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AR Extended-Range Surface Profilometer with AFM – NANOVEA AFM Pro
NANOVEA AFM Pro is an atomic force microscope combining AFM precision with high-speed optical profilometry and video microscopy, enabling surface measurement from sub-nanometer to macro scale within a single platform.
COMPLETE RESEARCH TOOL
ATOMIC FORCE MICROSCOPE
HIGH SPEED OPTICAL PROFILER
VIDEO MICROSCOPE
ANGSTROM RANGE
AFM expands 3D capabilities into sub-nanometer range
down to a single angstrom, including laterally,
which is not attainable with any optical technique.
SUPREME PROFILOMETRY
Mediante la medición de la longitud de onda física directa vinculada a una altura específica,
Los perfiladores ópticos NANOVEA proporcionan una precisión inigualable en las mediciones de superficies en cualquier material.
High Speed sensors, available on the system, can do it up to 200 times faster.
No algorithms. No stitching. No wasted time.
SPACIOUS OPEN PLATFORM
200 x 150 mm X-Y stages and adjustable height clearance up to 150 mm make AFMPro ideal for a wide range of samples with varied geometries..
Libre de costura
ALTA CALIDAD CONTROL DE CALIDAD
QC options are available to automate all aspects of testing, including macro programs, pattern recognition, database communication and analysis recipes. The advanced software makes it easy to select zones on screen to be scanned automatically by an Optical Profiler or AFM.
