finishing processes for a variety of looks and touch. These mechanical processes can include stretching, buffing, sanding, embossing, coating etc. Dependent upon the end use of the leather some may require a more precise, controlled and repeatable processing.

IMPORTANCE OF PROFILOMETRY INSPECTION FOR R&D AND QUALITY CONTROL

Due to the large variation and unreliability of visual inspection methods, tools that are capable of accurately quantifying micro and nano scales features can improve leather finishing processes. Understanding the surface finish of leather in a quantifiable sense can lead to improved data driven surface processing selection to achieve optimal finish results. NANOVEA 3D Non-Contact Profilometers utilize chromatic confocal technology to measure finished leather surfaces and offer the highest repeatability and accuracy in the market. Where other techniques fail to provide reliable data, due to probe contact, surface variation, angle, absorption or reflectivity, NANOVEA Profilometers succeed.

MEASUREMENT OBJECTIVE

In this application, the NANOVEA ST400 is used to measure and compare the surface finish of two different but closely processed leather samples. Several surface parameters are automatically calculated from the surface profile.

Here we will focus on surface roughness, dimple depth, dimple pitch and dimple diameter for comparative evaluation.

NANOVEA

ST400

RESULTS: SAMPLE 1

ISO 25178

HEIGHT PARAMETERS

OTHER 3D PARAMETERS

RESULTS: SAMPLE 2

ISO 25178

HEIGHT PARAMETERS

OTHER 3D PARAMETERS

DEPTH COMPARATIVE

Depth distribution for each sample.
A large number of deep dimples were observed in
SAMPLE 1.

PITCH COMPARATIVE

Pitch between dimples on SAMPLE 1 is slightly smaller
than
SAMPLE 2, but both have a similar distribution

 MEAN DIAMETER COMPARATIVE

Similar distributions of mean diameter of dimples,
with
SAMPLE 1 showing slightly smaller mean diameters on average.

CONCLUSION

In this application, we have shown how the NANOVEA ST400 3D Profilometer can precisely characterize the surface finish of processed leather. In this study, having the ability to measure surface roughness, dimple depth, dimple pitch and dimple diameter allowed us to quantify differences between the finish and quality of the two samples that may not be obvious by visual inspection.

Overall there were no visible difference in the appearance of the 3D scans between SAMPLE 1 and SAMPLE 2. However, in the statistical analysis there is a clear distinction between the two samples. SAMPLE 1 contains a higher quantity of dimples with smaller diameters, larger depths and smaller dimple-to-dimple pitch in comparison to SAMPLE 2.

Please note that additional studies are available. Special areas of interest could have been further analyzed with an integrated AFM or Microscope module. NANOVEA 3D Profilometer speeds range from 20 mm/s to 1 m/s for laboratory or research to meet the needs of high-speed inspection; can be built with custom sizing, speeds, scanning capabilities, Class 1 clean room compliance, indexing conveyor or for in-line or online integration.

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Organic Surface Topography using Portable 3D Profilometer

 

ORGANIC SURFACE TOPOGRAPHY

USING PORTABLE 3D PROFILOMETER

Prepared by

CRAIG LEISING

INTRODUCTION

Nature has become a vital pool of inspiration for the development of improved surface structure. Understanding the surface structures found in nature has led to adhesion studies based on gecko’s feet, resistance studies based on a sea cucumbers textural change and repellency studies based from leaves, among many others. These surfaces have a number of potential applications from biomedical to clothing and automotive. For any of these surface breakthroughs to be successful, fabrication techniques must be developed so surface characteristics can be mimicked and reproduced. It is this process that will require identification and control.

IMPORTANCE OF PORTABLE 3D NON-CONTACT OPTICAL PROFILER FOR ORGANIC SURFACES

Utilizing Chromatic Light technology, the NANOVEA Jr25 Portable Optical Profiler has superior capability to measure nearly any material. That includes the unique and steep angles, reflective and absorbing surfaces found within natures broad range of surface characteristics. 3D non-contact measurements provide a full 3D image to give a more complete understanding of surface features. Without 3D capabilities, identification of nature’s surfaces would be solely relying on 2D information or microscope imaging, which does not provide sufficient information to properly mimic the surface studied. Understanding the full range of the surface characteristics including texture, form, dimension, among many others, will be critical to successful fabrication.

The ability to easily obtain lab-quality results in the field opens the door for new research opportunities.

MEASUREMENT OBJECTIVE

In this application, the NANOVEA Jr25 is used to measure the surface of a leaf. There is an endless list of surface parameters that can be automatically calculated after the 3D surface scan.

