Archivos mensuales: abril 2009

Breakthrough Nanoindentation Testing With Image Pattern Recognition

Irvine CA, April 1, 2009 – Nanovea announced today a breakthrough development in Nanoindentación testing by combining advanced image pattern recognition capabilities to the most advanced nano-indenter for quality control applications. Nanovea has now combined their, PRVision, machine vision camera option to Nanoindentation testing that allows auto-recognition of precisely chosen features with little to no user interaction. The user-friendly software of Nanovea’s PRVision allows for an automatic test of hardness and elastic modulus on patterned samples or specifically chosen areas of interest. Nanoindentation properties including hardness and elastic modulus can then be automatically measured and recorded. The “quasi non-destructive” low loads associated with Nanoindentation Testing makes this technique an ideal breakthrough tool to monitor the quality control of environments where hardness and elastic modulus are crucial: Micro Electronics, Solar, Pharmaceuticals and many others. “Nanoindentation until now was performed using primitive mapping options. Our PRVision option will speed up Nanoindentation testing and opens the door to wide-scale automatic production quality control applications where hardness and elastic modulus are the best control parameters.” Said Pierre Leroux, CEO/President, Nanovea.