Nanovea began designing and manufacturing instruments after years of experience in providing solutions for profilometry, mechanical and tribology applications. Firmly aligned with its vision, Nanovea aims to simplify advanced measurement technology to stimulate materials engineering for the common good. Ease of use, advanced automation and the dedication to superior accuracy are the driving forces behind the design and manufacturing of its full range of Optical Profilometers, Mechanical Testers and Tribometers. Unlike other manufacturers, Nanovea also provides Laboratory & consulting services. Thus, clients are given access to years of experience in finding solutions to improve quality control and materials development. Nanovea offers many critically important tests including roughness measurement, nanoindentation, scratch and wear testing among many others. Nanovea’s instruments can be found internationally in distinguished educational and industrial organizations ranging from automotive to cosmetic, biotechnology to medical devices to microelectronics and space applications. Thousands of clients rely on Nanovea for accurate solutions, technically superior instruments, experienced assistance and comprehensive laboratory services.


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Cutting Tool Edge Measurement in Seconds

Irvine CA, July 27, 2016 – Conventional profilometry scans sample surfaces from a single, fixed direction.  This is only appropriate for measuring sufficiently flat samples, as opposed to cylindrical shapes that require a precise 360° rotation. For an application such as characterizing the helical cutting edge of a tool, a conventional machine would need multiple scans from different angles of the entire part, as well as significant post scan data manipulation. This is often too time consuming for QC applications that only require measurements from very specific regions.

NANOVEA’S rotational stage solves this problem with simultaneous motion control of the lateral and rotational axes. This technique eliminates the time consuming need of measuring the entire part and continuous realignment. Instead, the full circumference of the entire cutting edge can be determined in seconds. All desired angles and features can be directly determined from the scan, with no need for the extensive stitching together of multiple files.

NANOVEA’s chromatic confocal technique offers far greater resolution, down to 2.7 nm, and accuracy than Focus Variation competitors. The raw surface height is measured directly from the detection of the wavelength focused on the surface, with none of the errors caused by Interferometry techniques, no field of view limitations, and no need for sample surface preparation. Materials with extremely high or low reflectivity can easily be measured and very high wall angles are accurately characterized without any issue.

Coupled with NANOVEA’s line sensor, a bar of data up to 4.78mm wide can be captured in a single pass, while moving linearly for up to 150mm in the scanning direction. Simultaneously, the rotational stage can revolve the sample at the desired speed. Put together, this system allows for the creation of a continuous 3D height map of the entire circumference of a cutting edge, with any pitch or radius, in a fraction of the time when compared to other technologies.

Learn more about our 3D Profilometer