{"id":8355,"date":"2020-05-11T05:32:46","date_gmt":"2020-05-11T05:32:46","guid":{"rendered":"https:\/\/nanovea.com\/?p=8355"},"modified":"2026-01-15T18:46:56","modified_gmt":"2026-01-15T18:46:56","slug":"inline-roughness-inspection","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/inline-roughness-inspection\/","title":{"rendered":"Hat \u0130\u00e7i P\u00fcr\u00fczl\u00fcl\u00fck Denetimi"},"content":{"rendered":"
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In-Line Profilleyicilerle An\u0131nda Hata Tespiti<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc ve dokusu bir \u00fcr\u00fcn\u00fcn son kullan\u0131m\u0131 i\u00e7in hayati \u00f6nem ta\u015f\u0131r. \u00dcr\u00fcn y\u00fczeyinin h\u0131zl\u0131, \u00f6l\u00e7\u00fclebilir ve g\u00fcvenilir hat i\u00e7i denetimi, kusurlu \u00fcr\u00fcnlerin an\u0131nda tespit edilmesini ve b\u00f6ylece i\u015fin belirlenmesini sa\u011flar
\u00fcretim hatt\u0131n\u0131n ko\u015fullar\u0131. Sadece \u00fcretkenli\u011fi ve verimlili\u011fi art\u0131rmakla kalmaz, ayn\u0131 zamanda kusur oranlar\u0131n\u0131 da azalt\u0131r,
yeniden \u00e7al\u0131\u015fma ve israf.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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HAT I\u0307\u00c7I\u0307 P\u00dcR\u00dcZL\u00dcL\u00dcK DENETI\u0307MI\u0307 I\u0307\u00c7I\u0307N TEMASSIZ PROFI\u0307LLEYI\u0307CI\u0307NI\u0307N \u00d6NEMI\u0307<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Y\u00fczey kusurlar\u0131 malzeme i\u015fleme ve \u00fcr\u00fcn imalat\u0131ndan kaynaklan\u0131r. Hat i\u00e7i y\u00fczey kalite kontrol\u00fc, son \u00fcr\u00fcnlerin en s\u0131k\u0131 kalite kontrol\u00fcn\u00fc sa\u011flar. Nanovea 3D Temass\u0131z Profilometreler<\/a> Bir numunenin p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc temass\u0131z olarak belirlemek i\u00e7in benzersiz bir yetene\u011fe sahip kromatik e\u015f odakl\u0131 teknolojiyi kullan\u0131r. \u00dcr\u00fcn\u00fcn farkl\u0131 alanlar\u0131n\u0131n p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc ve dokusunu ayn\u0131 anda izlemek i\u00e7in birden fazla profil olu\u015fturucu sens\u00f6r kurulabilir. Analiz yaz\u0131l\u0131m\u0131 taraf\u0131ndan ger\u00e7ek zamanl\u0131 olarak hesaplanan p\u00fcr\u00fczl\u00fcl\u00fck e\u015fi\u011fi, h\u0131zl\u0131 ve g\u00fcvenilir bir ba\u015far\u0131l\u0131\/ba\u015far\u0131s\u0131z arac\u0131 olarak hizmet eder.<\/p>

\u00d6L\u00c7\u00dcM HEDEFI<\/em>
<\/i><\/u><\/strong><\/p>

Bu \u00e7al\u0131\u015fmada, akrilik ve z\u0131mpara ka\u011f\u0131d\u0131 numunelerinin y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc incelemek i\u00e7in bir nokta sens\u00f6r\u00fc ile donat\u0131lm\u0131\u015f Nanovea p\u00fcr\u00fczl\u00fcl\u00fck inceleme konvey\u00f6r sistemi kullan\u0131lm\u0131\u015ft\u0131r. Nanovea temass\u0131z profilometrenin bir \u00fcretim hatt\u0131nda ger\u00e7ek zamanl\u0131 olarak h\u0131zl\u0131 ve g\u00fcvenilir hat i\u00e7i p\u00fcr\u00fczl\u00fcl\u00fck denetimi sa\u011flama kapasitesini sergiliyoruz.<\/p>

