{"id":7991,"date":"2020-03-11T14:06:56","date_gmt":"2020-03-11T14:06:56","guid":{"rendered":"https:\/\/nanovea.com\/?p=7991"},"modified":"2025-05-22T20:55:47","modified_gmt":"2025-05-22T20:55:47","slug":"celik-ve-aluminyumun-verimi-ve-cekme-dayanimi","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/yield-and-tensile-strength-of-steel-and-aluminum\/","title":{"rendered":"\u00c7elik ve Al\u00fcminyumun Akma ve \u00c7ekme Dayan\u0131m\u0131"},"content":{"rendered":"
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\u0130ndentasyon Kullan\u0131larak Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131 \u00d6l\u00e7\u00fcm\u00fcn\u00fcn \u00d6nemi<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Geleneksel olarak Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131, test numunelerini ay\u0131rmak i\u00e7in muazzam bir g\u00fc\u00e7 gerektiren b\u00fcy\u00fck bir \u00e7ekme test makinesi kullan\u0131larak test edilmi\u015ftir. Her numunenin yaln\u0131zca bir kez test edilebildi\u011fi bir malzeme i\u00e7in \u00e7ok say\u0131da test kuponunu uygun \u015fekilde i\u015flemek maliyetli ve zaman al\u0131c\u0131d\u0131r. Numunedeki k\u00fc\u00e7\u00fck kusurlar test sonu\u00e7lar\u0131nda g\u00f6zle g\u00f6r\u00fcl\u00fcr bir farkl\u0131l\u0131k yarat\u0131r. Piyasadaki \u00e7ekme test cihazlar\u0131n\u0131n farkl\u0131 konfig\u00fcrasyonlar\u0131 ve hizalamalar\u0131, genellikle test mekani\u011fi ve sonu\u00e7lar\u0131nda \u00f6nemli farkl\u0131l\u0131klara neden olur.<\/p>\n

Nanovea'n\u0131n yenilik\u00e7i indentasyon y\u00f6ntemi, geleneksel \u00e7ekme testleriyle \u00f6l\u00e7\u00fclen de\u011ferlerle kar\u015f\u0131la\u015ft\u0131r\u0131labilir Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131 de\u011ferlerini do\u011frudan sa\u011flar. Bu \u00f6l\u00e7\u00fcm, t\u00fcm end\u00fcstriler i\u00e7in yeni bir test olanaklar\u0131 alan\u0131 a\u00e7maktad\u0131r. Basit deneysel kurulum, \u00e7ekme testleri i\u00e7in gereken karma\u015f\u0131k kupon \u015fekline k\u0131yasla numune haz\u0131rlama s\u00fcresini ve maliyetini \u00f6nemli \u00f6l\u00e7\u00fcde azalt\u0131r. K\u00fc\u00e7\u00fck bir girinti boyutu ile tek bir numune \u00fczerinde \u00e7oklu \u00f6l\u00e7\u00fcmler m\u00fcmk\u00fcnd\u00fcr. Numune i\u015fleme s\u0131ras\u0131nda olu\u015fturulan \u00e7ekme testi kuponlar\u0131nda g\u00f6r\u00fclen kusurlar\u0131n etkisini \u00f6nler. Lokalize alanda k\u00fc\u00e7\u00fck numuneler \u00fczerinde YS ve UTS \u00f6l\u00e7\u00fcmleri, boru hatlar\u0131nda veya oto yap\u0131lar\u0131nda haritalama ve lokal kusur tespitine olanak sa\u011flar.<\/div>\n
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\u00d6l\u00e7\u00fcm Hedefi<\/p>\n

Bu uygulamada, Nanovea Mekanik Test Cihaz\u0131<\/a> paslanmaz \u00e7elik SS304 ve al\u00fcminyum Al6061 metal ala\u015f\u0131m numunelerinin Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131'n\u0131 \u00f6l\u00e7er. Numuneler, Nanovea'n\u0131n girintileme y\u00f6ntemlerinin g\u00fcvenilirli\u011fini g\u00f6steren, yayg\u0131n olarak tan\u0131nan Akma Dayan\u0131m\u0131 ve Nihai Gerilme Dayan\u0131m\u0131 de\u011ferlerine g\u00f6re se\u00e7ilmi\u015ftir.<\/p>\n

\"\"<\/a><\/div>\n

Test Prosed\u00fcr\u00fc ve Prosed\u00fcrler
<\/i><\/u><\/strong><\/p>\n

Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131 testleri Nanovea Mekanik Test Cihaz\u0131nda Mikroindentasyon<\/a> modu kullan\u0131lm\u0131\u015ft\u0131r. Bu uygulama i\u00e7in 200 \u03bcm \u00e7ap\u0131nda silindirik d\u00fcz bir elmas u\u00e7 kullan\u0131lm\u0131\u015ft\u0131r. SS304 ve Al6061 ala\u015f\u0131mlar\u0131, indentasyon y\u00f6nteminin b\u00fcy\u00fck potansiyelini ve g\u00fcvenilirli\u011fini g\u00f6stermek amac\u0131yla, geni\u015f end\u00fcstriyel uygulamalar\u0131 ve yayg\u0131n olarak bilinen Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131 de\u011ferleri nedeniyle se\u00e7ilmi\u015ftir. Y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc veya kusurlar\u0131n test sonu\u00e7lar\u0131n\u0131 etkilemesini \u00f6nlemek i\u00e7in numuneler testten \u00f6nce mekanik olarak ayna gibi parlat\u0131lm\u0131\u015ft\u0131r. Test ko\u015fullar\u0131 Tablo 1'de listelenmi\u015ftir. Test de\u011ferlerinin tekrarlanabilirli\u011fini sa\u011flamak i\u00e7in her numune \u00fczerinde ondan fazla test ger\u00e7ekle\u015ftirilmi\u015ftir.<\/p>\n

