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New Multipen Turret From Micro Photonics Offers Nine Sensor Options in One Assembly

Irvine CA, July 7, 2006 – Micro Photonics Inc. today, introduced the new multi optical pen turret offering greater flexibility in chromatic confocal measurements. Incorporating the multi optical pen turret onto the Profilometer allows users to quickly and easily change optical pens without spending down time removing or adding new pen assemblies. Comprised of three unique magnifiers and three different chromatic lenses, the multi optical pen Turret offers up to nine optical sensor options in a single assembly. The turret easily integrates onto any new or existing Nanovea Profilometer 3D Optical Non-Contact Optical Profiler. Pen combinations are comprised from over thirty different sensor selections available from Micro Photonics. Choices include five magnifiers, ranging from 3.3 mm to 29 mm focal lengths, and six different chromatic lenses, 130 µm to 27 mm depth of fields. Pen combinations can achieve maximum axial resolution of 5 nm, accuracy to 20 nm and max slope to 87º for diffusive objects. This Nanovea Micromeasure option is available exclusively from Micro Photonics Inc. Micro Photonics has been a leading provider of materials technology instruments and laboratory testing since 1992. The company specializes in: Nano and Micro Mechanical Testing, X-Ray Micro Tomography, Ellipsometery, X-Ray Diffraction, 3D Non-Contact Profilometer, Thin Film Analysis, Biological Imaging Instruments and NSOM, SPM & AFM systems.

Micro Photonics unveils new lower priced modular chromatic confocal optical pens.

Irvine CA, March 24, 2006 – Micro Photonics Inc. today introduced the latest line of chromatic confocal optical pens for profilometry, microtopography, roughness, auto-focus vibrometery, in-line inspection quality control, and thickness measurements. The new modular design allows up to 30 different optical pen configurations for specific depth of field, spot size, working distance, object slope and photometric efficiency. Users can choose from a selection of five magnifiers, ranging from 3.3mm to 29mm focal lengths, and six different chromatic lenses, 130µm to 27mm depth of fields. Pens can achieve maximum axial resolution of 5nm, accuracy to 20nm and max slope to 87º for diffusive objects. Based on white light chromatic aberration, the pens have superior lateral resolution (1.1µm) and vertical resolution (5nm); which make them a better choice than laser triangulation sensors for applications where high resolution measurements are critical, as sometimes found in vibrometry, in-line inspection and quality control applications. For challenging materials such as, textiles, polymers, black or dark blue materials, high aspect ratio surfaces, and materials of low reflectivity, white light chromatic aberration is often the only appropriate technique. Micro Photonics believes new competitive pricing will attract clients who previously considered white light chromatic aberration too expensive. “Clients have known of this technique, and its benefits for OEM applications, but because of the price it was passed on in favor of cheaper laser sensors. The new prices are 40% lower on average, which will make a difference.” said Pierre Leroux, General Manager, Surface Test Division. Acquisition speed to 30,000Hz meets specific vibrometry, in-line and off-line quality control requirements. The system can be used as a stand alone unit or connected to a computer using various software packages. Integrated solutions such as the Micromeasure Profiler and Micromeasure Dual Scanner are also available for complete 3D surface imaging. This technology is available from Micro Photonics Inc. Micro Photonics has been a leading provider of materials technology instruments and laboratory testing since 1992. The company specializes in: Nano and Micro Mechanical Testing, X-Ray Micro Tomography, Ellipsometery, X-Ray Diffraction, 3D Non-Contact Profilometry, Thin Film Analysis, Biological Imaging Instruments and NSOM, SPM & AFM systems.

Micro Photonics Unveils Dual Scanning Profilometer and Scanning Instrument

Irvine CA, January 25, 2005 – Micro Photonics Inc. announced today the latest addition to their line of surface materials testing instruments. The Dual Scanning Profilometer the first of its kind, providing simultaneous thickness and dual profilometry scanning. Secured on a platform between the two pens, the sample stage moves in an x-y direction allowing the two probes to determine a synchronized surface profile. The system software computes the known distance between the pens, with the wavelength of the incident white light reflected from the sample surface, to determine the thickness of the sample at any given point. Utilizing the principle of Chromatic Aberration, two pens pass white light through the objective lens and reflect that light off the sample surface. The lens then collects the wavelength of incident white light and refocuses it in a variable distance from the lens. This exclusive technology is available from Micro Photonics Inc. Micro Photonics has been a leading supplier for materials technology instruments and laboratory testing for over twelve years. The company specializes in: Nano and Micro Mechanical Testing, X-Ray Micro Tomography, Ellipsometery, X-Ray Diffraction, 3D Non-Contact Profilometer, Thin Film Analysis, Biological Imaging Instruments and NSOM, SPM & AFM systems.

Micro Photonics Offers Breakthrough Technology for Temperature Specific Mechanical Testing

Irvine, California – April 22, 2004 – Micro Photonics Inc., a leading provider of surface materials instruments and laboratory services, introduces a breakthrough in materials technology, temperature specific mechanical testing. Researchers can easily attach the heating/cooling module to either hardness or scratch platforms to achieve temperatures between the ranges of -196°C and 600°C. Once in place, the module, consisting of a platinum resistance coil, and nearly fully encapsulating enclosure thusly reducing thermal drift, produces highly stable and accurate temperature control. Utilizing the Nano/Micro Hardness platform also offers another unique advantage: a differential surface-indenter depth technique to counter the effects of natural thermal expansion of the sample under test, a technology not available with other hardness testing instruments. Although the majority of indentation testing is performed at room temperature producing efficient results, the need to investigate the mechanical properties of certain materials at or near their in-service temperatures has grown significantly in recent years, prompting the development of this technology. Micro Photonics offers contract laboratory testing services, instruments, after-sales service and training for a wide range of surface metrology instruments including: nano/micro mechanical testing, friction, wear, adhesion, scratch resistance and fracture toughness. Ellipsometers are available for thin film thickness and optical properties (n&k), and a large array of non-contact surface profiling instruments for studying roughness, dimensional analysis, and radius of curvature and thickness properties. In addition, Micro Photonics offers x-ray microtomograghy instruments for imaging and analyzing internal microstructures.

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