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SONU\u00c7LAR VE TARTI\u015eMA<\/em>
<\/i><\/u><\/strong><\/p>

Konvey\u00f6r profilometre sistemi Tetikleme Modu ve S\u00fcrekli Mod olmak \u00fczere iki modda \u00e7al\u0131\u015fabilir. \u015eekil 2'de g\u00f6sterildi\u011fi gibi, numunelerin y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc Tetikleme Modu alt\u0131nda optik profilleyici ba\u015fl\u0131klar\u0131n\u0131n alt\u0131ndan ge\u00e7erken \u00f6l\u00e7\u00fcl\u00fcr. Buna kar\u015f\u0131l\u0131k, S\u00fcrekli Mod, metal levha ve kuma\u015f gibi s\u00fcrekli numune \u00fczerindeki y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fcn kesintisiz olarak \u00f6l\u00e7\u00fclmesini sa\u011flar. Farkl\u0131 numune alanlar\u0131n\u0131n p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc izlemek ve kaydetmek i\u00e7in birden fazla optik profilleyici sens\u00f6r\u00fc tak\u0131labilir. <\/span><\/p>

\u00a0<\/span><\/p>

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Ger\u00e7ek zamanl\u0131 p\u00fcr\u00fczl\u00fcl\u00fck denetimi \u00f6l\u00e7\u00fcm\u00fc s\u0131ras\u0131nda, \u015eekil 4 ve \u015eekil 5'te g\u00f6sterildi\u011fi gibi yaz\u0131l\u0131m pencerelerinde ba\u015far\u0131l\u0131 ve ba\u015far\u0131s\u0131z uyar\u0131lar\u0131 g\u00f6r\u00fcnt\u00fclenir. P\u00fcr\u00fczl\u00fcl\u00fck de\u011feri verilen e\u015fikler dahilinde oldu\u011funda, \u00f6l\u00e7\u00fclen p\u00fcr\u00fczl\u00fcl\u00fck ye\u015fil renkte vurgulan\u0131r. Bununla birlikte, \u00f6l\u00e7\u00fclen y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc ayarlanan e\u015fik de\u011ferlerinin aral\u0131\u011f\u0131n\u0131n d\u0131\u015f\u0131nda oldu\u011funda vurgu k\u0131rm\u0131z\u0131ya d\u00f6ner. Bu, kullan\u0131c\u0131ya bir \u00fcr\u00fcn\u00fcn y\u00fczey kalitesinin belirlenmesi i\u00e7in bir ara\u00e7 sa\u011flar.<\/p>

A\u015fa\u011f\u0131daki b\u00f6l\u00fcmlerde, Denetim sisteminin Tetikleme ve S\u00fcrekli Modlar\u0131n\u0131 g\u00f6stermek i\u00e7in Akrilik ve Z\u0131mpara Ka\u011f\u0131d\u0131 gibi iki t\u00fcr numune kullan\u0131lmaktad\u0131r.<\/p>

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Tetikleme Modu: Akrilik Numunenin y\u00fczey incelemesi<\/p>

Bir dizi Akrilik numune ta\u015f\u0131y\u0131c\u0131 bant \u00fczerinde hizalan\u0131r ve \u015eekil 1'de g\u00f6sterildi\u011fi gibi optik profilleyici kafas\u0131n\u0131n alt\u0131nda hareket eder. \u015eekil 6'daki yanl\u0131\u015f renk g\u00f6r\u00fcn\u00fcm\u00fc y\u00fczey y\u00fcksekli\u011finin de\u011fi\u015fimini g\u00f6stermektedir. Ayna benzeri bitmi\u015f Akrilik numunelerin baz\u0131lar\u0131, \u015eekil 6b'de g\u00f6sterildi\u011fi gibi p\u00fcr\u00fczl\u00fc bir y\u00fczey dokusu olu\u015fturmak i\u00e7in z\u0131mparalanm\u0131\u015ft\u0131r.<\/p>

