Surface Roughness Statistical Analysis Using 3D Profilometry

In this application the Nanovea ST400 Profilometer is used to measure over 30 coupons with similar surface features with only slight differences. The surfaces were analyzed for parameters such as surface roughness, maximum height, maximum peak height and root mean square. A statistical analysis was then performed using histograms, tables, control charts, box plots and
scatter plots.

Surface Roughness Statistical Analysis Using 3D Profilometry