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AR In-Line Profilometer
NANOVEA’s in-line profilometer solutions integrate non-contact chromatic light sensors directly into production lines, enabling real-time surface measurement and immediate process feedback.
Built on the same proven sensors used in NANOVEA’s laboratory profilometers, these systems deliver accurate 2D and 3D surface characterization – roughness, texture, geometry, and defect detection – without interrupting production.
IN-SITU MEASUREMENT
& REAL-TIME FEEDBACK
NANOVEA’s unique software provides measurements and analysis of any surface in real time with acquisition rates of more than 1,300,000 points/sec.
One of its numerous features, Pass & Fail criteria specific to each sensor or average of all sensors, helps to effectively identify surface defects derived from materials processing and product manufacturing.
TRIGGERED
IN-LINE INSPECTION
CONTINUOUS
IN-LINE INSPECTION
Multiple non-contact profiler sensors can be installed to monitor roughness and textures of different areas at the same time. Capable of determining roughness of a sample without contact,
Chromatic Light technology allows for a reliable in-line surface quality inspection of the end product.
Best for steep angles
Fast for large areas
Very easy to use
No Image Stitching
No Sample Prep
No Refocusing
2D & 3D NON-CONTACT PROFILOMETRY
HIGH QUALITY QUALITY CONTROL
SEAMLESS INTEGRATION
We provide personalized full integration support, including specific mounting structures so you don’t have to worry about disrupting your established process.