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Sonu\u00e7lar ve Tart\u0131\u015fma<\/i><\/u><\/p>\n

SS304 ve Al6061 ala\u015f\u0131m numunelerinin y\u00fck-deplasman e\u011frileri, test numuneleri \u00fczerindeki d\u00fcz indenter izleriyle birlikte \u015eekil 3'te g\u00f6sterilmi\u015ftir. Nanovea taraf\u0131ndan geli\u015ftirilen \u00f6zel algoritmalar kullan\u0131larak \"S\" \u015feklindeki y\u00fckleme e\u011frisinin analizi Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131n\u0131 hesaplar. De\u011ferler, Tablo 1'de \u00f6zetlendi\u011fi gibi yaz\u0131l\u0131m taraf\u0131ndan otomatik olarak hesaplan\u0131r. Geleneksel \u00e7ekme testleri ile elde edilen Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131 de\u011ferleri kar\u015f\u0131la\u015ft\u0131rma i\u00e7in listelenmi\u015ftir.<\/span><\/p>\n

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Sonu\u00e7<\/p>\n

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Bu \u00e7al\u0131\u015fmada, Nanovea Mekanik Test Cihaz\u0131n\u0131n paslanmaz \u00e7elik ve al\u00fcminyum ala\u015f\u0131ml\u0131 levha numunelerinin Akma Dayan\u0131m\u0131 ve Nihai \u00c7ekme Dayan\u0131m\u0131n\u0131n de\u011ferlendirilmesindeki kapasitesini sergiledik. Basit deney kurulumu, \u00e7ekme testleri i\u00e7in gereken numune haz\u0131rlama s\u00fcresini ve maliyetini \u00f6nemli \u00f6l\u00e7\u00fcde azalt\u0131r. K\u00fc\u00e7\u00fck girinti boyutu, tek bir numune \u00fczerinde birden fazla \u00f6l\u00e7\u00fcm yap\u0131lmas\u0131n\u0131 m\u00fcmk\u00fcn k\u0131lar. Bu y\u00f6ntem, k\u00fc\u00e7\u00fck numuneler ve yerelle\u015ftirilmi\u015f alanlar \u00fczerinde YS\/UTS \u00f6l\u00e7\u00fcmlerine izin vererek, YS\/UTS haritalamas\u0131 ve boru hatlar\u0131 veya oto yap\u0131daki yerel kusur tespiti i\u00e7in bir \u00e7\u00f6z\u00fcm sa\u011flar.<\/p>\n

Nanovea Mekanik Test Cihaz\u0131n\u0131n Nano, Mikro veya Makro mod\u00fcllerinin t\u00fcm\u00fc ISO ve ASTM uyumlu girinti, \u00e7izilme ve a\u015f\u0131nma test cihaz\u0131 modlar\u0131n\u0131 i\u00e7erir ve tek bir sistemde mevcut en geni\u015f ve en kullan\u0131c\u0131 dostu test aral\u0131\u011f\u0131n\u0131 sa\u011flar. Nanovea'n\u0131n e\u015fsiz \u00fcr\u00fcn yelpazesi, ince veya kal\u0131n, yumu\u015fak veya sert kaplamalar\u0131n, filmlerin ve alt katmanlar\u0131n sertlik, Young mod\u00fcl\u00fc, k\u0131r\u0131lma toklu\u011fu, yap\u0131\u015fma, a\u015f\u0131nma direnci ve di\u011ferleri dahil olmak \u00fczere t\u00fcm mekanik \u00f6zelliklerini belirlemek i\u00e7in ideal bir \u00e7\u00f6z\u00fcmd\u00fcr. Ayr\u0131ca, p\u00fcr\u00fczl\u00fcl\u00fck gibi di\u011fer y\u00fczey \u00f6l\u00e7\u00fcmlerine ek olarak girinti, \u00e7izik ve a\u015f\u0131nma izinin y\u00fcksek \u00e7\u00f6z\u00fcn\u00fcrl\u00fckl\u00fc 3D g\u00f6r\u00fcnt\u00fclenmesi i\u00e7in iste\u011fe ba\u011fl\u0131 3D temass\u0131z profil olu\u015fturucu ve AFM Mod\u00fcl\u00fc mevcuttur.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":11691,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,344,349,337],"tags":[],"class_list":["post-7991","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-indentation-yield-strength-fatigue","category-laboratory-testing","category-mechanical-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/7991","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=7991"}],"version-history":[{"count":34,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/7991\/revisions"}],"predecessor-version":[{"id":24782,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/7991\/revisions\/24782"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/11691"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=7991"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=7991"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=7991"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}