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AR Escaneado ultrarrápido inigualable a
384.000 puntos/s
Modular Optical Profilometer – NANOVEA ST400
NANOVEA ST400 is a modular optical profilometer for non-contact surface measurement, designed as a versatile platform for both research and quality control environments.
As NANOVEA’s flagship optical surface profilometer, it is built on chromatic light technology to deliver reliable, high-speed 2D and 3D surface characterization with continuous scanning and flexible configurations, making it the standard choice for laboratories requiring accuracy, scalability, and long-term adaptability.
200 mm @ 40 mm/s
ESCANEO CONTINUO
200 x 150 mm X-Y axis travel with speeds up to 40 mm/s. Delivers fast measurements.
Stitching Free!
ALTA CALIDAD CONTROL DE CALIDAD
The advanced software makes it easy to select zones on screen to be scanned automatically.
QC options are available to automate all aspects of testing, including pattern recognition, database communication, macro programs and analysis recipes.
FREELY CUSTOMIZABLE.
UNIQUELY YOURS
UNIQUELY YOURS
Larger X-Y stages, 360° rotational stages & many custom configurations available.
Área de exploración X - Y
200 x 150 mm Motorized
Altura
nm to cm
Dimensiones de sobremesa
62 x 62 x 82 cm
Velocidad de exploración
40 mm/s
Lo mejor para ángulos pronunciados
Rápido para grandes superficies
Muy fácil de usar
Sin cosido de imagen
Sin preparación de muestras
Sin reenfoque
PERFILOMETRÍA 2D Y 3D SIN CONTACTO