Akrilik numuneler optik profilleyici ba\u015fl\u0131\u011f\u0131 alt\u0131nda sabit bir h\u0131zda hareket ederken, y\u00fczey profili \u015eekil 7 ve \u015eekil 8'de g\u00f6sterildi\u011fi gibi \u00f6l\u00e7\u00fcl\u00fcr. \u00d6l\u00e7\u00fclen profilin p\u00fcr\u00fczl\u00fcl\u00fck de\u011feri ayn\u0131 anda hesaplan\u0131r ve e\u015fik de\u011ferlerle kar\u015f\u0131la\u015ft\u0131r\u0131l\u0131r. P\u00fcr\u00fczl\u00fcl\u00fck de\u011feri ayarlanan e\u015fik de\u011ferin \u00fczerinde oldu\u011funda k\u0131rm\u0131z\u0131 ar\u0131za uyar\u0131s\u0131 ba\u015flat\u0131l\u0131r ve kullan\u0131c\u0131lar\u0131n \u00fcretim hatt\u0131ndaki kusurlu \u00fcr\u00fcn\u00fc hemen tespit etmesine ve bulmas\u0131na olanak tan\u0131r.<\/p>

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S\u00fcrekli Mod: Z\u0131mpara ka\u011f\u0131d\u0131 numunesinin Y\u00fczey Kontrol\u00fc<\/p>

\u015eekil 9'da g\u00f6sterildi\u011fi gibi z\u0131mpara ka\u011f\u0131d\u0131 numunesi y\u00fczeyinin Y\u00fczey Y\u00fckseklik Haritas\u0131, P\u00fcr\u00fczl\u00fcl\u00fck Da\u011f\u0131l\u0131m Haritas\u0131 ve Ge\u00e7ti \/ Kald\u0131 P\u00fcr\u00fczl\u00fcl\u00fck E\u015fik Haritas\u0131. Z\u0131mpara ka\u011f\u0131d\u0131 numunesi, y\u00fczey y\u00fcksekli\u011fi haritas\u0131nda g\u00f6sterildi\u011fi gibi kullan\u0131lan k\u0131s\u0131mda birka\u00e7 y\u00fcksek tepeye sahiptir. \u015eekil 9C'nin paletindeki farkl\u0131 renkler yerel y\u00fczeyin p\u00fcr\u00fczl\u00fcl\u00fck de\u011ferini temsil etmektedir. P\u00fcr\u00fczl\u00fcl\u00fck Haritas\u0131, z\u0131mpara ka\u011f\u0131d\u0131 \u00f6rne\u011finin sa\u011flam alan\u0131nda homojen bir p\u00fcr\u00fczl\u00fcl\u00fck sergilerken, kullan\u0131lan alan koyu mavi renkle vurgulanarak bu b\u00f6lgedeki p\u00fcr\u00fczl\u00fcl\u00fck de\u011ferinin azald\u0131\u011f\u0131n\u0131 g\u00f6sterir. \u015eekil 9D'de g\u00f6sterildi\u011fi gibi bu t\u00fcr b\u00f6lgelerin yerini belirlemek i\u00e7in bir Ge\u00e7ti\/Kald\u0131 p\u00fcr\u00fczl\u00fcl\u00fck e\u015fi\u011fi ayarlanabilir.<\/p>

