Modular Optical Profilometer – NANOVEA ST400

Name: Modular Optical Profilometer – NANOVEA ST400
Brand: NANOVEA

NANOVEA ST400 is a modular optical profilometer for non-contact surface measurement, designed as a versatile platform for both research and quality control environments.

As NANOVEA’s flagship optical surface profilometer, it is built on chromatic light technology to deliver reliable, high-speed 2D and 3D surface characterization with continuous scanning and flexible configurations, making it the standard choice for laboratories requiring accuracy, scalability, and long-term adaptability.

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NANOVEA ST400 modular optical profilometer for non-contact surface measurement

200 mm @ 40 mm/s
CONTINUOUS SCAN

200 x 150 mm X-Y axis travel with speeds up to 40 mm/s. Delivers fast measurements.
Stitching Free!

NANOVEA ST400 modular optical profilometer

Unmatched ultrafast scanning at

384,000 points/s

HIGH QUALITY QUALITY CONTROL

The advanced software makes it easy to select zones on screen to be scanned automatically.
QC options are available to automate all aspects of testing, including pattern recognition, database communication, macro programs and analysis recipes.

NANOVEA ST400 custom configuration blueprint

FREELY CUSTOMIZABLE.
UNIQUELY YOURS

Larger X-Y stages, 360° rotational stages & many custom configurations available.

X – Y Scan Area

200 x 150 mm Motorized

Profilometer high range and vertical resolution specification

Height Range

nm to cm

Desktop Dimensions

62 x 62 x 82 cm

Scan Speed

40 mm/s

Profilometry - Chromatic Confocal Sensor Technology

Best for steep angles

Fast for large areas

Very easy to use

No Image Stitching

No Sample Prep

No Refocusing

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2D & 3D NON-CONTACT PROFILOMETRY

ROUGHNESS & FINISH

TEXTURE & GRAIN

GEOMETRY & SHAPE

Surface Step Height and Coating Thickness

STEP HEIGHT & THICKNESS

VOLUME & AREA

FLATNESS & WARPAGE

What is the NANOVEA ST400?

The NANOVEA ST400 is a modular benchtop 3D optical profilometer for non-contact surface measurement in research and quality control. It measures roughness, texture, form, step height, flatness and volume on any material, transparent or opaque, using chromatic light sensors that read each point's height directly from the reflected wavelength.

A motorized 200 x 150 mm X-Y stage scans at up to 40 mm/s. The Z axis has 50 mm of motorized travel plus a 140 mm manual slide, for up to 190 mm of sample height clearance. Standard point sensors cover height ranges from 110 µm to 24 mm; high-speed line sensors acquire 192 points at once at 384,000 points per second for fast large-area maps. Scans are continuous, so there is no stitching.

Larger X-Y stages, 360° rotational stages, cylinder rotation and a video microscope are available, which makes the ST400 the most configurable model in NANOVEA's profilometer range.

Best for

Research and QC labs measuring varied sample sizes and geometries
Fast 3D mapping of large areas with the high-speed line sensor
Tall parts, up to 190 mm sample height clearance
Cylindrical or rotational parts, with rotational stage options
Automated, recipe-based quality control

ST400 at a glance

X-Y stage travel: 200 x 150 mm, motorized
X-Y max speed: 40 mm/s
Z axis: 50 mm motorized + 140 mm manual slide
Sample height clearance: Up to 190 mm
Sensors: Point (PS1 to PS6) and high-speed line (LS1 to LS3)
Acquisition rate: Up to 384,000 points/s (line sensor)
Max vertical resolution: 1 nm
Max surface angle: Up to 87°

ST400 specifications

ST400 platform

X-Y stage travel	200 x 150 mm, motorized (larger stages available)
X-Y max speed	40 mm/s
Z axis	50 mm motorized + 140 mm with manual slide
Sample height clearance	Up to 190 mm
Rotational options	360° rotational stage or cylinder rotation
Video microscope	Up to 50x objective magnification, 1200 x 1600 color video camera, stitching and focus stacking
Max vertical resolution	1 nm
Max surface angle	Up to 87°
Benchtop dimensions	62 x 62 x 82 cm

Standard chromatic sensors (single point)

Specification	PS1	PS2	PS3	PS4	PS5	PS6
Max height range	110 µm	300 µm	1.1 mm	3.5 mm	10 mm	24 mm
Working distance	3.3 mm	10.8 mm	12.2 mm	16.5 mm	26.6 mm	20 mm
Lateral X-Y accuracy	0.8 µm	1.7 µm	2.6 µm	4.6 µm	11.0 µm	11.0 µm
Height repeatability	1.9 nm	5.4 nm	15.8 nm	31.6 nm	117.0 nm	237.2 nm

Height repeatability: fixed point measurement on glass, Ra average height variation for 1,200 points (100 samplings).

