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Portability and Flexibility of the Jr25 3D Non-contact Profilometer

Understanding and quantifying a sample’s surface is crucial for many applications including quality control and research. To study surfaces, profilometers are often used to scan and image samples. A large problem with conventional profilometry instruments is the inability to accommodate for non conventional samples. Difficulties in measuring non conventional samples can occur due to sample size, geometry, inability to move the sample, or other inconvenient sample preparations. Nanovea’s portable 3D non-contact profilometers, the JR series, is able to solve most of these problems with its ability to scan sample surfaces from varying angles and its portability.

Read about the Jr25 Non-contact Profilometer!

1 Comment

  1. Kelli Byrne | Reply

    We currently use an optical thin film analyzer in order to measure our PTFE coating thicknesses on sacrificial silicon wafers that are coated at the same time as our products. We are looking for a way to measure the coating on an actual product that is coated. We coat anywhere between 50 nm and 10 micron, but this is not a limiting capability if the tool has a smaller range of thicknesses it can measure. Our coating is optically clear and we get very good results with our current thin film analyzer, however it does not have the capabilities of measuring on our products since the substrate needs to be reflective and flat.

    Could you share some more information on any products that might be able to measure our coating thickness? Some of the substrates we are interested in measuring coating thickness on are curved aluminum substrates with a 50-150 grit texture (pretty rough) and PCB’s. I appreciate any help you could give.



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