Archivos mensuales: octubre 2008

Nanovea’s Patent Pending Non-Contact Optical Depth Sensing Technique

Irvine CA, October 20, 2008 — Nanovea has Patent Pending on Non-Contact Optical Depth Sensing for Instrumented Indentation and Scratch Testing. The “Revolutionary” non-contact technique delivers 100% accurate height measurements during micro/macro scratch and hardness testing. Prior to this new advancement any testing would require mechanical surface contact, which was impossible during sample movement, to take in account substrate and machine compliance. Now with the ability to observe the precise depth of the indenter without touch, sample motion is no longer an issue and true depth of the indenter can be directly recorded. “We are very excited about our new technique and look forward to showcasing its superior results,” Said Pierre Leroux, General Manager, Micro Photonics Surface Test Division. “We are consistently looking for new ways to provide instruments that are as progressive as the solutions their intended for; I think this technique does just that. “The high precision modules for the determination of the Micro/Macro mechanical properties of thin/thick coatings and substrates using instrumented indentation and scratch/adhesion testing. They are ideal for the characterization of industrial coatings; ranging from plasma processed layers, used in semiconductor and optical technology, to decorative and protective coatings, used for automobile parts and consumer goods. Nanovea Micro/Macro Comprobadores mecánicos use independent force and depth sensors to obtain depth-versus-load curves used in instrumented indentation and scratch testing. The result, the fastest and most accurate measuring technique in the industry and capable on any shape & texture of material and resolves challenges associated with the older methods for indenter height measurements such as sinking on soft materials and reference movement on rough surfaces.