High-Speed Portable Optical Profilometer – NANOVEA JR100

Name: High-Speed Portable Optical Profilometer – NANOVEA JR100
Brand: NANOVEA

NANOVEA JR100 is a high-speed portable optical profilometer for non-contact surface measurement, designed for fast, accurate inspection of large areas.

Built on the same chromatic light sensor technology used in NANOVEA’s benchtop surface profilometers, the JR100 delivers true lab-quality 2D and 3D surface characterization with continuous scanning, combining speed, throughput, and portability in a single system.

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NANOVEA JR100 high-speed portable optical profilometer for non-contact 2D and 3D surface measurement

NANOVEA JR100 portable optical profilometer

100 mm of
CONTINUOUS SCAN

Using a 100 x 100 mm X-Y axis travel, the Portable Optical Profiler provides high speed measurement and requires no stitching.

Unmatched ultrafast scanning at

384,000 points/sec

TRUE 2D & 3D
PORTABILITY

With the small footprint and weight of only 17 kg, the JR100 can be conveniently transported to any location.

NANOVEA JR100 portable profilometer dimensions

ULTIMATE
QUALITY CONTROL

A portable unit with a High Speed sensor truly is
a gateway to the frontier of profilometry.

X – Y Scan Area

100 x 100 mm Motorized

Profilometer high range and vertical resolution specification

Height Range

nm to cm

Desktop Dimensions

44 x 49 x 32 cm

Scan Speed

20 mm/s

Profilometry - Chromatic Confocal Sensor Technology

Best for steep angles

Fast for large areas

Very easy to use

No Image Stitching

No Sample Prep

No Refocusing

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2D & 3D NON-CONTACT PROFILOMETRY

ROUGHNESS & FINISH

TEXTURE & GRAIN

GEOMETRY & SHAPE

Surface Step Height and Coating Thickness

STEP HEIGHT & THICKNESS

VOLUME & AREA

FLATNESS & WARPAGE

What is the NANOVEA JR100?

The NANOVEA JR100 is a portable high-speed 3D optical profilometer for non-contact measurement of large areas, in the lab or on site. It scans 100 x 100 mm continuously, without stitching, and measures roughness, texture, form, step height, flatness and volume with the chromatic light sensors used in NANOVEA's benchtop profilometers.

The X-Y stage travels 100 x 100 mm at up to 20 mm/s with a 25 mm manual Z axis. Point sensors cover height ranges from 110 µm to 24 mm; the high-speed line sensor measures 192 points at once at 384,000 points per second. At 17 kg, it is transported to the part rather than the other way round.

Two configurations exist: the JR100P with standard point sensors and the JR100L with the high-speed line sensor.

Best for

Large-area scans away from the lab, up to 100 x 100 mm in one continuous pass
Fast mapping with the high-speed line sensor
Quality control at supplier or customer sites
Labs that need one profilometer for both bench and field work

JR100 at a glance

X-Y stage travel: 100 x 100 mm
X-Y max speed: 20 mm/s
Z axis: 25 mm, manual
Continuous scan: 100 mm, stitching free
Acquisition rate: Up to 384,000 points/s (line sensor, JR100L)
Sensor height range: 110 µm to 24 mm (point), 200 µm to 3.9 mm (line)
Weight: 17 kg
Dimensions: 44 x 49 x 32 cm

JR100 specifications

JR100 platform

X-Y stage travel	100 x 100 mm
X-Y max speed	20 mm/s
Z axis	25 mm, manual
Configurations	JR100P: standard point sensors; JR100L: high-speed line sensor
Max vertical resolution	1 nm
Max surface angle	Up to 87°
Weight	17 kg
Dimensions	44 x 49 x 32 cm

Standard chromatic sensors (single point)

Specification	PS1	PS2	PS3	PS4	PS5	PS6
Max height range	110 µm	300 µm	1.1 mm	3.5 mm	10 mm	24 mm
Working distance	3.3 mm	10.8 mm	12.2 mm	16.5 mm	26.6 mm	20 mm
Lateral X-Y accuracy	0.8 µm	1.7 µm	2.6 µm	4.6 µm	11.0 µm	11.0 µm
Height repeatability	1.9 nm	5.4 nm	15.8 nm	31.6 nm	117.0 nm	237.2 nm

Height repeatability: fixed point measurement on glass, Ra average height variation for 1,200 points (100 samplings).

