Application Note | Fabric Surface Area

Fabric Surface Area Measurement Using 3D Profilometry

How a Honeycomb Pattern Multiplies the Surface Area of a Cleaning Wipe

Optical pen above a fabric cleaning wipe

Research & Experimental Testing

Jorge Ramirez

Visual Design & Editorial

Andrew Shore

Introduction

Surface area measurement can be critical when studying the intended interaction of fabric cleaning supplies with various types of surfaces. The projected and developed surface areas of cleaning supplies can translate into superior absorbency of germs and other unfavorable residues. The developed surface area is not the only contributing factor to efficiency: for example, the unique pattern found on the surface of cleaning wipes is intended to increase the effectiveness of their use.

Importance of 3D Non-Contact Profilometry for Surface Area Analysis

The NANOVEA 3D Non-Contact Profilometer is ideal for measuring the surface of a cleaning wipe through its use of axial chromatism. The technique measures nearly any surface, sample sizes can vary widely due to open staging and there is no sample preparation needed. The profilometer has the advanced ability to measure high surface angles without software manipulation of results, and easily measures any material, such as transparent, opaque, specular, diffusive, polished or rough. Touch probes and other non-contact techniques would have difficulty properly measuring the fabric surface of a cleaning wipe. The 3D non-contact profilometer provides an ideal, broad and user friendly capability for studies of unique surfaces such as fabric cleaning wipes.

ℹ️ Learn more about surface profiling lab services.

Measurement Objective

In this application, the NANOVEA ST400 Profilometer was used to measure the surface area of a fabric cleaning wipe to determine the projected and developed surface areas, as well as a contour analysis of the texture on the surface.

NANOVEA ST400 Standard

Optical 3D Profilometer

NANOVEA ST400 modular optical profilometer for non-contact 3D surface measurement
Optical pen of the profilometer above a textured cleaning wipe
Fig. 1: Optical pen scanning the cleaning wipe.

Results

Projected and Developed Surface Area

The wipe was scanned with an X scan length of 30.0 mm and a step size of 12.0 µm, using a 1.2 mm optical pen at an acquisition rate of 180 with averaging of 1. The false color view and 3D image show the honeycomb texture, and the ISO 25178 panel gives the developed and projected surface areas (Table 1).

False-color height map of the wipe showing a repeating honeycomb of pores
Fig. 2: False color view of the cleaning wipe.
3D view of the wipe surface with its ISO 25178 panel highlighting developed and projected area
Fig. 3: 3D image with the developed and projected surface areas.
ISO 25178 parameterValue
Sa74.97 µm
Sq107.3 µm
Ssk−1.074
Sku6.049
Sp585.2 µm
Sv531.2 µm
Sz1116 µm
Sdar, developed area5080 mm²
Spar, projected area535.8 mm²

Table 1: Height parameters and surface areas of the cleaning wipe (from Fig. 3).

Pore Analysis

A profile across one pore of the honeycomb was used for depth, distance and area measurements, and a contour analysis measured the pore diameter (Table 2).

Three profiles across a pore: depth band, horizontal distance between rims and the filled area of the pore
Fig. 4: Depth measurement, distance measurement and area of the pore.
Contour map of the wipe with circles fitted to two pores and their diameters
Fig. 5: Contour analysis of the pore.
Pore measurementValue
Maximum height (depth measurement)181.3 µm
Mean height (depth measurement)129.8 µm
Horizontal distance3.669 mm
Maximum depth (area of the pore)0.5354 mm
Area of the hole0.6499 mm²
Contour fit 1, diameter (radius)3.370 mm (1.685 mm)
Contour fit 2, diameter (radius)3.340 mm (1.670 mm)

Table 2: Pore measurements (from Figs. 4 and 5).

Conclusion

In this application, using the NANOVEA 3D Non-Contact Profilometer, we have shown how the surface area increased with the honeycomb fabric design on the surface of the wipe. The developed area increased to approximately ten times the projected area. Beyond the measurements shown here, the 3D non-contact profilometer offers a wide range of measurements (dimension, roughness, finish and texture, shape, form and topography, flatness, warpage and planarity, volume and area, step height, depth and thickness, and others). With this information, projected and developed surface areas can be broadly investigated with a complete set of surface measurements.

Frequently Asked Questions About Fabric Surface Area

Why measure the surface area of a cleaning wipe?

Projected and developed surface area influence how well a wipe absorbs germs and residues, and patterned surfaces are designed to increase effectiveness.

Why non-contact for fabric?

Touch probes and many other techniques struggle on soft, porous fabric; axial chromatism measures it directly, including steep angles, with no sample preparation.

How much did the pattern increase surface area?

The developed area was 5080 mm² over a projected area of 535.8 mm², about ten times larger.

How rough is the wipe?

Sa 74.97 µm, Sq 107.3 µm and Sz 1116 µm (ISO 25178).

What did the pore analysis show?

A pore of the honeycomb measured 0.5354 mm deep with a cross-section area of 0.6499 mm² and a width of 3.669 mm; contour fits gave diameters of 3.370 and 3.340 mm.

What else can be measured?

Dimensions, roughness and texture, form, flatness, volume and area, step heights and thickness.

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