Surface characterization are current topics undergoing intense study. The surfaces of materials are important since they are the regions where physical...
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STEP HEIGHT | THICKNESS
What can we do?
• Measure through transparent materials
• Transparent film and coating thickness down to 20nm
• Steps from 20nm to 25mm
STEP HEIGHT | THICKNESS ANALYSIS
• Point to point
• Point to plane
• Maximum, minimum, and mean heights
• 3D or 2D map of thickness
• Thickness distribution curve
AND MORE
TESTING STANDARDS
- ISO 5436-1
How can we help?
Featured Applications
Wafer Coating Thickness Measurement Using 3D Profilometry
Wafer Coating Thickness Measurement is critical. Silicon wafers are widely used in the making of integrated circuits and other micro devices used in a...
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Transparent Film on Transparent Substrate Measurement
The Nanovea PS50 Profilometer is used for roughness measurement, step height thickness and optical thickness of a thin transparent film on a transparent...
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