{"id":7974,"date":"2020-03-03T21:32:52","date_gmt":"2020-03-03T21:32:52","guid":{"rendered":"https:\/\/nanovea.com\/?p=7974"},"modified":"2025-05-22T20:56:21","modified_gmt":"2025-05-22T20:56:21","slug":"dynamic-load-tribology","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/dynamic-load-tribology\/","title":{"rendered":"Dinamik Y\u00fck Tribolojisi"},"content":{"rendered":"
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Dinamik Y\u00fck Tribolojisi<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Giri\u015f
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A\u015f\u0131nma hemen hemen her end\u00fcstriyel sekt\u00f6rde meydana gelmekte ve GSY\u0130H'n\u0131n ~0,75%'si kadar bir maliyete neden olmaktad\u0131r1. Triboloji ara\u015ft\u0131rmalar\u0131, \u00fcretim verimlili\u011fini ve uygulama performans\u0131n\u0131 art\u0131rman\u0131n yan\u0131 s\u0131ra malzeme, enerji ve \u00e7evrenin korunmas\u0131nda hayati \u00f6nem ta\u015f\u0131maktad\u0131r. Titre\u015fim ve sal\u0131n\u0131m, \u00e7ok \u00e7e\u015fitli tribolojik uygulamalarda ka\u00e7\u0131n\u0131lmaz olarak ortaya \u00e7\u0131kar. A\u015f\u0131r\u0131 d\u0131\u015f titre\u015fim a\u015f\u0131nma s\u00fcrecini h\u0131zland\u0131r\u0131r ve mekanik par\u00e7alarda y\u0131k\u0131c\u0131 ar\u0131zalara yol a\u00e7an hizmet performans\u0131n\u0131 azalt\u0131r.<\/p>\n

Geleneksel \u00f6l\u00fc y\u00fck tribometreleri normal y\u00fckleri k\u00fctle a\u011f\u0131rl\u0131klar\u0131 ile uygular. B\u00f6yle bir y\u00fckleme tekni\u011fi sadece y\u00fckleme se\u00e7eneklerini sabit bir y\u00fck ile s\u0131n\u0131rlamakla kalmaz, ayn\u0131 zamanda y\u00fcksek y\u00fcklerde ve h\u0131zlarda yo\u011fun kontrols\u00fcz titre\u015fimler yaratarak s\u0131n\u0131rl\u0131 ve tutars\u0131z a\u015f\u0131nma davran\u0131\u015f\u0131 de\u011ferlendirmelerine yol a\u00e7ar. Kontroll\u00fc sal\u0131n\u0131m\u0131n malzemelerin a\u015f\u0131nma davran\u0131\u015f\u0131 \u00fczerindeki etkisinin g\u00fcvenilir bir \u015fekilde de\u011ferlendirilmesi, farkl\u0131 end\u00fcstriyel uygulamalarda Ar-Ge ve Kalite Kontrol i\u00e7in arzu edilir.<\/p>\n

Nanovea'n\u0131n \u00e7\u0131\u011f\u0131r a\u00e7an y\u00fcksek y\u00fck\u00fc tribometre <\/a>Dinamik y\u00fck kontrol sistemi ile maksimum 2000 N y\u00fck kapasitesine sahiptir. Geli\u015fmi\u015f pn\u00f6matik bas\u0131n\u00e7l\u0131 hava y\u00fckleme sistemi, a\u015f\u0131nma s\u00fcreci s\u0131ras\u0131nda olu\u015fan istenmeyen titre\u015fimi s\u00f6n\u00fcmleme avantaj\u0131yla kullan\u0131c\u0131lar\u0131n y\u00fcksek normal y\u00fckler alt\u0131nda bir malzemenin tribolojik davran\u0131\u015f\u0131n\u0131 de\u011ferlendirmesine olanak tan\u0131r. Bu nedenle eski tasar\u0131mlarda kullan\u0131lan tampon yaylara gerek kalmadan y\u00fck do\u011frudan \u00f6l\u00e7\u00fcl\u00fcr. Paralel bir elektrom\u0131knat\u0131s sal\u0131n\u0131ml\u0131 y\u00fckleme mod\u00fcl\u00fc, 20 N'ye kadar istenen genlikte ve 150 Hz'ye kadar frekansta iyi kontroll\u00fc sal\u0131n\u0131m uygular.<\/p>\n

