In this application, we have showcased that the NANOVEA ST400 non-contact Optical Profiler accurately measures the surface topography of Fresnel lenses.
The dimension of the height and pitch can be accurately determined from the complex serrated profile using NANOVEA analysis software. Users can effectively inspect the quality of the production molds or stamps by comparing the ring height and pitch dimensions of manufactured lenses against the ideal ring specification.
The data shown here represents only a portion of the calculations available in the analysis software.
NANOVEA Optical Profilers measure virtually any surface in fields including Semiconductors, Microelectronics, Solar, Fiber Optics, Automotive, Aerospace, Metallurgy, Machining, Coatings, Pharmaceutical, Biomedical, Environmental and many others.