Z\u0131mpara ka\u011f\u0131d\u0131 s\u00fcrekli olarak in-line profilleyici sens\u00f6r\u00fcn\u00fcn alt\u0131ndan ge\u00e7erken, ger\u00e7ek zamanl\u0131 yerel p\u00fcr\u00fczl\u00fcl\u00fck de\u011feri hesaplan\u0131r ve \u015eekil 10'da g\u00f6sterildi\u011fi gibi kaydedilir. Ba\u015far\u0131l\u0131\/ba\u015far\u0131s\u0131z uyar\u0131lar\u0131, ayarlanan p\u00fcr\u00fczl\u00fcl\u00fck e\u015fik de\u011ferlerine g\u00f6re yaz\u0131l\u0131m ekran\u0131nda g\u00f6r\u00fcnt\u00fclenir ve kalite kontrol i\u00e7in h\u0131zl\u0131 ve g\u00fcvenilir bir ara\u00e7 olarak hizmet eder. \u00dcretim hatt\u0131ndaki \u00fcr\u00fcn y\u00fczey kalitesi, kusurlu alanlar\u0131 zaman\u0131nda ke\u015ffetmek i\u00e7in yerinde denetlenir.<\/p>

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SONU\u00c7<\/em>
<\/i><\/u><\/strong><\/p>

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Bu uygulamada, optik temass\u0131z profilleyici sens\u00f6r ile donat\u0131lm\u0131\u015f Nanovea Konvey\u00f6r Profilometresinin etkili ve verimli bir \u015fekilde g\u00fcvenilir bir hat i\u00e7i kalite kontrol arac\u0131 olarak \u00e7al\u0131\u015ft\u0131\u011f\u0131n\u0131 g\u00f6sterdik.<\/p>

Denetim sistemi, \u00fcr\u00fcnlerin y\u00fczey kalitesini yerinde izlemek i\u00e7in \u00fcretim hatt\u0131na kurulabilir. P\u00fcr\u00fczl\u00fcl\u00fck e\u015fi\u011fi, \u00fcr\u00fcnlerin y\u00fczey kalitesini belirlemek i\u00e7in g\u00fcvenilir bir kriter olarak \u00e7al\u0131\u015f\u0131r ve kullan\u0131c\u0131lar\u0131n kusurlu \u00fcr\u00fcnleri zaman\u0131nda fark etmelerini sa\u011flar. Tetikleme Modu ve S\u00fcrekli Mod olmak \u00fczere iki denetim modu, farkl\u0131 \u00fcr\u00fcn t\u00fcrleri \u00fczerindeki denetim gereksinimlerini kar\u015f\u0131lamak i\u00e7in sa\u011flanm\u0131\u015ft\u0131r.<\/p>

Burada g\u00f6sterilen veriler, analiz yaz\u0131l\u0131m\u0131nda bulunan hesaplamalar\u0131n yaln\u0131zca bir k\u0131sm\u0131n\u0131 temsil etmektedir. Nanovea Profilometreler, Yar\u0131 \u0130letken, Mikroelektronik, Solar, Fiber, Optik, Otomotiv, Havac\u0131l\u0131k ve Uzay, Metalurji, \u0130\u015fleme, Kaplama, \u0130la\u00e7, Biyomedikal, \u00c7evre ve di\u011fer bir\u00e7ok alanda neredeyse her y\u00fczeyi \u00f6l\u00e7er.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u015eIMDI, BA\u015eVURUNUZ HAKKINDA KONU\u015eALIM<\/b><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tCANLI SOHBET<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

Instant Error Detection With In-Line Profilers Surface roughness and texture is vital to the end-use of a product. Fast, quanti\u001fable, and reliable inline inspection of the product surface ensures detecting the defective products immediately so as to determine the workconditions of the production line. It not only improves productivity and e\u001dciency, but also reduces defect […]<\/p>","protected":false},"author":1,"featured_media":11722,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,354,351,353,335],"tags":[],"class_list":["post-8355","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-flatness-warpage","category-profilometry-roughness-finish","category-profilometry-texture-grain","category-profilometry-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/8355","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=8355"}],"version-history":[{"count":37,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/8355\/revisions"}],"predecessor-version":[{"id":25749,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/8355\/revisions\/25749"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/11722"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=8355"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=8355"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=8355"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}