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Nanovea Profilometers are designed with leading edge Chromatic Confocal optical technology (axial chromatism) both ISO and ASTM compliant. The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions. There is no influence on accuracy from sample’s reflectivity, no need for frequent calibrations and no effects due to changes in measurement parameters. Utilizing a raster scan, the Profilometer can measure in 2D and 3D at standard speeds with an Optical Pen or 200 times faster with a Line Sensor, allowing a flexible measurement solution for all applications. The platforms can be integrated with wide area video imaging which extends the Profilometers with user friendly automation. Several automation options are available including: programmable recipes, pattern recognition, machine vision, automatic pass/fail results and database communication. Many standard Profilometer models are available including a first fully portable Profilometer, the Jr-25. Profilometers can also be custom built with various platform sizes, motorization configuration (rotational, high speed and Class 1 Clean Room). The Profilometers durability and low cost of use are ideal for quality control environments. For technical specification please use Brochure Download


Nano through Macro Range


P3 | Fully Automated Roughness Measurement

P3 | Automated Surface Roughness Measurement

The P3 is designed to seemingly measure any surfaces using the Chromatic Confocal technique with all of its advantages. With only a few touch of the screen, an operator can obtain automatic and reproducible roughness (ISO 25178) on any materials. The tool also provides surface height data that can be use for quality control. Input function includes: Area, Sample Size and Reflectivity. Output function includes: Roughness and False Color Height Map. Learn more

• Fast Roughness (ISO 25178) • Fully Automated Touchscreen • Compact Design • Quality Control Tool

Jr25 Portable Profilometer

Jr25 Profilometer | Portability

The Jr25 is the first truly portable high performance Profilometer of its kind. With an optional battery pack and carrying case, the Jr25 provides measurement capability during field studies. The Jr25 is designed to utilize the superior Chromatic Confocal technique with complete portability. With a total weight less than 5.5 Kg, the operator can safely place the Jr25 onto the surface under inspection. The Jr25 has the ability to measure an area up to 25mm x 25mm and focusing on the surface is easy with an adjustment range of 30mm. With a fully rotational scanning head, the Jr25 has the ability to measure surfaces at difficult angles. Along with quick and ease of use, the Jr25 has been designed specifically for production environments where samples cannot be moved or in open field studies. The scanning head of the Jr25 can also be integrated onto automated robotic arms and other equipments.

• Weight less than 5.5kg • Small Footprint • True 2D & 3D Portability

PS50 Profilometer

PS50 Profilometer | Affordability

With a small footprint (30 x 25 x 27cm), the PS50 is the most advanced compact Profilometer available. The high-performance PS50, with 50mm X-Y stages, is the ideal choice for upgrade and replacing stylus and laser profilers. The PS50 has the option of running by laptop which makes for an easy moving and installation where space is critical. Comes standard with 150mm x 150mm sample stage area to accommodate multiple and or larger samples. Quality Control options with macros for automatic testing and analysis recipes.

• Compact Benchtop • 50mm x 50mm XY • Ideal Upgrade From Stylus and Laser Technologies

ST400 Profilometer

ST400 Profilometer | Standard

With 150mm X-Y stages and an adjustable height clearance of up to 200mm, the ST400 is ideal for a wide range of samples with varied geometries. With the optical video zoom or optical microscope, high magnification microscopy work can be done in combination with measuring roughness and other properties at precisely selected locations. An AFM integration expands the 3D capabilities into the sub nanometer range including laterally which is not attainable with any other optical technique. The advanced software makes it easy to select zones on the video to be scanned automatically by Profilometer or by the AFM. Quality control options are available to automate various aspects of testing including image pattern recognition, database communications, macros for automatic testing and analysis recipes. Chromatic Confocal line sensors are also available on this system to allow speed of up to 200 times faster than the single point sensor. Custom ST400’s are available for more open configurations that allow for larger X-Y stages, 360° rotational stages and many other custom configurations.

• Spacious & Open Platform • AFM & Microscopy Integration • High Sample Clearance • Customizable Options

ST5000 Profilometer

ST500 Profilometer | Fast & Large Areas

After years of success with the ST400 and HS1000 Nanovea has combined the two, meet the ST500 Profilometer, for requirements exceeding the ST400 but not quite that of the HS1000. The ST500 provides fast large area measurement (without stitching) using a 400 mm X-Y axis travel with a maximum speed up to 200 mm/s. With a 50 mm Z axis the system can be equipped with either an optical pen or line sensor for ultra fast measurement (384,000 points per second). Unlike other technologies, each point is a direct, full depth of field during large area measurement without the need of refocusing. A video zoom camera can also be used to provide automated functions to large area measurement complete on a user friendly desktop platform.

• Larger & Open Desktop Platform • Fast Large Area Measurment • High Sample Clearance • Powerful For Quality Control • Customizable Options

HS1000 Profilometer

HS2000 Profilometer | High Speed Inspection & Precision Flatness Measurement

The HS2000 provides automated optical inspection at high speeds (up to 1m/s & data acquisition up to 31KHz) for quality control applications where speed and large areas or multiple measurements is critical. The HS2000 with its granite base and air bearing stages provides superior stability at high speeds for flatness measurement. Comes with an enclosure and workstation to create a fully contained stand-alone instrument. The HS2000 equipped with a line sensor can inspect at speed of up to 200 times faster. Designed for stable high speed flatness measurement, advanced automation and customizable options.

• High Speed • Precision Flatness Measurement •Advanced Automation • User Friendly Technology • Rigid and Stable Structure • Customizable Options

App Notes