PROFILOMETER

With a single profilometer scan, a wide range of measurements can be obtained such as 3D waviness, roughness, step height and/or film thickness to advanced fractal analysis and microstructure/particle characterization.

Chromatic Confocal technology uses white light that passes through a series of lenses with high degree of chromatic aberrations. Each wavelength will focus at a different distance creating the vertical measurement range. When a surface of interest is within that range a single wavelength of the white light will be in focus while all others will be out of focus. Only the focused wavelength will pass through the pin hole filter to reach the CCD spectrometer. The physical wavelength measured corresponds to a vertical position.