{"id":1052,"date":"2013-09-05T16:28:05","date_gmt":"2013-09-05T16:28:05","guid":{"rendered":"http:\/\/nanovea.com\/?p=1052"},"modified":"2019-07-31T14:45:04","modified_gmt":"2019-07-31T14:45:04","slug":"%e4%bd%bf%e7%94%a8-3d-%e8%bd%ae%e5%bb%93%e6%b5%8b%e9%87%8f%e6%b3%95%e8%bf%9b%e8%a1%8c%e6%99%b6%e5%9c%86%e9%98%b5%e5%88%97%e5%b9%b3%e6%95%b4%e5%ba%a6%e6%b5%8b%e9%87%8f","status":"publish","type":"post","link":"https:\/\/nanovea.com\/zh\/wafer-array-flatness-measurement-using-3d-profilometry\/","title":{"rendered":"\u4f7f\u7528\u4e09\u7ef4\u8f6e\u5ed3\u6d4b\u91cf\u6cd5\u6d4b\u91cf\u6676\u5706\u7684\u5e73\u9762\u5ea6"},"content":{"rendered":"<p>\u5728\u6b64\u5e94\u7528\u4e2d\uff0cNanovea ST400 <a title=\"\u8f6e\u5ed3\u4eea\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\" rel=\"noopener noreferrer\">\u8f6e\u5ed3\u4eea<\/a> \u662f\u7528\u6765\u6d4b\u91cf\u6676\u5706\u9635\u5217\u7684\u622a\u9762\u7684\u3002\u6d4b\u91cf\u7684\u9762\u79ef\u662f\u968f\u673a\u9009\u62e9\u7684\uff0c\u5e76\u5047\u5b9a\u5176\u8db3\u591f\u5927\uff0c\u4ee5\u4fbf\u53ef\u4ee5\u63a8\u65ad\u51fa\u66f4\u5927\u7684\u8868\u9762\u7684\u5047\u8bbe\u3002\u8868\u9762 <a title=\"\u5e73\u9762\u5ea6\u6d4b\u91cf\" href=\"https:\/\/nanovea.com\/surface-flatness-measurement\" target=\"_blank\" rel=\"noopener noreferrer\">\u5e73\u9762\u5ea6\u6d4b\u91cf<\/a>\u5256\u6790\u8868\u9762\u65f6\uff0c\u4f7f\u7528\u4e86\u5e73\u9762\u6027\u548c\u5176\u4ed6\u8868\u9762\u53c2\u6570\u3002<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/wafer-array-flatness.pdf\"><br \/>\n\u4f7f\u7528\u4e09\u7ef4\u8f6e\u5ed3\u6d4b\u91cf\u6cd5\u6d4b\u91cf\u6676\u5706\u7684\u5e73\u9762\u5ea6<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application the Nanovea ST400 Profilometer is used to measure the section of a wafer array. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a much larger surface. Surface flatness measurement, planarity &amp; other surface parameters are used to analyze the [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1053,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[153],"class_list":["post-1052","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts\/1052","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/comments?post=1052"}],"version-history":[{"count":4,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts\/1052\/revisions"}],"predecessor-version":[{"id":6629,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts\/1052\/revisions\/6629"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/media\/1053"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/media?parent=1052"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/categories?post=1052"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/tags?post=1052"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}