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AR Unmatched ultrafast scanning at
384,000 points/s
Modular Optical Profilometer – NANOVEA ST400
NANOVEA ST400 is a modular optical profilometer for non-contact surface measurement, designed as a versatile platform for both research and quality control environments.
As NANOVEA’s flagship optical surface profilometer, it is built on chromatic light technology to deliver reliable, high-speed 2D and 3D surface characterization with continuous scanning and flexible configurations, making it the standard choice for laboratories requiring accuracy, scalability, and long-term adaptability.
200 mm @ 40 mm/s
CONTINUOUS SCAN
200 x 150 mm X-Y axis travel with speeds up to 40 mm/s. Delivers fast measurements.
Stitching Free!
HIGH QUALITY QUALITY CONTROL
The advanced software makes it easy to select zones on screen to be scanned automatically.
QC options are available to automate all aspects of testing, including pattern recognition, database communication, macro programs and analysis recipes.
FREELY CUSTOMIZABLE.
UNIQUELY YOURS
UNIQUELY YOURS
Larger X-Y stages, 360° rotational stages & many custom configurations available.
X – Y Scan Area
200 x 150 mm Motorized
Height Range
nm to cm
Desktop Dimensions
62 x 62 x 82 cm
Scan Speed
40 mm/s
Best for steep angles
Fast for large areas
Very easy to use
No Image Stitching
No Sample Prep
No Refocusing
2D & 3D NON-CONTACT PROFILOMETRY
