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AR Category: Profilometry | Step Height and Thickness
Transparent Film on Transparent Substrate Measurement
The Nanovea PS50 Profilometer is used for roughness measurement, step height thickness and optical thickness of a thin transparent film on a transparent glass substrate. Step height will be obtained by measuring an area of the film and an area where the substrate is exposed for relative height difference, while optical thickness will be measured by using the Profilometer capability of measuring through the transparent film and detecting a reflecting both from the top surface of the film and the substrate simultaneously.
Transparent Film on Transparent Substrate Measurement Using 3D Profilometry
Micro Scratch Depth Measurement Using 3D Profilometry
In this application the Nanovea ST400 Profilometer is used for depth measurement of a row of micro scratches created using Nanovea’s Mechanical Tester in scratch mode. In seconds the Profilometer, with a single line pass in 2D mode, provides area and depth measurement.
