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AR Category: Profilometry Testing
Transparent Film on Transparent Substrate Measurement
The Nanovea PS50 Profilometer is used for roughness measurement, step height thickness and optical thickness of a thin transparent film on a transparent glass substrate. Step height will be obtained by measuring an area of the film and an area where the substrate is exposed for relative height difference, while optical thickness will be measured by using the Profilometer capability of measuring through the transparent film and detecting a reflecting both from the top surface of the film and the substrate simultaneously.
Transparent Film on Transparent Substrate Measurement Using 3D Profilometry
Flatness Measurement of Wafer Using 3D Profilometry
In this application the Nanovea ST400 Profilometer is used to measure the section of a wafer array. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a much larger surface. Surface flatness measurement, planarity & other surface parameters are used to analyze the surface.
Texture Consistency Measurement Using 3D Profilometry
In this application the Nanovea ST400 Profilometer is used to measure the texture consistency of linoleum flooring. The intended surface texture here should be a repetitive structure with the same relative size. Measuring a small area should show how consistent this texture is being produced.
Micro Scratch Depth Measurement Using 3D Profilometry
In this application the Nanovea ST400 Profilometer is used for depth measurement of a row of micro scratches created using Nanovea’s Mechanical Tester in scratch mode. In seconds the Profilometer, with a single line pass in 2D mode, provides area and depth measurement.
