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Surface Boundary Measurement
Surface Boundary Measurement Using 3D Profilometry
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SURFACE BOUNDARY MEASUREMENT
USING 3D PROFILOMETRY
Prepared by
Craig Leising
INTRODUCTION
In studies where the interface of surface features, patterns, shapes etc., are being evaluated for orientation, it will be useful to quickly identify areas of interest over the entire profile of measurement. By segmenting a surface into significant areas the user can quickly evaluate boundaries, peaks, pits, areas, volumes and many others to understand their functional role in the entire surface profile under study. For example, like that of a grain boundary imaging of metals, the importance of analysis is the interface of many structures and their overall orientation. By understanding each area of interest defects and or abnormalities within the overall area can be identified. Although grain boundary imaging is typically studied at a range surpassing Profilometer capability, and is only 2D image analysis, it is a helpful reference to illustrate the concept of what will be shown here on a larger scale along with 3D surface measurement advantages.
IMPORTANCE OF 3D NON CONTACT PROFILOMETER FOR SURFACE SEPARATION STUDY
Unlike other techniques such as touch probes or interferometry, the 3D Non Contact Profilometer, using axial chromatism, can measure nearly any surface, sample sizes can vary widely due to open staging and there is no sample preparation needed. Nano through macro range is obtained during surface profile measurement with zero influence from sample reflectivity or absorption, has advanced ability to measure high surface angles and there is no software manipulation of results. Easily measure any material: transparent, opaque, specular, diffusive, polished, rough etc. The technique of the Non Contact Profilometer provides an ideal, broad and user friendly capability to maximize surface studies when surface boundary analysis will be needed; along with the benefits of combined 2D & 3D capability.
MEASUREMENT OBJECTIVE
In this application the Nanovea ST400 Profilometer is used to measure the surface area of Styrofoam. Boundaries were established by combining a reflected intensity file along with the topography, which are simultaneously acquired using the NANOVEA ST400. This data was then used to calculate different shape and size information of each Styrofoam “grain”.
NANOVEA
ST400
RESULTS & DISCUSSION: 2D Surface Boundary Measurement
Topography image(below left) masked by reflected intensity image(below right) to clearly define grain boundaries. All grains below 565µm diameter have been ignored by applying filter.
Total number of grains: 167
Total projected area occupied by the grains: 166.917 mm² (64.5962 %)
Total projected area occupied by boundaries: (35.4038 %)
Density of grains: 0.646285 grains / mm2
Perimeter = 9114.15 µm +/- 4570.38 µm
Equivalent diameter = 1098.61 µm +/- 256.235 µm
Mean diameter = 945.373 µm +/- 248.344 µm
Min diameter = 675.898 µm +/- 246.850 µm
Max diameter = 1312.43 µm +/- 295.258 µm
RESULTS & DISCUSSION: 3D Surface Boundary Measurement
By using the 3D topography data obtained, the volume, height, peak, aspect ratio and general shape information can be analyzed on each grain. Total 3D area occupied: 2.525mm3
CONCLUSION
In this application, we have shown how the NANOVEA 3D Non Contact Profilometer can precisely characterize the surface of Styrofoam. Statistical information can be gained over the entire surface of interest or on individual grains, whether they are peaks or pits. In this example all grains larger than a user defined size were used to show the area, perimeter, diameter and height. The features shown here can be critical to research and quality control of natural and pre fabricated surfaces ranging from bio medical to micromachining applications along with many others.