Here we will review the 3D surface and select
areas of interest to further analyze, including
quantifying and investigating the surface roughness, channels and topography

NANOVEA

JR25

TEST CONDITIONS

FURROW DEPTH

Mean density of furrows: 16.471 cm/cm2
Mean depth of furrows: 97.428 μm
Maximum depth: 359.769 μm

CONCLUSION

In this application, we have shown how the NANOVEA Jr25 portable 3D Non-Contact Optical Profiler can precisely characterize both the topography and the nanometer scale details of a leaf surface in the field. From these 3D surface measurements, areas of interest can quickly be identified and then analyzed with a list of endless studies (Dimension, Roughness Finish Texture, Shape Form Topography, Flatness Warpage Planarity, Volume Area, Step-Height and others). A 2D cross section can be easily chosen to analyze further details. With this information organic surfaces can be broadly investigated with a complete set of surface measurement resources. Special areas of interest could have been further analyzed with integrated AFM module on table top models.

NANOVEA also offers portable high-speed profilometers for field research and a wide range of lab-based systems, as well as provides laboratory services.

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Fresnel Lens Topography

 

FRESNEL LENS

DIMENSIONS USING 3D PROFILOMETRY

Prepared by

Duanjie Li & Benjamin Mell

INTRODUCTION

A lens is an optical device of axial symmetry that transmits and refracts light. A simple lens consists of a single optical component for converging or diverging the light. Even though spherical surfaces are not ideal shape for making a lens, they are often used as the simplest shape which glass can be ground and polished to.

A Fresnel lens consists of a series of concentric rings, which are thin parts of a simple lens with a width as small as a few thousandths of an inch. Fresnel lenses contain a large aperture and short focal length, with a compact design reducing the weight and volume of material required, compared to conventional lenses with the same optical properties. A very small amount of light is lost by absorption due to the thin geometry of the Fresnel lens.

IMPORTANCE OF 3D NON-CONTACT PROFILOMETRY FOR FRESNEL LENS INSPECTION

Fresnel lenses are extensively employed in the automotive industry, lighthouses, solar energy and optical landing systems for aircraft carriers. Molding or stamping the lenses out of transparent plastics can make their production cost-effective. Service quality of Fresnel lenses mostly depends on the precision and surface quality of their concentric ring. Unlike a touch probe technique, NANOVEA Optical Profilers perform 3D surface measurements without touching the surface, avoiding the risk of making new scratches. The Chromatic Light technique is ideal for precise scanning of complex shapes, such as lenses of different geometries.

FRESNEL LENS SCHEMATIC

Transparent plastic Fresnel lenses can be manufactured by molding or stamping. Accurate and efficient quality control is critical to reveal defective production molds or stamps. By measuring the height and pitch of the concentric rings, production variations can be detected by comparing the measured values against the specification values given by the manufacturer of the lens.

Precise measurement of the lens profile ensures that the molds or stamps are properly machined to fit manufacturer specifications. Moreover, the stamp could progressively wear out over time, causing it to lose its initial shape. Consistent deviation from the lens manufacturer specification is a positive indication that the mold needs to be replaced.

MEASUREMENT OBJECTIVE

In this application, we showcase NANOVEA ST400, a 3D Non-Contact Profiler with a high-speed sensor, providing comprehensive 3D profile analysis of an optical component of a complex shape.To demonstrate the remarkable capabilities of our Chromatic Light technology, the contour analysis is performed on a Fresnel lens.

NANOVEA

ST400

The 2.3” x 2.3” acrylic Fresnel lens used for this study consists of 

a series of concentric rings and a complex serrated cross-section profile. 

It has a 1.5” focal length, 2.0” effective size diameter, 

125 grooves per inch, and an index of refraction of 1.49.

The NANOVEA ST400 scan of the Fresnel lens shows a noticeable increase in height of the concentric rings, moving outward from the center.

2D FALSE COLOR

Height Representation

3D VIEW

EXTRACTED PROFILE

PEAK & VALLEY

Dimensional Analysis of the Profile

CONCLUSION

In this application, we have showcased that the NANOVEA ST400 non-contact Optical Profiler accurately measures the surface topography of Fresnel lenses. 

The dimension of the height and pitch can be accurately determined from the complex serrated profile using NANOVEA analysis software. Users can effectively inspect the quality of the production molds or stamps by comparing the ring height and pitch dimensions of manufactured lenses against the ideal ring specification.

The data shown here represents only a portion of the calculations available in the analysis software. 

NANOVEA Optical Profilers measure virtually any surface in fields including Semiconductors, Microelectronics, Solar, Fiber Optics, Automotive, Aerospace, Metallurgy, Machining, Coatings, Pharmaceutical, Biomedical, Environmental and many others.