S\u00fcrt\u00fcnme, do\u011frudan \u00fcst tutucuya uygulanan yan kuvvetten y\u00fcksek do\u011frulukla \u00f6l\u00e7\u00fcl\u00fcr. Yer de\u011fi\u015ftirme yerinde izlenerek test numunelerinin a\u015f\u0131nma davran\u0131\u015f\u0131n\u0131n geli\u015fimi hakk\u0131nda bilgi sa\u011flan\u0131r. Kontroll\u00fc sal\u0131n\u0131m y\u00fcklemesi alt\u0131nda a\u015f\u0131nma testi, tribolojik uygulamalar i\u00e7in ger\u00e7ek \u00e7al\u0131\u015fma ko\u015fullar\u0131n\u0131 sim\u00fcle etmek amac\u0131yla korozyon, y\u00fcksek s\u0131cakl\u0131k, nem ve ya\u011flama ortamlar\u0131nda da yap\u0131labilir. Entegre y\u00fcksek h\u0131zl\u0131 temass\u0131z profilometre<\/a> A\u015f\u0131nma izi morfolojisini ve a\u015f\u0131nma hacmini birka\u00e7 saniye i\u00e7inde otomatik olarak \u00f6l\u00e7er.<\/p>\n

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\u00d6l\u00e7\u00fcm Hedefi<\/p>\n

Bu \u00e7al\u0131\u015fmada, Nanovea T2000 Dinamik Y\u00fck Tribometresinin kontroll\u00fc sal\u0131n\u0131m y\u00fckleme ko\u015fullar\u0131 alt\u0131nda farkl\u0131 kaplama ve metal numunelerinin tribolojik davran\u0131\u015f\u0131n\u0131 inceleme kapasitesini sergiliyoruz.<\/p>\n

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Test Prosed\u00fcr\u00fc
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Tribolojik davran\u0131\u015f, \u00f6rne\u011fin s\u00fcrt\u00fcnme katsay\u0131s\u0131, COF ve 300 \u00b5m kal\u0131nl\u0131\u011f\u0131nda a\u015f\u0131nmaya dayan\u0131kl\u0131 bir kaplaman\u0131n a\u015f\u0131nma direnci, Nanovea T2000 Tribometre taraf\u0131ndan de\u011ferlendirilmi\u015f ve ASTM G992'ye uygun olarak disk \u00fczerinde bir pim kullan\u0131larak geleneksel bir \u00f6l\u00fc y\u00fck tribometresi ile kar\u015f\u0131la\u015ft\u0131r\u0131lm\u0131\u015ft\u0131r.<\/p>\n

Kontroll\u00fc sal\u0131n\u0131m alt\u0131nda 6 mm Al\u20820\u2083 bilyaya kar\u015f\u0131 ayr\u0131 Cu ve TiN kapl\u0131 numuneler, Nanovea T2000 Tribometrenin Dinamik Y\u00fck Triboloji Modu ile de\u011ferlendirildi.<\/p>\n

Test parametreleri Tablo 1'de \u00f6zetlenmi\u015ftir.<\/p>\n

\u00c7izgi sens\u00f6r\u00fc ile donat\u0131lm\u0131\u015f entegre 3D profilometre, testlerden sonra a\u015f\u0131nma izini otomatik olarak tarayarak saniyeler i\u00e7inde en do\u011fru a\u015f\u0131nma hacmi \u00f6l\u00e7\u00fcm\u00fcn\u00fc sa\u011flar.<\/p>\n

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Sonu\u00e7lar ve Tart\u0131\u015fma
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Pn\u00f6matik y\u00fckleme sistemi vs \u00d6l\u00fc y\u00fck sistemi<\/span><\/strong><\/p>\n

