{"id":8148,"date":"2020-04-08T15:27:56","date_gmt":"2020-04-08T15:27:56","guid":{"rendered":"https:\/\/nanovea.com\/?p=8148"},"modified":"2025-05-22T20:55:14","modified_gmt":"2025-05-22T20:55:14","slug":"yuzey-islemi%cc%87-gormus-bakir-teli%cc%87n-asinmasi-ve-ci%cc%87zi%cc%87lmesi%cc%87ni%cc%87n-degerlendi%cc%87ri%cc%87lmesi%cc%87","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/yuzey-islemi%cc%87-gormus-bakir-teli%cc%87n-asinmasi-ve-ci%cc%87zi%cc%87lmesi%cc%87ni%cc%87n-degerlendi%cc%87ri%cc%87lmesi%cc%87\/","title":{"rendered":"Y\u00fczey \u0130\u015flemli Bak\u0131r Telin A\u015f\u0131nma ve \u00c7izilme De\u011ferlendirmesi"},"content":{"rendered":"
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Bak\u0131r Tellerde A\u015f\u0131nma ve \u00c7izilme De\u011ferlendirmesinin \u00d6nemi
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Bak\u0131r, elektrom\u0131knat\u0131s ve telgraf\u0131n icad\u0131ndan bu yana elektrik kablolar\u0131nda uzun bir kullan\u0131m ge\u00e7mi\u015fine sahiptir. Bak\u0131r teller, korozyon direnci, lehimlenebilirli\u011fi ve 150\u00b0C'ye kadar y\u00fcksek s\u0131cakl\u0131klardaki performans\u0131 sayesinde paneller, saya\u00e7lar, bilgisayarlar, i\u015f makineleri ve cihazlar gibi \u00e7ok \u00e7e\u015fitli elektronik ekipmanlarda kullan\u0131lmaktad\u0131r. \u00c7\u0131kar\u0131lan t\u00fcm bak\u0131r\u0131n yakla\u015f\u0131k yar\u0131s\u0131 elektrik teli ve kablo iletkenlerinin \u00fcretiminde kullan\u0131lmaktad\u0131r.<\/p>

Bak\u0131r tel y\u00fczey kalitesi, uygulama hizmet performans\u0131 ve kullan\u0131m \u00f6mr\u00fc a\u00e7\u0131s\u0131ndan kritik \u00f6neme sahiptir. Tellerdeki mikro kusurlar a\u015f\u0131r\u0131 a\u015f\u0131nmaya, \u00e7atlak olu\u015fumuna ve yay\u0131lmas\u0131na, iletkenli\u011fin azalmas\u0131na ve yetersiz lehimlenebilirli\u011fe yol a\u00e7abilir. Bak\u0131r tellerin uygun y\u00fczey i\u015flemi, tel \u00e7ekme s\u0131ras\u0131nda olu\u015fan y\u00fczey kusurlar\u0131n\u0131 gidererek korozyon, \u00e7izilme ve a\u015f\u0131nma direncini art\u0131r\u0131r. Bak\u0131r tellerin kullan\u0131ld\u0131\u011f\u0131 bir\u00e7ok havac\u0131l\u0131k ve uzay uygulamas\u0131, beklenmedik ekipman ar\u0131zalar\u0131n\u0131 \u00f6nlemek i\u00e7in kontroll\u00fc davran\u0131\u015f gerektirir. Bak\u0131r tel y\u00fczeyinin a\u015f\u0131nma ve \u00e7izilme direncini do\u011fru bir \u015fekilde de\u011ferlendirmek i\u00e7in \u00f6l\u00e7\u00fclebilir ve g\u00fcvenilir \u00f6l\u00e7\u00fcmlere ihtiya\u00e7 vard\u0131r.<\/p>

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\u00d6l\u00e7\u00fcm Hedefi<\/p>

Bu uygulamada, farkl\u0131 bak\u0131r tel y\u00fczey i\u015flemlerinin kontroll\u00fc bir a\u015f\u0131nma s\u00fcrecini sim\u00fcle ediyoruz. \u00c7izik testi<\/a> i\u015flenmi\u015f y\u00fczey katman\u0131nda ar\u0131zaya neden olmak i\u00e7in gereken y\u00fck\u00fc \u00f6l\u00e7er. Bu \u00e7al\u0131\u015fma Nanovea'y\u0131 tan\u0131t\u0131yor Tribometre <\/a>ve Mekanik Test Cihaz\u0131<\/a> elektrik kablolar\u0131n\u0131n de\u011ferlendirilmesi ve kalite kontrol\u00fc i\u00e7in ideal ara\u00e7lard\u0131r.<\/p>