 

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Machined Parts QC

Machined Parts Inspection

 

MACHINED PARTS

inspection from CAD model using 3D profilometry

Author:

Duanjie Li, PhD

Revised by

Jocelyn Esparza

Machined Parts Inspection with a Profilometer

INTRODUCTION

The demand for precision machining able to create complex geometries has been on the rise across a spectrum of industries. From aerospace, medical and automobile, to tech gears, machinery and musical instruments, the continuous innovation and evolution push expectations and accuracy standards to new heights. Consequently, we see the rise of the demand for rigorous inspection techniques and instruments to ensure the highest quality of the products.

Importance of 3D Non-Contact Profilometry for Parts Inspection

Comparing properties of machined parts to their CAD models is essential to verify tolerances and adherence to production standards. Inspection during the service time is also crucial as wear and tear of the parts may call for their replacement. Identification of any deviations from the required specifications in a timely manner will help avoid costly repairs, production halts and tarnished reputation.

Unlike a touch probe technique, the NANOVEA Optical Profilers perform 3D surface scans with zero contact, allowing for quick, precise and non-destructive measurements of complex shapes with the highest accuracy.

MEASUREMENT OBJECTIVE

In this application, we showcase NANOVEA HS2000, a 3D Non-Contact Profiler with a high-speed sensor, performing a comprehensive surface inspection of dimension, radius, and roughness. 

All in under 40 seconds.

NANOVEA

HS2000

CAD MODEL

A precise measurement of the dimension and surface roughness of the machined part is critical to make sure it meets the desired specifications, tolerances and surface finishes. The 3D model and the engineering drawing of the part to be inspected are presented below. 

FALSE COLOR VIEW

The false color view of the CAD model and the scanned machined part surface are compared in FIGURE 3. The height variation on the sample surface can be observed by the change in color.

Three 2D profiles are extracted from the 3D surface scan as indicated in FIGURE 2 to further verify the dimensional tolerance of the machined part.

PROFILES COMPARISON & RESULTS

Profile 1 through 3 are shown in FIGURE 3 through 5. Quantitative tolerance inspection is carried out by comparing the measured profile with the CAD model to uphold rigorous manufacturing standards. Profile 1 and Profile 2 measure the radius of different areas on the curved machined part. The height variation of Profile 2 is 30 µm over a length of 156 mm which meets the desired ±125 µm tolerance requirement. 

By setting up a tolerance limit value, the analysis software can automatically determine pass or fail of the machined part.

Machine Parts Inspection with a Profilometer

The roughness and uniformity of the machined part’s surface play an important role in ensuring its quality and functionality. FIGURE 6 is an extracted surface area from the parent scan of the machined part which was used to quantify the surface finish. The average surface roughness (Sa) was calculated to be 2.31 µm.

CONCLUSION

In this study, we have showcased how the NANOVEA HS2000 Non-Contact Profiler equipped with a high speed sensor performs comprehensive surface inspection of dimensions and roughness. 

High-resolution scans enable users to measure detailed morphology and surface features of machined parts and to quantitatively compare them with their CAD models. The instrument is also capable of detecting any defects including scratches and cracks. 

The advanced contour analysis serves as an unparalleled tool not only to determine whether the machined parts satisfy the set specifications, but also to evaluate the failure mechanisms of the worn components.

The data shown here represents only a portion of the calculations possible with the advanced analysis software that comes equipped with every NANOVEA Optical Profiler.

 

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In-line Roughness Inspection

Instant Error Detection With In-Line Profilers

Learn more
 

IMPORTANCE OF NON-CONTACT PROFILER FOR IN-LINE ROUGHNESS INSPECTION

Surface defects derive from materials processing and product manufacturing. In-line surface quality inspection ensures the tightest quality control of the end products. The Nanovea 3D Non-Contact Profilometers utilize chromatic confocal technology with a unique capability to determine the roughness of a sample with-out contact. Multiple profiler sensors can be installed to monitor the roughness and texture of different areas of the product at the same time. The roughness threshold calculated in real-time by the analysis software serves as a fast and reliable pass/fail tool.

MEASUREMENT OBJECTIVE

In this study, the Nanovea roughness inspection conveyor system equipped with a point sensor is used to inspect the surface roughness of the acrylic and sandpaper samples. We showcase the capacity of Nanovea non-contact profilometer in providing fast and reliable in-line roughness inspection in a production line in real-time.

