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AR Blog Archives
Surface Measurement Using 3D Profilometry
In this application the Nanovea ST400 Profilometer is used for surface measurement of an exposed piece of carbon fiber. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a
much larger surface. Surface roughness, surface area, wavelength, fractal analysis and other surface parameters are used to characterize the surface.