High-speed chromatic line sensors (192 points)

Specification	LS1	LS2	LS3
Max height range	200 µm	0.95 mm	3.9 mm
Working distance	5.3 mm	18.5 mm	41 mm
Height repeatability (Ra)	14 nm	21 nm	70 nm
Line width	0.96 mm	1.91 mm	4.78 mm
Pitch	5 µm	10 µm	25 µm
Lateral accuracy of each point	1 µm	2 µm	5 µm
Acquisition rate	384 kHz	384 kHz	384 kHz

Height repeatability: fixed point measurement on glass, Ra average height variation for 1,200 points (100 samplings).

Specifications subject to change. Every NANOVEA instrument is built to order; ask for the configuration that fits your samples.

What the JR100 measures

Standards

ISO 4287
ISO 13565
ISO 12085
ISO 12780
ISO 12181
ISO 25178
Other ISO & ASME standards

Options and configurations

JR100L high-speed line sensor: 192 points per line at 384,000 points per second (LS1 to LS3, 200 µm to 3.9 mm height range).
JR100P point sensors: PS1 to PS6, from a 110 µm range with 1.9 nm repeatability to a 24 mm range.

Choosing between models

Independent published research

At least 1 published study names the JR100 in its methods. NANOVEA instruments appear in 444 published studies on surface topography and roughness, by researchers at universities and industrial laboratories worldwide.

The Effects of Friction and Temperature in the Chemical–Mechanical Planarization Process
Filip Ilie, Ileana-Liliana Minea et al. · Materials, 2023
Measured with the NANOVEA JR100
Synthesis of Ultrathin WS2 Nanosheets and Their Tribological Properties as Lubricant Additives
Xianghua Zhang, Hongxiang Xu et al. · Nanoscale Research Letters, 2016
Measured with the NANOVEA PS50
3D MXene‐Based Flexible Network for High‐Performance Pressure Sensor with a Wide Temperature Range
Yimei Xie, Yongfa Cheng et al. · Advanced Science, 2022
Measured with the NANOVEA ST400
Roles of thermophilic thiosulfate-reducing bacteria and methanogenic archaea in the biocorrosion of oil pipelines
Renxing Liang, Robert S. Grizzle et al. · Frontiers in Microbiology, 2014
Measured with the NANOVEA PS50
Interfacial modification of basalt fiber filling composites with graphene oxide and polydopamine for enhanced mechanical and tribological properties
Junjie Wang, Shaofeng Zhou et al. · RSC Advances, 2018
Measured with the NANOVEA ST400
Dependence of Skin-Electrode Contact Impedance on Material and Skin Hydration
Krittika Goyal, David A. Borkholder et al. · Sensors, 2022
Measured with the NANOVEA ST400

All 444 studies →

JR100: frequently asked questions

What is the JR100 used for?

Non-contact 2D and 3D measurement of roughness, texture, geometry, step height, flatness and volume over areas up to 100 x 100 mm, on site or in the lab.

What is the difference between the JR100P and the JR100L?

The JR100P uses the standard single-point chromatic sensors (PS1 to PS6). The JR100L carries the high-speed line sensor, which measures 192 points at once at 384,000 points per second for much faster large-area maps.

Does the JR100 stitch images?

No. It scans 100 mm continuously, so the whole area is one measurement with the same accuracy everywhere.

How portable is the JR100?

It weighs 17 kg with a 44 x 49 x 32 cm footprint, so it is transported to the part. For the lightest option, see the 5.3 kg JR25.

How accurate is the JR100?

With point sensors, height repeatability runs from 1.9 nm (PS1) to 237.2 nm (PS6); with line sensors, from 14 nm (LS1) to 70 nm (LS3). Maximum vertical resolution is 1 nm and surface angles up to 87° are measured.

How much does a JR100 cost?

Pricing depends on the configuration (JR100P or JR100L) and sensors. Contact NANOVEA sales for a quote.

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