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Altmann S.A. Importação e Comércio
BRAZIL
Av. Dr. Chucri Zaidan, 1550 Edifício Capital Corporate 17º andar- conjunto 1701
04711-130 – São Paulo – SP – Brazil
+55(11) 2198-7198
P: +55(11) 5507-3302
Best for steep angles
No Image Stitching
Fast for large areas
No Sample Prep
Very easy to use
No Refocusing
Chromatic Confocal technique uses white light that passes through a series of lenses with high degree of chromatic aberrations. Each wavelength will focus at a different distance creating the vertical measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus.
Only the focused wavelength will pass through the pin hole filter to reach the CCD spectrometer. The physical wavelength measured corresponds to a vertical position.
HOW WE ARE DIFFERENT FROM THE OTHERS
(Interferometry, Laser Microscope, Focus-Variation)
SCANNING A COIN
50x OBJECTIVE vs HIGH SPEED SENSOR (950 μm)
LASER SCANNING
CONFOCAL MICROSCOPE
CONFOCAL MICROSCOPE
V
Laser Light Health Hazard
Need for care of reflected light
Need for care of reflected light
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Change in wavelength of laser light
affects results on the same sample
affects results on the same sample
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Non significant "display resolution"
Height & lateral accuracy fixed by objective used
Complex accuracy calculations
Height & lateral accuracy fixed by objective used
Complex accuracy calculations
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Alpha blending algorithms to combine
layer by layer data for complex accuracy calculation
layer by layer data for complex accuracy calculation
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Limited fixed field of view
Inaccurate stitching algorithms for larger surfaces
Inaccurate stitching algorithms for larger surfaces
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Data Acquisition speed 7900 Hz
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CHROMATIC
OPTICAL PROFILER
OPTICAL PROFILER
S
SAFE WHITE LIGHT
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UNIFORM BROAD WHITE LIGHT SPECTRUM
No effect of light intensity on results
No effect of light intensity on results
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INDEPENDENT LATERAL & HEIGHT ACCURACY
Any scan area at selected height accuracy
Any scan area at selected height accuracy
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NO ALGORITHMS
Physical Wavelength Measured = Accurate Height
Physical Wavelength Measured = Accurate Height
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NO STITCHING
Continuous scannign of larger surfaces
Accuracy constant across any measurement size
Continuous scannign of larger surfaces
Accuracy constant across any measurement size
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50x FASTER
High Speed Sensor 384000 Hz
High Speed Sensor 384000 Hz
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LATERAL RESOLUTION vs ACCURACY
EXPERIENCE THE FUTURE OF PROFILOMETRY
ST500 Profilometer
Large Area
Large Area
Jr25 Profilometer
Portable
Portable
PS50 Profilometer
Compact
Compact
ST400 Profilometer
Standard
Standard
AFMPRO Profilometer
Atomic Force
Atomic Force
JR100 Profilometer
Portable
Portable
HS2000 Profilometer
Zero Noise/Flatness
Zero Noise/Flatness
In-line Profilometer
Roughness QC
Roughness QC
OUR EXPERTS
ARE ALWAYS
ONE CLICK AWAY
