PROFILOMETERS

NANOVEA Profilometers are designed with leading edge Chromatic Confocal optical technology (Axial Chromatism).

• The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions; unlike all other techniques.
• Fast speed sensors are available to scan large surface at high accuracy.
• Nanovea range of 3D Non Contact Profilometers include small compact PS-50 to Large Pneumatic HS2000 and the first fully portable Profilometer, the Jr-25.

Roughness Texture Finish

Profile Dimensional

Topography Shape Form

Flatness Warpage Planarity

Volume Area

Step-Height Depth Thickness