COVID-19: In these troubled times, NANOVEA devotes necessary resources to maintain all of the essential services you count on. Stay safe!
CONTACT SUPPORT CONTACT US

ST500

Ultrafast Large Area Profilometer

400 mm @ 200 mm/s
CONTINUOUS SCAN

400 x 400 mm X-Y axis travel with speeds up to 200 mm/s. Delivers ultrafast measurements.
Stitching Free!

Unmatched ultrafast scanning at

384,000 points/s

HIGH QUALITY QUALITY CONTROL

Fully programmable… The Only system you need for Quality Control and Research in Nanometer accuracy.

X – Y Scan Area

400 x 400 mm Motorized

Height Range

2.5 nm to 25 mm

Desktop Dimensions

97 x 72 x 92 cm

Scan Speed

200 mm/s

Profilometry - Chromatic Confocal Sensor Technology
Best for steep angles
No Image Stitching
Fast for large areas
No Sample Prep
Very easy to use
No Refocusing

OUR EXPERTS

ARE ALWAYS

ONE CLICK AWAY

Want us to test your samples?

Please fill up our form and we will reach out to you soon!