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Nanovea T2000 Tribometre kullan\u0131larak a\u015f\u0131nmaya diren\u00e7li bir kaplaman\u0131n tribolojik davran\u0131\u015f\u0131, geleneksel bir \u00f6l\u00fc y\u00fck (DL) tribometresi ile kar\u015f\u0131la\u015ft\u0131r\u0131lm\u0131\u015ft\u0131r. Kaplaman\u0131n COF de\u011ferinin geli\u015fimi \u015eekil 2'de g\u00f6sterilmektedir. Kaplaman\u0131n a\u015f\u0131nma testi s\u0131ras\u0131nda ~0,6'l\u0131k kar\u015f\u0131la\u015ft\u0131r\u0131labilir bir COF de\u011feri sergiledi\u011fini g\u00f6zlemliyoruz. Bununla birlikte, \u015eekil 3'teki a\u015f\u0131nma izinin farkl\u0131 konumlar\u0131ndaki 20 kesit profili, kaplaman\u0131n \u00f6l\u00fc y\u00fck sistemi alt\u0131nda \u00e7ok daha \u015fiddetli a\u015f\u0131nma ya\u015fad\u0131\u011f\u0131n\u0131 g\u00f6stermektedir.<\/p>\n

Y\u00fcksek y\u00fck ve h\u0131zda \u00f6l\u00fc y\u00fck sisteminin a\u015f\u0131nma s\u00fcreci nedeniyle yo\u011fun titre\u015fimler olu\u015fmu\u015ftur. Temas y\u00fczeyindeki b\u00fcy\u00fck konsantre bas\u0131n\u00e7, y\u00fcksek kayma h\u0131z\u0131 ile birle\u015fti\u011finde, h\u0131zland\u0131r\u0131lm\u0131\u015f a\u015f\u0131nmaya yol a\u00e7an \u00f6nemli a\u011f\u0131rl\u0131k ve yap\u0131 titre\u015fimi yarat\u0131r. Geleneksel \u00f6l\u00fc y\u00fck tribometresi, k\u00fctle a\u011f\u0131rl\u0131klar\u0131 kullanarak y\u00fck uygular. Bu y\u00f6ntem, hafif a\u015f\u0131nma ko\u015fullar\u0131 alt\u0131nda d\u00fc\u015f\u00fck temas y\u00fcklerinde g\u00fcvenilirdir; ancak, y\u00fcksek y\u00fck ve h\u0131zlardaki agresif a\u015f\u0131nma ko\u015fullar\u0131nda, \u00f6nemli titre\u015fim a\u011f\u0131rl\u0131klar\u0131n tekrar tekrar s\u0131\u00e7ramas\u0131na neden olarak d\u00fczensiz bir a\u015f\u0131nma izine yol a\u00e7ar ve g\u00fcvenilir olmayan tribolojik de\u011ferlendirmeye neden olur. Hesaplanan a\u015f\u0131nma oran\u0131 8,0\u00b12,4 x 10-4 mm3\/N m olup y\u00fcksek bir a\u015f\u0131nma oran\u0131 ve b\u00fcy\u00fck bir standart sapma g\u00f6stermektedir.<\/p>\n

Nanovea T2000 tribometre, sal\u0131n\u0131mlar\u0131 s\u00f6n\u00fcmlemek i\u00e7in dinamik bir kontrol y\u00fckleme sistemi ile tasarlanm\u0131\u015ft\u0131r. Normal y\u00fck\u00fc, a\u015f\u0131nma i\u015flemi s\u0131ras\u0131nda olu\u015fan istenmeyen titre\u015fimi en aza indiren bas\u0131n\u00e7l\u0131 hava ile uygular. Buna ek olarak, aktif kapal\u0131 d\u00f6ng\u00fc y\u00fckleme kontrol\u00fc, a\u015f\u0131nma testi boyunca sabit bir y\u00fck uygulanmas\u0131n\u0131 sa\u011flar ve u\u00e7, a\u015f\u0131nma izinin derinlik de\u011fi\u015fimini takip eder. \u015eekil 3a'da g\u00f6sterildi\u011fi gibi \u00f6nemli \u00f6l\u00e7\u00fcde daha tutarl\u0131 bir a\u015f\u0131nma izi profili \u00f6l\u00e7\u00fcl\u00fcr ve bu da 3,4\u00b10,5 x 10-4 mm3\/N m'lik d\u00fc\u015f\u00fck bir a\u015f\u0131nma oran\u0131yla sonu\u00e7lan\u0131r.<\/p>\n