High-speed chromatic line sensors (192 points)

Specification	LS1	LS2	LS3
Max height range	200 µm	0.95 mm	3.9 mm
Working distance	5.3 mm	18.5 mm	41 mm
Height repeatability (Ra)	14 nm	21 nm	70 nm
Line width	0.96 mm	1.91 mm	4.78 mm
Pitch	5 µm	10 µm	25 µm
Lateral accuracy of each point	1 µm	2 µm	5 µm
Acquisition rate	384 kHz	384 kHz	384 kHz

Height repeatability: fixed point measurement on glass, Ra average height variation for 1,200 points (100 samplings).

Specifications subject to change. Every NANOVEA instrument is built to order; ask for the configuration that fits your samples.

What the ST400 measures

Standards

ISO 4287
ISO 13565
ISO 12085
ISO 12780
ISO 12181
ISO 25178
Other ISO & ASME standards

Options and configurations

High-speed line sensors: LS1 to LS3 measure 192 points per line at 384,000 points per second, with height ranges from 200 µm to 3.9 mm, for fast 3D maps of large areas.
Rotational stages: 360° rotational stage or cylinder rotation for round, cylindrical and tool-edge geometries.
Larger X-Y stages and custom configurations: Stages beyond 200 x 150 mm and custom fixtures for unusual sample shapes.
Video microscope: Up to 50x objective with a 1200 x 1600 color camera, with stitching and focus stacking for large-area images.
QC automation: Macro programs, pattern recognition, database communication and analysis recipes; zones selected on screen are scanned automatically.

Choosing between models

Related application notes

Studies from our laboratory on this class of instrument, published with full test parameters.

All related application notes →

Independent published research

At least 41 published studies name the ST400 in their methods. NANOVEA instruments appear in 444 published studies on surface topography and roughness, by researchers at universities and industrial laboratories worldwide.

3D MXene‐Based Flexible Network for High‐Performance Pressure Sensor with a Wide Temperature Range
Yimei Xie, Yongfa Cheng et al. · Advanced Science, 2022
Measured with the NANOVEA ST400
Interfacial modification of basalt fiber filling composites with graphene oxide and polydopamine for enhanced mechanical and tribological properties
Junjie Wang, Shaofeng Zhou et al. · RSC Advances, 2018
Measured with the NANOVEA ST400
Dependence of Skin-Electrode Contact Impedance on Material and Skin Hydration
Krittika Goyal, David A. Borkholder et al. · Sensors, 2022
Measured with the NANOVEA ST400
Optimization of Machining Parameters to Minimize Cutting Forces and Surface Roughness in Micro-Milling of Mg13Sn Alloy
Ali Erçetin, Kubilay Aslantaş et al. · Micromachines, 2023
Measured with the NANOVEA ST400
Effect of Drilling Parameters and Tool Geometry on the Thrust Force and Surface Roughness of Aerospace Grade Laminate Composites
Çağın Bolat, Uçan Karakılınç et al. · Micromachines, 2023
Measured with the NANOVEA ST400
Comparative Analysis of Minimum Chip Thickness, Surface Quality and Burr Formation in Micro-Milling of Wrought and Selective Laser Melted Ti64
Uçan Karakılınç, Berkay Ergene et al. · Micromachines, 2023
Measured with the NANOVEA ST400

All 444 studies →

ST400: frequently asked questions

What is the ST400 used for?

2D and 3D non-contact measurement of roughness and finish, texture, geometry, step height and thickness, flatness and warpage, and volume and area, in research and production quality control. Published examples include machined finishes, coatings, wear tracks, corrosion, composites, polymers and biological surfaces.

How large a sample fits on the ST400?

The standard motorized stage travels 200 x 150 mm, and the Z axis gives up to 190 mm of sample height clearance (50 mm motorized plus a 140 mm manual slide). Larger stages and rotational stages are available for bigger or cylindrical parts.

How fast is the ST400?

The stage moves at up to 40 mm/s. With a high-speed line sensor, 192 points are measured simultaneously at 384,000 points per second, so large areas are mapped in a fraction of the time a single point sensor needs, without stitching.

How accurate is the ST400?

It depends on the sensor: height repeatability from 1.9 nm (PS1, 110 µm range) to 237.2 nm (PS6, 24 mm range) for point sensors, and 14 nm to 70 nm for line sensors, with 1 nm maximum vertical resolution and surface angles up to 87°. Lateral accuracy is set by the sensor spot size, from 0.8 µm.

ST400 or ST500: which do I need?

Choose the ST400 for samples up to 200 x 150 mm and the widest choice of add-ons. Choose the ST500 when parts exceed that area or throughput matters: it scans 400 x 400 mm at up to 200 mm/s with the same sensors.

How much does an ST400 cost?

Pricing depends on stage, sensors and options. Contact NANOVEA sales for a quote; our laboratory can measure your samples first so the configuration is chosen from real results.

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