NANOVEA's unique software provides measurements and analysis of any surface in real time with acquisition rates of more than 1,300,000 points/sec.
One of its numerous features, Pass & Fail criteria specific to each sensor or average of all sensors, helps to effectively identify surface defects derived from materials processing and product manufacturing.
TRIGGERED
IN-LINE INSPECTION
CONTINUOUS
IN-LINE INSPECTION
Multiple non-contact profiler sensors can be installed to monitor roughness and textures of different areas at the same time. Capable of determining roughness of a sample without contact, Chromatic Light technology allows for a reliable in-line surface quality inspection of the end product.
Best for steep angles
No Image Stitching
Fast for large areas
No Sample Prep
Very easy to use
No Refocusing
SEAMLESS INTEGRATION
We provide personalized full integration support, including specific mounting structures so you don't have to worry about disrupting your established process.
Av. Dr. Chucri Zaidan, 1550 Edifício Capital Corporate 17º andar- conjunto 1701 04711-130 – São Paulo – SP – Brazil +55(11) 2198-7198 P: +55(11) 5507-3302
6 Morgan Ste 156 Irvine, CA 92618 Phone: (949) 461-9292
CONTACT US
Please fill out our form and we will reach out to you as soon as possible!
Nanovea de México
LATIN AMERICA
1952 Hidalgo Colonia Ladron de Guevara Guadalajara, Jalisco Mexico 44600 Phone: +52 1 33 10 31 52 27
CONTACT US / CONTÁCTENOS
Nanovea SRL
EUROPEAN OFFICE
Via Balegno 1 Rivalta di Torino 10040 TO (IT) Phone: +39 011 3052 794
CONTACT US / CONTATTACI
Want us to test your samples?
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