RESULTS AND DISCUSSION

The conveyor profilometer system can operate in two modes, namely Trigger Mode and Continuous Mode. As illustrated in Figure 2, the surface roughness of the samples are measured when they are passing under the optical profiler heads under the Trigger Mode. In comparison, Continuous Mode provides non-stop measurement of the surface roughness on the continuous sample, such as metal sheet and fabric. Multiple optical profiler sensors can be installed to monitor and record the roughness of different sample areas.

 

During the real-time roughness inspection measurement, the pass and fail alerts are displayed on the software windows as shown in Figure 4 and Figure 5. When the roughness value is within the given thresholds, the measured roughness is highlighted in green color. However, the highlight turns red when the measured surface roughness is out of the range of the set threshold values. This provides a tool for the user to determine the quality of a product’s surface finish.

In the following sections, two types of samples, e.g. Acrylic and Sandpaper are used to demonstrate the Trigger and Continuous Modes of the Inspection system.

Trigger Mode: Surface inspection of the Acrylic Sample

A series of Acrylic samples are aligned on the conveyor belt and move under the optical profiler head as shown in Figure 1. The false color view in Figure 6 shows the change of the surface height. Some of the mirror-like finished Acrylic samples had been sanded to create a rough surface texture as shown in Figure 6b.

As the Acrylic samples move at a constant speed under the optical profiler head, the surface profile is measured as shown in Figure 7 and Figure 8. The roughness value of the measured profile is calculated at the same time and compared to the threshold values. The red fail alert is launched when the roughness value is over the set threshold, allowing users to immediately detect and locate the defective product on the production line.

Continuous Mode: Surface Inspection of the sandpaper sample

Surface Height Map, Roughness Distribution Map, and Pass / Fail Roughness Threshold Map of the sandpaper sample surface as shown in Figure 9. The sandpaper sample has a couple of higher peaks in the used part as shown in the surface height map. The different colors in the pallet of Figure 9C represent the roughness value of the local surface. The Roughness Map exhibits a homogeneous roughness in the intact area of the sandpaper sample, while the used area is highlighted in dark blue color, indicating the reduced roughness value in this region. A Pass/Fail roughness threshold can be set up to locate such regions as shown in Figure 9D.

As the sandpaper continuously passes under the in-line profiler sensor, the real-time local roughness value is calculated and recorded as plotted in Figure 10. The pass/fail alerts are displayed on the software screen based on the set roughness threshold values, serving as a fast and reliable tool for quality control. The product surface quality in the production line is inspected in situ to discover defective areas in time.

CONCLUSION

In this application, we have shown the Nanovea Conveyor Profilometer equipped with an optical non-contact profiler sensor works as a reliable in-line quality control tool effectively and efficiently.

The inspection system can be installed in the production line to monitor the surface quality of the products in situ. The roughness threshold works as a dependable criteria to determine the surface quality of the products, allowing users to notice the defective products in time. Two inspection modes, namely Trigger Mode and Continuous Mode, are provided to meet the requirement for inspection on different types of products.

The data shown here represent only a portion of the calculations available in the analysis software. Nanovea Profilometers measure virtually any surface in fields including Semiconductor, Microelectronics, Solar, Fiber, Optics, Automotive, Aerospace, Metallurgy, Machining, Coatings, Pharmaceutical, Biomedical, Environmental and many others.

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3D Surface Analysis of a Penny with Non-contact Profilometry

Importance of Non-contact Profilometry for Coins

Currency is highly valued in modern society because it is traded for goods and services. Coin and paper bill currency circulates around the hands of many people. Constant transfer of physical currency creates surface deformation. Nanovea’s 3D Profilometer scans the topography of coins minted in different years to investigate surface differences.

Coin features are easily recognizable to the general public since they are common objects. A penny is ideal for introducing the strength of Nanovea’s Advanced Surface Analysis Software: Mountains 3D. Surface data collected with our 3D Profilometer allows for high level analyses on complex geometry with surface subtraction and 2D contour extraction. Surface subtraction with a controlled mask, stamp, or mold compares the quality of manufacturing processes while contour extraction identifies tolerances with dimensional analysis. Nanovea’s 3D Profilometer and Mountains 3D software investigates the submicron topography of seemingly simple objects, like pennies.



Measurement Objective

The full upper surface of five pennies were scanned using Nanovea’s High-Speed Line Sensor. The inner and outer radius of each penny was measured using Mountains Advanced Analysis Software. An extraction from each penny surface at an area of interest with direct surface subtraction quantified surface deformation.

