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EUROPA: +39-011-3052-794
CONTATTACI

SURFACE TOPOLOGY & CHEMICAL ANALYSIS SERVICES

* PROVIDED ONLY BY NANOVEA EUROPE

Gain a deeper understanding of your materials with NANOVEA’s expert Surface Topology and Chemical Analysis services. Our state-of-the-art equipment and techniques ensure accurate and reliable results every time in material characterization.

Whether you’re in the semiconductor, pharmaceutical, or any other industry, our team of experts can help you understand your materials’ properties using cutting-edge surface analysis techniques such as Infrared (IR) Spectroscopy, Chromatography, Electron Microscopy, Atomic Force Microscopy (AFM), and X-RAY Diffraction.

It is crucial to know the surface characteristics of your materials, which is why we offer a range of Surface Topology and Chemical Analysis services, including surface roughness analysis, surface modification, surface energy analysis, and much more.

If you’re looking for an experienced partner to help with your material characterization needs, contact us today to learn more about our Surface Topology and Chemical Analysis services. With our expertise in surface analysis techniques, you can trust NANOVEA for accurate and reliable results.

IR SPECTROSCOPY

IR SPECTRA ACQUISITION OF KNOWN MATERIALS

Analysis performed on sample and standard with FTIR-ATR method without pre-treatment. 
Functional groups definition.

IR SPECTRA ACQUISITION OF UNKNOWN MATERIALS

Analysis performed with FTIR-ATR method without pre-treatment. 
Functional groups definition.

CHROMATOGRAPHY

GC-MS

Qualitative/semi-quantitative identification of
components in oils and organic materials
subjected to tribological testing.

LC-MS

Qualitative/semi-quantitative identification of components in oils and organic materials
subjected to tribological testing.

ELECTRON MICROSCOPY

TEM

Punctual microanalysis or
elements map distribution.

FE-SEM/EDS

Punctual microanalysis or
elements map distribution.

THERMO-GRAVIMETRIC & THERMO-VOLUMIC ANALYSIS

TGA

With Nitrogen flux or oxidative atmosphere.
Range temperature [-90°C, 500°C].
Minimum mass sample to test 10 mg.

DSC

Qualitative/semi-quantitative identification
of components in oils and organic materials
subjected to tribological testing.

ATOMIC FORCE MICROSCOPY (AFM)

High-Resolution AFM analysis for topology and advanced 3D info at and sub-nanoscale.

X-RAY DIFFRACTION

X-RAY DIFFRACTION ON POWDER AND MASSIVE SAMPLES
X-RAY DIFFRACTION DATA ANALYSIS
QUANTITIVE DEFINITION OF THE CRYSTAL COMPOSITION (RIETVELD METHOD)
RESIDUAL STRESS DEFINITION

NANOVEA progetta e produce strumenti per il controllo dei materiali e della qualità. 

I nostri profilometri, tribometri e tester meccanici si trovano in rinomate organizzazioni educative e industriali di tutto il mondo.

Da oltre 25 anni, ricercatori e aziende che si occupano delle applicazioni più impegnative si affidano alla nostra impareggiabile gamma di servizi di consulenza e analisi dei materiali.

PROFILOMETRI

Tecnologia Chromatic Light per la massima precisione su qualsiasi superficie, qualsiasi materiale.

TESTER MECCANICI

La massima precisione e ripetibilità con il più basso costo di gestione.

TRIBOMETRI

Test di usura e attrito altamente accurati e ripetibili.