\u015eekil 4'te g\u00f6sterilen a\u015f\u0131nma izi analizi, Nanovea T2000 Tribometrenin pn\u00f6matik bas\u0131n\u00e7l\u0131 hava y\u00fckleme sistemi taraf\u0131ndan ger\u00e7ekle\u015ftirilen a\u015f\u0131nma testinin, geleneksel \u00f6l\u00fc y\u00fck tribometresine k\u0131yasla daha d\u00fczg\u00fcn ve daha tutarl\u0131 bir a\u015f\u0131nma izi olu\u015fturdu\u011funu do\u011frulamaktad\u0131r. Buna ek olarak, Nanovea T2000 tribometre a\u015f\u0131nma s\u00fcreci s\u0131ras\u0131nda u\u00e7 yer de\u011fi\u015ftirmesini \u00f6l\u00e7erek a\u015f\u0131nma davran\u0131\u015f\u0131n\u0131n yerinde ilerleyi\u015fi hakk\u0131nda daha fazla bilgi sa\u011flar.<\/p>\n

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Cu Numunesinin A\u015f\u0131nmas\u0131 \u00dczerine Kontroll\u00fc Sal\u0131n\u0131m<\/strong><\/p>\n

Nanovea T2000 Tribometrenin paralel sal\u0131n\u0131ml\u0131 y\u00fckleme elektrom\u0131knat\u0131s mod\u00fcl\u00fc, kullan\u0131c\u0131lar\u0131n kontroll\u00fc genlik ve frekans sal\u0131n\u0131mlar\u0131n\u0131n malzemelerin a\u015f\u0131nma davran\u0131\u015f\u0131 \u00fczerindeki etkisini ara\u015ft\u0131rmas\u0131n\u0131 sa\u011flar. Cu numunelerinin COF'si \u015eekil 6'da g\u00f6sterildi\u011fi gibi in situ olarak kaydedilmi\u015ftir. Cu numunesi, ilk 330 devirlik \u00f6l\u00e7\u00fcm s\u0131ras\u0131nda ~0,3'l\u00fck sabit bir COF sergileyerek aray\u00fczde kararl\u0131 bir temas ve nispeten d\u00fczg\u00fcn bir a\u015f\u0131nma izi olu\u015ftu\u011funa i\u015faret etmektedir. A\u015f\u0131nma testi devam ettik\u00e7e, COF'nin de\u011fi\u015fimi a\u015f\u0131nma mekanizmas\u0131nda bir de\u011fi\u015fiklik oldu\u011funu g\u00f6sterir. Kar\u015f\u0131la\u015ft\u0131r\u0131ld\u0131\u011f\u0131nda, 50 N'de 5 N genlik kontroll\u00fc sal\u0131n\u0131m alt\u0131nda yap\u0131lan a\u015f\u0131nma testleri farkl\u0131 bir a\u015f\u0131nma davran\u0131\u015f\u0131 sergilemektedir: COF a\u015f\u0131nma s\u00fcrecinin ba\u015flang\u0131c\u0131nda h\u0131zl\u0131 bir \u015fekilde artmakta ve a\u015f\u0131nma testi boyunca \u00f6nemli bir de\u011fi\u015fkenlik g\u00f6stermektedir. COF'nin bu davran\u0131\u015f\u0131, normal y\u00fckte uygulanan sal\u0131n\u0131m\u0131n temastaki karars\u0131z kayma durumunda rol oynad\u0131\u011f\u0131n\u0131 g\u00f6stermektedir.<\/p>\n

\u015eekil 7, entegre temass\u0131z optik profilometre taraf\u0131ndan \u00f6l\u00e7\u00fclen a\u015f\u0131nma izi morfolojisini kar\u015f\u0131la\u015ft\u0131rmaktad\u0131r. Kontroll\u00fc 5 N sal\u0131n\u0131m genli\u011fi alt\u0131ndaki Cu numunesinin, sal\u0131n\u0131m uygulanmayan 5,03 x 108 \u00b5m3 ile kar\u015f\u0131la\u015ft\u0131r\u0131ld\u0131\u011f\u0131nda 1,35 x 109 \u00b5m3 hacminde \u00e7ok daha b\u00fcy\u00fck bir a\u015f\u0131nma izi sergiledi\u011fi g\u00f6zlemlenebilir. Kontroll\u00fc sal\u0131n\u0131m, a\u015f\u0131nma h\u0131z\u0131n\u0131 ~2,7 kat art\u0131rarak sal\u0131n\u0131m\u0131n a\u015f\u0131nma davran\u0131\u015f\u0131 \u00fczerindeki kritik etkisini g\u00f6stermektedir.<\/p>\n

