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AR SURFACE TOPOLOGY & CHEMICAL ANALYSIS SERVICES
* PROVIDED ONLY BY NANOVEA EUROPE
Gain a deeper understanding of your materials with NANOVEA’s expert Surface Topology and Chemical Analysis services. Our state-of-the-art equipment and techniques ensure accurate and reliable results every time in material characterization.
Whether you’re in the semiconductor, pharmaceutical, or any other industry, our team of experts can help you understand your materials’ properties using cutting-edge surface analysis techniques such as Infrared (IR) Spectroscopy, Chromatography, Electron Microscopy, Atomic Force Microscopy (AFM), and X-RAY Diffraction.
It is crucial to know the surface characteristics of your materials, which is why we offer a range of Surface Topology and Chemical Analysis services, including surface roughness analysis, surface modification, surface energy analysis, and much more.
If you’re looking for an experienced partner to help with your material characterization needs, contact us today to learn more about our Surface Topology and Chemical Analysis services. With our expertise in surface analysis techniques, you can trust NANOVEA for accurate and reliable results.
IR SPECTROSCOPY
IR SPECTRA ACQUISITION OF KNOWN MATERIALS
Analysis performed on sample and standard with FTIR-ATR method without pre-treatment.
Functional groups definition.
IR SPECTRA ACQUISITION OF UNKNOWN MATERIALS
Analysis performed with FTIR-ATR method without pre-treatment.
Functional groups definition.
CHROMATOGRAPHY
GC-MS
Qualitative/semi-quantitative identification of
components in oils and organic materials
subjected to tribological testing.
LC-MS
Qualitative/semi-quantitative identification of components in oils and organic materials
subjected to tribological testing.
ELECTRON MICROSCOPY
TEM
Punctual microanalysis or
elements map distribution.
FE-SEM/EDS
Punctual microanalysis or
elements map distribution.
THERMO-GRAVIMETRIC & THERMO-VOLUMIC ANALYSIS
TGA
With Nitrogen flux or oxidative atmosphere.
Range temperature [-90°C, 500°C].
Minimum mass sample to test 10 mg.
DSC
Qualitative/semi-quantitative identification
of components in oils and organic materials
subjected to tribological testing.
ATOMIC FORCE MICROSCOPY (AFM)
High-Resolution AFM analysis for topology and advanced 3D info at and sub-nanoscale.
X-RAY DIFFRACTION
X-RAY DIFFRACTION ON POWDER AND MASSIVE SAMPLES
X-RAY DIFFRACTION DATA ANALYSIS
QUANTITIVE DEFINITION OF THE CRYSTAL COMPOSITION (RIETVELD METHOD)
RESIDUAL STRESS DEFINITION
NANOVEA diseña y fabrica instrumentos para ensayos de materiales y control de calidad.
Nuestros perfilómetros, tribómetros y comprobadores mecánicos se encuentran en renombradas organizaciones educativas e industriales de todo el mundo.
Desde hace más de 25 años, investigadores y empresas que se ocupan de las aplicaciones más exigentes confían en nuestra incomparable gama de servicios de consultoría y ensayos de materiales.
PROFILÓMETROS
Tecnología de luz cromática para la máxima precisión en cualquier superficie y material.
COMPROBADORES MECÁNICOS
La mayor precisión y repetibilidad con el menor coste de propiedad.
TRIBÓMETROS
Pruebas de desgaste y fricción altamente precisas y repetibles.
