HS2000 - The Zero Noise/Flatness Profiler - NANOVEANANOVEA

Zero Noise /
Flatness Profiler

HS2000

LARGEST FLATNESS

MEASUREMENT IN THE INDUSTRY

Specifications for flatness is the best in the
industry with less than 1 micron beyond 400 x 500 mm.

500 mm @ 500 mm/s
CONTINUOUS SCAN

400 x 500 mm X-Y axis travel with speeds up
to 500 mm/sec. Delivers ultrafast, large
area measurements. Stitching Free!

Designed for high speeds, large areas, flatness and roughness. The HS2000 provides automated inspection for QC applications where speed (up to 1m/s), large measurement areas (up to 500 mm X-Y) and full automation are critical.

X - Y Scan Area

400 x 500 mm Motorized

Height Range

2.5 nm to 25 mm

Flatness

< 1μm over 500 mm

Scan Speed

500 mm/s

Best for steep angles

No Image Stitching

Fast for large areas

No Sample Prep

Very easy to use

No Refocusing

2D & 3D SURFACE MEASUREMENT

ROUGHNESS & FINISH

GEOMETRY & SHAPE

STEP HEIGHT & THICKNESS

FLATNESS & WARPAGE

OUR EXPERTS

ARE ALWAYS

ONE CLICK AWAY

DOWNLOAD BROCHURE