
NANOVEA ST500 is a large area optical profilometer for non-contact surface measurement, designed for high-speed scanning of oversized samples.
Built on NANOVEA’s chromatic light technology, the ST500 delivers accurate 2D and 3D surface characterization with continuous scanning over extended travel ranges, making it ideal for applications where area coverage, speed, and measurement reliability are critical.

400 mm @ 200 mm/s
CONTINUOUS SCAN
400 x 400 mm X-Y axis travel with speeds up to 200 mm/s. Delivers ultrafast measurements.
Stitching Free!

Unmatched ultrafast scanning at
384,000 points/s
Fully programmable… The Only system you need for Quality Control and Research with nanometer accuracy.

X – Y Scan Area
400 x 400 mm Motorized

Height Range
nm to cm

Desktop Dimensions
97 x 72 x 92 cm

Scan Speed
200 mm/s

The NANOVEA ST500 is a large area 3D optical profilometer for non-contact surface measurement of big parts and many samples at once. Its motorized 400 x 400 mm X-Y stage scans at up to 200 mm/s, measuring roughness, texture, form, flatness, step height and volume with chromatic light sensors on any material, transparent or opaque.
A continuous 400 mm scan needs no stitching. The Z axis has 50 mm of motorized travel plus a 140 mm manual slide. Point sensors cover height ranges from 110 µm to 24 mm; high-speed line sensors measure 192 points at once at 384,000 points per second. Rotational options (stage or cylinder) and 4-axis customization extend it beyond a standard profilometer.
The ST500 is fully programmable for automated quality control and research, on a spacious open desktop platform.
| X-Y stage travel | 400 x 400 mm, motorized |
|---|---|
| X-Y max speed | 200 mm/s |
| Z axis | 50 mm motorized + 140 mm with manual slide |
| Rotational options | Stage or cylinder rotation; 4-axis customization |
| Automation | Fully programmable |
| Video microscope | Up to 50x objective magnification, 1200 x 1600 color video camera, stitching and focus stacking |
| Max vertical resolution | 1 nm |
| Max surface angle | Up to 87° |
| Dimensions | 97 x 72 x 92 cm |
| Specification | PS1 | PS2 | PS3 | PS4 | PS5 | PS6 |
|---|---|---|---|---|---|---|
| Max height range | 110 µm | 300 µm | 1.1 mm | 3.5 mm | 10 mm | 24 mm |
| Working distance | 3.3 mm | 10.8 mm | 12.2 mm | 16.5 mm | 26.6 mm | 20 mm |
| Lateral X-Y accuracy | 0.8 µm | 1.7 µm | 2.6 µm | 4.6 µm | 11.0 µm | 11.0 µm |
| Height repeatability | 1.9 nm | 5.4 nm | 15.8 nm | 31.6 nm | 117.0 nm | 237.2 nm |
Height repeatability: fixed point measurement on glass, Ra average height variation for 1,200 points (100 samplings).
| Specification | LS1 | LS2 | LS3 |
|---|---|---|---|
| Max height range | 200 µm | 0.95 mm | 3.9 mm |
| Working distance | 5.3 mm | 18.5 mm | 41 mm |
| Height repeatability (Ra) | 14 nm | 21 nm | 70 nm |
| Line width | 0.96 mm | 1.91 mm | 4.78 mm |
| Pitch | 5 µm | 10 µm | 25 µm |
| Lateral accuracy of each point | 1 µm | 2 µm | 5 µm |
| Acquisition rate | 384 kHz | 384 kHz | 384 kHz |
Height repeatability: fixed point measurement on glass, Ra average height variation for 1,200 points (100 samplings).
Specifications subject to change. Every NANOVEA instrument is built to order; ask for the configuration that fits your samples.
Roughness & finish
Ra, Rz and ISO 25178 areal parameters over large areas.
Texture & grain
Texture consistency and direction across full panels.
Flatness & warpage
Flatness and warpage of wafers, panels, PCBs and seals from full 3D maps.
Geometry & shape
Contours, radii and dimensions, including rotational measurement.
Step height & thickness
Steps and coating thickness, including transparent films.
Volume & area
Wear, pitting and material loss by volume.
ST400 modular profilometer
200 x 150 mm at 40 mm/s, up to 190 mm sample clearance: the most configurable benchtop model.
JR100 portable profilometer
100 x 100 mm continuous scans in a portable unit, for parts that cannot come to the lab.
In-line profilometer
Chromatic sensors mounted on the production line for real-time inspection.
Studies from our laboratory on this class of instrument, published with full test parameters.

