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Large Area Optical Profilometer – NANOVEA ST500

NANOVEA ST500 is a large area optical profilometer for non-contact surface measurement, designed for high-speed scanning of oversized samples.

Built on NANOVEA’s chromatic light technology, the ST500 delivers accurate 2D and 3D surface characterization with continuous scanning over extended travel ranges, making it ideal for applications where area coverage, speed, and measurement reliability are critical.

NANOVEA ST500 large area optical profilometer for high-speed non-contact surface measurement

400 mm @ 200 mm/s
CONTINUOUS SCAN

400 x 400 mm X-Y axis travel with speeds up to 200 mm/s. Delivers ultrafast measurements.
Stitching Free!

Unmatched ultrafast scanning at

384,000 points/s

HIGH QUALITY QUALITY CONTROL

Fully programmable… The Only system you need for Quality Control and Research with nanometer accuracy.

X – Y Scan Area

400 x 400 mm Motorized

Height Range

nm to cm

Desktop Dimensions

97 x 72 x 92 cm

Scan Speed

200 mm/s

Profilometry - Chromatic Confocal Sensor Technology
Best for steep angles
Fast for large areas
Very easy to use
No Image Stitching
No Sample Prep
No Refocusing