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Test Prosed\u00fcr\u00fc ve Prosed\u00fcrler
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Bak\u0131r teller \u00fczerindeki iki farkl\u0131 y\u00fczey i\u015fleminin (Tel A ve Tel B) s\u00fcrt\u00fcnme katsay\u0131s\u0131 (COF) ve a\u015f\u0131nma direnci, do\u011frusal ileri geri hareket eden bir a\u015f\u0131nma mod\u00fcl\u00fc kullan\u0131larak Nanovea tribometre ile de\u011ferlendirildi. Bir Al\u2082O\u2083 topu (6 mm \u00e7ap\u0131nda) bu uygulamada kullan\u0131lan kar\u015f\u0131 malzemedir. A\u015f\u0131nma izi Nanovea kullan\u0131larak incelendi 3D temass\u0131z profilometre<\/a>. Test parametreleri Tablo 1'de \u00f6zetlenmi\u015ftir.<\/p>

Bu \u00e7al\u0131\u015fmada \u00f6rnek olarak kar\u015f\u0131 malzeme olarak p\u00fcr\u00fczs\u00fcz bir Al\u2082O\u2083 bilyesi kullan\u0131lm\u0131\u015ft\u0131r. Farkl\u0131 \u015fekil ve y\u00fczey kalitesine sahip herhangi bir kat\u0131 malzeme, ger\u00e7ek uygulama durumunu sim\u00fcle etmek i\u00e7in \u00f6zel bir fikst\u00fcr kullan\u0131larak uygulanabilir.<\/p>

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Nanovea'n\u0131n Rockwell C elmas u\u00e7 (100 \u03bcm yar\u0131\u00e7ap) ile donat\u0131lm\u0131\u015f mekanik test cihaz\u0131, mikro \u00e7izik modunu kullanarak kaplanm\u0131\u015f teller \u00fczerinde a\u015famal\u0131 y\u00fck \u00e7izik testleri ger\u00e7ekle\u015ftirdi. \u00c7izik testi parametreleri ve u\u00e7 geometrisi Tablo 2'de g\u00f6sterilmi\u015ftir.<\/div>
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Sonu\u00e7lar ve Tart\u0131\u015fma<\/i><\/u><\/p>

Bak\u0131r telin a\u015f\u0131nmas\u0131:<\/strong><\/p>

\u015eekil 2, a\u015f\u0131nma testleri s\u0131ras\u0131nda bak\u0131r tellerin COF geli\u015fimini g\u00f6stermektedir. A teli a\u015f\u0131nma testi boyunca ~0,4'l\u00fck sabit bir COF g\u00f6sterirken, B teli ilk 100 devirde ~0,35'lik bir COF sergilemekte ve kademeli olarak ~0,4'e y\u00fckselmektedir.<\/p>

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\u015eekil 3, testlerden sonra bak\u0131r tellerin a\u015f\u0131nma izlerini kar\u015f\u0131la\u015ft\u0131rmaktad\u0131r. Nanovea'n\u0131n 3D temass\u0131z profilometresi, a\u015f\u0131nma izlerinin ayr\u0131nt\u0131l\u0131 morfolojisinin \u00fcst\u00fcn analizini sundu. A\u015f\u0131nma mekanizmas\u0131n\u0131n temelden anla\u015f\u0131lmas\u0131n\u0131 sa\u011flayarak a\u015f\u0131nma izi hacminin do\u011frudan ve do\u011fru bir \u015fekilde belirlenmesine olanak tan\u0131r. Tel B'nin y\u00fczeyinde 600 devirlik bir a\u015f\u0131nma testinden sonra belirgin a\u015f\u0131nma izi hasar\u0131 var. Profilometrenin 3D g\u00f6r\u00fcnt\u00fcs\u00fc, a\u015f\u0131nma s\u00fcrecini \u00f6nemli \u00f6l\u00e7\u00fcde h\u0131zland\u0131ran Tel B'nin y\u00fczey i\u015flemli katman\u0131n\u0131n tamamen \u00e7\u0131kar\u0131ld\u0131\u011f\u0131n\u0131 g\u00f6stermektedir. Bu, bak\u0131r alt tabakan\u0131n a\u00e7\u0131kta kald\u0131\u011f\u0131 Tel B \u00fczerinde d\u00fczle\u015ftirilmi\u015f bir a\u015f\u0131nma izi b\u0131rakm\u0131\u015ft\u0131r. Bu durum, Tel B'nin kullan\u0131ld\u0131\u011f\u0131 elektrikli ekipmanlar\u0131n \u00f6mr\u00fcn\u00fcn \u00f6nemli \u00f6l\u00e7\u00fcde k\u0131salmas\u0131na neden olabilir. Buna kar\u015f\u0131l\u0131k, Tel A y\u00fczeyde s\u0131\u011f bir a\u015f\u0131nma izi ile g\u00f6sterilen nispeten hafif bir a\u015f\u0131nma sergilemektedir. A Teli \u00fczerindeki y\u00fczey i\u015flemli katman, ayn\u0131 ko\u015fullar alt\u0131nda B Teli \u00fczerindeki katman gibi kalkmam\u0131\u015ft\u0131r.<\/span><\/p>