Monitor paint drying in real time with a 3D non-contact profilometer: surface height, roughness and ISO 25178 texture tracked over a 60-minute drying period.

Non-contact 3D inspection of a curved machined part against its CAD model: profile tolerance (30 µm over 156 mm vs ±125 µm), radius and roughness, in under 40 seconds.

Advil, Tylenol and Excedrin tablets measured with a NANOVEA high-speed line sensor: coated Advil was smoothest (Sa 0.958 µm), uncoated Tylenol roughest (Sa 4.125 µm).

3D profilometry of bidirectional and unidirectional carbon fiber weaves: ISO 25178 roughness, isotropy (59.96% vs 12.83%), weave distances, texture wavelength and fractal dimension.

3D non-contact measurement of orange peel texture on a gloss paint: isotropy, ISO 25178 height and Sk parameters, bearing ratio and peak island analysis over 25 × 25 mm.

High-speed 3D scans of five US pennies: ISO 25178 roughness, rim radius dimensional analysis and surface subtraction against a 2007 reference with Mountains 3D software.
NANOVEA instruments appear in 444 published studies on surface topography and roughness, by researchers at universities and industrial laboratories worldwide.
Synthesis of Ultrathin WS2 Nanosheets and Their Tribological Properties as Lubricant Additives
Xianghua Zhang, Hongxiang Xu et al. · Nanoscale Research Letters, 2016
Measured with the NANOVEA PS50
3D MXene‐Based Flexible Network for High‐Performance Pressure Sensor with a Wide Temperature Range
Yimei Xie, Yongfa Cheng et al. · Advanced Science, 2022
Measured with the NANOVEA ST400
Renxing Liang, Robert S. Grizzle et al. · Frontiers in Microbiology, 2014
Measured with the NANOVEA PS50
Junjie Wang, Shaofeng Zhou et al. · RSC Advances, 2018
Measured with the NANOVEA ST400
Dependence of Skin-Electrode Contact Impedance on Material and Skin Hydration
Krittika Goyal, David A. Borkholder et al. · Sensors, 2022
Measured with the NANOVEA ST400
Durable Superhydrophobic Wood via One-Step Immersion in Composite Silane Solution
Junfei Ou, Guoqing Zhao et al. · ACS Omega, 2021
Measured with the NANOVEA PS50
Fast, non-contact 3D measurement of large parts or many samples: roughness, texture, flatness and warpage, geometry, step height and volume, for production quality control and research.
The motorized stage travels 400 x 400 mm and scans 400 mm continuously without stitching. Rotational stages and 4-axis customization are available for round parts.
The stage moves at up to 200 mm/s, and a high-speed line sensor measures 192 points simultaneously at 384,000 points per second.
Yes. It is fully programmable, so multi-sample sequences, measurement recipes and analysis run automatically.
The same chromatic light sensors as the rest of the range: point sensors PS1 to PS6 (110 µm to 24 mm height range, 1.9 nm to 237.2 nm repeatability) and line sensors LS1 to LS3 (200 µm to 3.9 mm, 14 nm to 70 nm repeatability).
Pricing depends on sensors, automation and options. Contact NANOVEA sales for a quote; our laboratory can measure your parts first.
