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Extended Range Profiler
AFM Pro
COMPLETE RESEARCH TOOL
ATOMIC FORCE
MICROSCOPE
VIDEO
MICROSCOPE
HIGH SPEED
OPTICAL PROFILER
ANGSTROM RANGE
AFM expands 3D capabilities into sub-nanometer range
down to a single angstrom, including laterally,
which is not attainable with any optical technique.
SUPREME PROFILOMETRY
By measuring the direct physical wavelength linked to a specific height,
NANOVEA Profilers provide unmatched accuracy of surface measurements on any material.

And High Speed sensors, available on the system, can do it up to 200 times faster.
No algorithms. No stitching. No wasted time.
SPACIOUS OPEN
PLATFORM
200 X 150 mm X-Y stages and adjustable height clearance
up to 150 mm make AFM Pro ideal for a wide range of samples
with varied geometries.
QC options are available to automate all aspects of testing, including macro programs,
pattern recognition, database communication and analysis recipes. The advanced software makes
it easy to select zones on screen to be scanned automatically by an Optical Profiler or AFM.




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