Modular Optical Profilometer – NANOVEA ST400

NANOVEA ST400 is a modular optical profilometer for non-contact surface measurement, designed as a versatile platform for both research and quality control environments.

As NANOVEA’s flagship optical surface profilometer, it is built on chromatic light technology to deliver reliable, high-speed 2D and 3D surface characterization with continuous scanning and flexible configurations, making it the standard choice for laboratories requiring accuracy, scalability, and long-term adaptability.