{"id":1008,"date":"2013-12-04T15:18:15","date_gmt":"2013-12-04T15:18:15","guid":{"rendered":"http:\/\/nanovea.com\/?p=1008"},"modified":"2019-07-31T14:58:18","modified_gmt":"2019-07-31T14:58:18","slug":"%e4%bd%bf%e7%94%a8-3d-%e8%bd%ae%e5%bb%93%e6%b5%8b%e9%87%8f%e6%b3%95%e6%b5%8b%e9%87%8f%e9%80%8f%e6%98%8e%e5%9f%ba%e6%9d%90%e4%b8%8a%e7%9a%84%e9%80%8f%e6%98%8e%e8%96%84%e8%86%9c","status":"publish","type":"post","link":"https:\/\/nanovea.com\/zh\/transparent-film-on-transparent-substrate-measurement-using-3d-profilometry\/","title":{"rendered":"\u900f\u660e\u57fa\u6750\u4e0a\u7684\u900f\u660e\u8584\u819c\u6d4b\u91cf"},"content":{"rendered":"<p>Nanovea PS50\u8f6e\u5ed3\u4eea\u7528\u4e8e\u6d4b\u91cf\u900f\u660e\u73bb\u7483\u57fa\u5e95\u4e0a\u900f\u660e\u8584\u819c\u7684\u7c97\u7cd9\u5ea6\u3001\u9636\u68af\u9ad8\u5ea6\u539a\u5ea6\u548c\u5149\u5b66\u539a\u5ea6\u3002\u9636\u68af\u9ad8\u5ea6\u5c06\u901a\u8fc7\u6d4b\u91cf\u8584\u819c\u7684\u4e00\u4e2a\u533a\u57df\u548c\u57fa\u6750\u66b4\u9732\u7684\u4e00\u4e2a\u533a\u57df\u7684\u76f8\u5bf9\u9ad8\u5ea6\u5dee\u6765\u83b7\u5f97\uff0c\u800c\u5149\u5b66\u539a\u5ea6\u5c06\u901a\u8fc7\u4f7f\u7528 <a title=\"\u8f6e\u5ed3\u4eea\" href=\"https:\/\/nanovea\/profilometers\" target=\"_blank\" rel=\"noopener noreferrer\">\u5256\u9762\u56fe<\/a>\u6709\u80fd\u529b\u901a\u8fc7\u900f\u660e\u8584\u819c\u8fdb\u884c\u6d4b\u91cf\uff0c\u5e76\u540c\u65f6\u68c0\u6d4b\u6765\u81ea\u8584\u819c\u9876\u9762\u548c\u57fa\u6750\u7684\u53cd\u5c04\u3002<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/transparent-film-measurement.pdf\">\u4f7f\u7528\u4e09\u7ef4\u8f6e\u5ed3\u6d4b\u91cf\u6cd5\u6d4b\u91cf\u900f\u660e\u57fa\u6750\u4e0a\u7684\u900f\u660e\u8584\u819c<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>The Nanovea PS50 Profilometer is used for roughness measurement, step height thickness and optical thickness of a thin transparent film on a transparent glass substrate. Step height will be obtained by measuring an area of the film and an area where the substrate is exposed for relative height difference, while optical thickness will be measured [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1009,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,352],"tags":[],"class_list":["post-1008","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-step-height-thickness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts\/1008","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/comments?post=1008"}],"version-history":[{"count":4,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts\/1008\/revisions"}],"predecessor-version":[{"id":6639,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/posts\/1008\/revisions\/6639"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/media\/1009"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/media?parent=1008"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/categories?post=1008"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/zh\/wp-json\/wp\/v2\/tags?post=1008"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}