石英晶体微天平档案 https://nanovea.com/zh/标签/石英晶体微天平/ 用于材料研究和质量控制的计量仪器 Wed, 21 Oct 2015 17:37:44 +0000 zh-Hans 每小时 1 https://wordpress.org/?v=6.8.5 https://nanovea.com/wp-content/uploads/2025/02/nanovea-favicon.png 石英晶体微天平档案 https://nanovea.com/zh/标签/石英晶体微天平/ 32 32 石英晶体微天平的表面处理 https://nanovea.com/zh/%e7%9f%b3%e8%8b%b1%e6%99%b6%e4%bd%93%e5%be%ae%e5%a4%a9%e5%b9%b3%e7%9a%84%e8%a1%a8%e9%9d%a2%e5%85%89%e6%b4%81%e5%ba%a6/?utm_source=rss&utm_medium=rss&utm_campaign=surface-finish-of-quartz-crystal-microbalance https://nanovea.com/zh/%e7%9f%b3%e8%8b%b1%e6%99%b6%e4%bd%93%e5%be%ae%e5%a4%a9%e5%b9%b3%e7%9a%84%e8%a1%a8%e9%9d%a2%e5%85%89%e6%b4%81%e5%ba%a6/#respond Tue, 22 Sep 2015 17:04:28 +0000 http://nanovea.com/?p=1993 Reliable quality control heavily relies upon accurate, quantifiable and reproducible surface inspection. Flatness & finish of the Quartz Crystal Microbalance (QCM) surface are vital to its accuracy and both measurements in 3D guarantees proper manufacture processing and control measures. Unlike a touch probe technique, the Nanovea Profilometer performs a 3D non-contact surface measurement of the […]

The post Surface Finish of Quartz Crystal Microbalance appeared first on NANOVEA: Advanced Profilometers, Tribometers, Nanoindenters, and Scratch Testers for Materials Testing.

]]> 可靠的质量控制在很大程度上依赖于准确、可量化和可重复的表面检测。石英晶体微天平（QCM）表面的平整度和光洁度对其准确性至关重要，这两种三维测量保证了适当的制造加工和控制措施。与触摸式探针技术不同，Nanovea 轮廓仪 对样品进行三维非接触表面测量。这消除了在QCM表面产生微细划痕的风险，这些划痕可能导致质量测量的不准确或误差。

表面处理石英晶体微天平

The post Surface Finish of Quartz Crystal Microbalance appeared first on NANOVEA: Advanced Profilometers, Tribometers, Nanoindenters, and Scratch Testers for Materials Testing.

]]> https://nanovea.com/zh/%e7%9f%b3%e8%8b%b1%e6%99%b6%e4%bd%93%e5%be%ae%e5%a4%a9%e5%b9%b3%e7%9a%84%e8%a1%a8%e9%9d%a2%e5%85%89%e6%b4%81%e5%ba%a6/feed/ 0