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Bak\u0131r tel y\u00fczeyinin \u00e7izilme direnci:<\/strong><\/p>

\u015eekil 4, test sonras\u0131nda teller \u00fczerindeki \u00e7izik izlerini g\u00f6stermektedir. Tel A'n\u0131n koruyucu tabakas\u0131 \u00e7ok iyi \u00e7izilme direnci sergilemektedir. Buna kar\u015f\u0131l\u0131k, Tel B'nin koruyucu tabakas\u0131 ~1,0 N y\u00fckte ba\u015far\u0131s\u0131z olmu\u015ftur. Bu teller i\u00e7in \u00e7izilme direncindeki b\u00f6ylesine \u00f6nemli bir fark, Tel A'n\u0131n \u00f6nemli \u00f6l\u00e7\u00fcde geli\u015fmi\u015f a\u015f\u0131nma direncine sahip oldu\u011fu a\u015f\u0131nma performanslar\u0131na katk\u0131da bulunur. \u015eekil 5'te g\u00f6sterilen \u00e7izik testleri s\u0131ras\u0131nda normal kuvvet, COF ve derinli\u011fin geli\u015fimi, testler s\u0131ras\u0131nda kaplama ar\u0131zas\u0131 hakk\u0131nda daha fazla bilgi sa\u011flar.<\/p>

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Sonu\u00e7<\/p>

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Bu kontroll\u00fc \u00e7al\u0131\u015fmada, y\u00fczey i\u015flemi g\u00f6rm\u00fc\u015f bak\u0131r teller i\u00e7in a\u015f\u0131nma direncinin nicel de\u011ferlendirmesini yapan Nanovea'n\u0131n tribometresini ve bak\u0131r tel \u00e7izilme direncinin g\u00fcvenilir de\u011ferlendirmesini sa\u011flayan Nanovea'n\u0131n mekanik test cihaz\u0131n\u0131 sergiledik. Tel y\u00fczey i\u015flemi, tellerin kullan\u0131m \u00f6mr\u00fc boyunca tribo-mekanik \u00f6zelliklerinde kritik bir rol oynamaktad\u0131r. Tel A \u00fczerindeki uygun y\u00fczey i\u015flemi, zorlu ortamlardaki elektrik tellerinin performans\u0131 ve \u00f6mr\u00fc a\u00e7\u0131s\u0131ndan kritik \u00f6neme sahip olan a\u015f\u0131nma ve \u00e7izilme direncini \u00f6nemli \u00f6l\u00e7\u00fcde art\u0131rm\u0131\u015ft\u0131r.<\/p>

Nanovea'n\u0131n tribometresi, ISO ve ASTM uyumlu rotatif ve lineer modlar\u0131 kullanarak hassas ve tekrarlanabilir a\u015f\u0131nma ve s\u00fcrt\u00fcnme testleri sunar ve iste\u011fe ba\u011fl\u0131 y\u00fcksek s\u0131cakl\u0131kta a\u015f\u0131nma, ya\u011flama ve tribo-korozyon mod\u00fclleri \u00f6nceden entegre edilmi\u015f tek bir sistemde mevcuttur. Nanovea'n\u0131n e\u015fsiz \u00fcr\u00fcn yelpazesi, ince veya kal\u0131n, yumu\u015fak veya sert kaplamalar\u0131n, filmlerin ve alt tabakalar\u0131n t\u00fcm tribolojik \u00f6zelliklerini belirlemek i\u00e7in ideal bir \u00e7\u00f6z\u00fcmd\u00fcr.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":11689,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,372,337,350,353,335,345,346,336],"tags":[],"class_list":["post-8148","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-linear-tribology","category-mechanical-testing","category-profilometry-geometry-shape","category-profilometry-texture-grain","category-profilometry-testing","category-scratch-testing-adhesive-failure","category-scratch-testing-cohesive-failure","category-tribology-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/8148","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=8148"}],"version-history":[{"count":37,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/8148\/revisions"}],"predecessor-version":[{"id":24779,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/8148\/revisions\/24779"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/11689"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=8148"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=8148"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=8148"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}