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Compact Optical Profilometer – NANOVEA PS50

NANOVEA PS50 is a compact benchtop optical profilometer for non-contact surface measurement.

It uses NANOVEA’s chromatic light technology to measure surface topography with high vertical accuracy, making it well suited for routine surface characterization when space, simplicity, and cost matter.

NANOVEA PS50 compact optical profilometer for non-contact surface measurement
THE NEW NORMAL
 
NANOVEA Non-Contact Optical Profilers are the ideal upgrade from traditional contact stylus and laser profilometers.

AFFORDABLE INVESTMENT

All testing capabilities.
In a uniquely compact set-up.
At an affordable price.

SOPHISTICATED INSTRUMENT

SIMPLE DESIGN

X – Y Scan Area

50 x 50 mm Motorized

Height Range

nm to cm

Desktop Dimensions

38 x 33 x 43 cm

Scan Speed

20 mm/s

Best for steep angles
Fast for large areas
Very easy to use
No Image Stitching
No Sample Prep
No Refocusing