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Profilometer Instruments | Lab Services | Chromatic Confocal | Application Notes

The chromatic confocal technique offers the best accurately measures step heights from 60nm to 20mm. The advantage of the technique to accurately measure thickness lies on the fact that chromatic confocal is not influence by large change in reflectivity or texture as sometime seen when going from a coating to its substrate. Thickness of an optical transparent layer can also be measured with similar resolution and range (> 7μm).



• ISO 5436-1


Standard Measurement Analysis:

• Point to point

• Plane to plane

• Maximum, minimum and mean heights

• 3D or 2D map of thickness

• Thickness distribution curve

Software Features:

Easily defined line or area scans


• Lateral resolution

• Export raw data and images

• Real time display

• Automatic reporting

• Multi-language support

• Mapping


Analysis Software Features:

• Filtering

• Leveling

• Thresholding

• Zooming

• Area selection and form removal tools

• Subtract and compare functions and many others

Advanced Automation:

• Automatic focus (optical and microscope), automatic analysis template

• Multi sample handling macros

• Easy selection of area under the microscope for profiling or AFM testing

• Automatic dual frequency for surfaces with varying reflectivities

• Rotational staging

• Pattern recognition

• Database communications

• Pass/Fail limits

• Line sensors for up to 200 times faster measurements


Sample(s) Holders and Environmental Conditions:

• Custom and standard sample holders

• Heating stage


Additional Surface Measurements:

Surface Roughness Measurement

Surface Profile Measurement

Surface Topography Measurement

Surface Flatness Measurement

Surface Volume Measurement

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