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AR Category: Application Notes
Scratch Resistance of Microstructure using Scratch Testing
In this application, the Nanovea Mechanical Tester in its nano scratch testing mode is used to measure the load required to cause failure to a microstructure. We must simulate the process of scratching in a controlled and monitored manner to observe scratch resistance. A 10μm diamond tipped stylus is used at a progressive load ranging from 10 mN to 20 mN to scratch the microstructure. The point where the coating fails by cracking is taken as the point of failure.
Connector Pin Inspection With 3D Profilometry
In this application, the Nanovea ST400 Profilometer is used to measure the full area of a connector surface and its pins. The application was chosen for its challenging features while highlighting the measurement options with Nanovea’s technique. There is an endless list surface parameters that can be automatically calculated after the surface scan. Here we will review a full 3D profile, flatness of the connector base, coplanarity of the pins and the roughness of a pin tip.