 



Results and Discussion

3D Surface

The Nanovea HS2000 profilometer took only 24 seconds to scan 4 million points in a 20mm x 20mm area with a 10um x 10um step size to acquire the surface of a penny. Below is a height map and 3D visualization of the scan. The 3D view shows the High-Speed sensor’s ability to pick up small details unperceivable to the eye. Many small scratches are visible across the surface of the penny. Texture and roughness of the coin seen in the 3D view are investigated.

 










Dimensional Analysis

The contours of the penny were extracted and dimensional analysis obtained inner and outer diameters of the edge feature. The outer radius averaged 9.500 mm ± 0.024 while the inner radius averaged 8.960 mm ± 0.032. Additional dimensional analyses Mountains 3D can do on 2D and 3D data sources are distance measurements, step height, planarity, and angle calculations.







Surface Subtraction

Figure 5 shows the area of interest for the surface subtraction analysis. The 2007 penny was used as the reference surface for the four older pennies. Surface subtraction from the 2007 penny surface shows differences between pennies with holes/peaks. Total surface volume difference is obtained from adding volumes of the holes/peaks. The RMS error refers to how closely penny surfaces agree with each other.


 









Conclusion





Nanovea’s High-Speed HS2000L scanned five pennies minted in different years. Mountains 3D software compared surfaces of each coin using contour extraction, dimensional analysis, and surface subtraction. The analysis clearly defines the inner and outer radius between the pennies while directly comparing surface feature differences. With Nanovea’s 3D profilometer’s ability to measure any surfaces with nanometer-level resolution, combined with Mountains 3D analysis capabilities, the possible Research and Quality Control applications are endless.

 


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Honeycomb Panel Surface Finish with 3D Profilometry

INTRODUCTION


Roughness, porosity, and texture of the honeycomb panel surface are critical to quantify for the final panel design. These surface qualities can directly correlate to the aesthetics and functional characteristics of the panel surface. A better understanding of the surface texture and porosity can help optimize the panel surface processing and manufacturability. A quantitative, precise, and reliable surface measurement of the honeycomb panel is needed to control surface parameters for application and painting requirements. The Nanovea 3D Non-Contact sensors utilize unique chromatic confocal technology capable of precisely measuring these panel surfaces.



MEASUREMENT OBJECTIVE


In this study, the Nanovea HS2000 platform equipped with a high-speed Line Sensor was used to measure and compare two honeycomb panels with different surface finishes. We showcase the Nanovea non-contact profilometer’s ability to provide fast and precise 3D profiling measurements and comprehensive in-depth analysis of the surface finish.



RESULTS AND DISCUSSION

The surface of two honeycomb panel samples with varied surface finishes, namely Sample 1 and Sample 2, were measured. The false color and 3D view of the Samples 1 and 2 surfaces are shown in Figure 3 and Figure 4, respectively. The roughness and flatness values were calculated by advanced analysis software and are compared in Table 1. Sample 2 exhibits a more porous surface compared to Sample 1. As a result, Sample 2 possesses a higher roughness Sa of 14.7 µm, compared to an Sa value of 4.27 µm for Sample 1.

The 2D profiles of the honeycomb panel surfaces were compared in Figure 5, allowing users to have a visual comparison of the height change at different locations of the sample surface. We can observe that Sample 1 has a height variation of ~25 µm between the highest peak and lowest valley location. On the other hand, Sample 2 shows several deep pores across the 2D profile. The advanced analysis software has the ability to automatically locate and measure the depth of six relatively deep pores as shown in the table of Figure 4.b Sample 2. The deepest pore amongst the six possesses a maximum depth of nearly 90 µm (Step 4).

To further investigate the pore size and distribution of Sample 2, porosity evaluation was performed and discussed in the following section. The sliced view is displayed in Figure 5 and the results are summarized in Table 2. We can observe that the pores, marked in blue color in Figure 5, have a relatively homogeneous distribution on the sample surface. The projected area of the pores constitutes 18.9% of the whole sample surface. The volume per mm² of the total pores is ~0.06 mm³. The pores have an average depth of 42.2 µm, and the maximum depth is 108.1 µm.

CONCLUSION



In this application, we have showcased that the Nanovea HS2000 platform equipped with a high-speed Line Sensor is an ideal tool for analyzing and comparing the surface finish of honeycomb panel samples in a fast and accurate manner. The high-resolution profilometry scans paired with an advanced analysis software allow for a comprehensive and quantitative evaluation of the surface finish of honeycomb panel samples.

The data shown here represents only a small portion of the calculations available in the analysis software. Nanovea Profilometers measure virtually any surface for a wide range of applications in the Semiconductor, Microelectronic, Solar, Fiber Optics, Automotive, Aerospace, Metallurgy, Machining, Coatings, Pharmaceutical, Biomedical, Environmental and many other industries.

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