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TiN Kaplaman\u0131n A\u015f\u0131nmas\u0131 \u00dczerine Kontroll\u00fc Sal\u0131n\u0131m<\/strong><\/p>\n

TiN kaplama numunesinin COF ve a\u015f\u0131nma izleri \u015eekil 8'de g\u00f6sterilmektedir. TiN kaplama, testler s\u0131ras\u0131nda COF'nin geli\u015fimiyle g\u00f6sterildi\u011fi gibi sal\u0131n\u0131m alt\u0131nda \u00f6nemli \u00f6l\u00e7\u00fcde farkl\u0131 a\u015f\u0131nma davran\u0131\u015flar\u0131 sergilemektedir. TiN kaplama, TiN kaplama ile Al\u2082O\u2083 bilye aras\u0131ndaki aray\u00fczde sabit kayma temas\u0131 nedeniyle a\u015f\u0131nma testinin ba\u015flang\u0131c\u0131ndaki al\u0131\u015ft\u0131rma d\u00f6neminin ard\u0131ndan ~0,3'l\u00fck sabit bir COF g\u00f6sterir. Bununla birlikte, TiN kaplama bozulmaya ba\u015flad\u0131\u011f\u0131nda, Al\u2082O\u2083 bilye kaplamaya n\u00fcfuz eder ve alt\u0131ndaki taze \u00e7elik alt tabakaya kar\u015f\u0131 kayar. Ayn\u0131 zamanda a\u015f\u0131nma yolunda \u00f6nemli miktarda sert TiN kaplama d\u00f6k\u00fcnt\u00fcs\u00fc olu\u015fur ve stabil iki g\u00f6vdeli kayma a\u015f\u0131nmas\u0131n\u0131 \u00fc\u00e7 g\u00f6vdeli a\u015f\u0131nma a\u015f\u0131nmas\u0131na d\u00f6n\u00fc\u015ft\u00fcr\u00fcr. Malzeme \u00e7ift \u00f6zelliklerinin bu \u015fekilde de\u011fi\u015fmesi, COF evriminde artan varyasyonlara yol a\u00e7ar. Uygulanan 5 N ve 10 N sal\u0131n\u0131m, TiN kaplama ar\u0131zas\u0131n\u0131 ~400 devirden 100 devrin alt\u0131na kadar h\u0131zland\u0131r\u0131r. Kontroll\u00fc sal\u0131n\u0131m alt\u0131ndaki a\u015f\u0131nma testlerinden sonra TiN kaplama numunelerindeki daha b\u00fcy\u00fck a\u015f\u0131nma izleri, COF'deki b\u00f6yle bir de\u011fi\u015fiklikle uyumludur.<\/p>\n

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Sonu\u00e7<\/p>\n

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Nanovea T2000 Tribometrenin geli\u015fmi\u015f pn\u00f6matik y\u00fckleme sistemi, geleneksel \u00f6l\u00fc y\u00fck sistemlerine k\u0131yasla do\u011fal olarak h\u0131zl\u0131 bir titre\u015fim s\u00f6n\u00fcmleyici olarak kendine \u00f6zg\u00fc bir avantaja sahiptir. Pn\u00f6matik sistemlerin bu teknolojik avantaj\u0131, y\u00fck\u00fc uygulamak i\u00e7in servo motorlar ve yaylar\u0131n bir kombinasyonunu kullanan y\u00fck kontroll\u00fc sistemlerle kar\u015f\u0131la\u015ft\u0131r\u0131ld\u0131\u011f\u0131nda do\u011frudur. Bu teknoloji, bu \u00e7al\u0131\u015fmada g\u00f6sterildi\u011fi gibi y\u00fcksek y\u00fcklerde g\u00fcvenilir ve daha iyi kontroll\u00fc a\u015f\u0131nma de\u011ferlendirmesi sa\u011flar. Buna ek olarak, aktif kapal\u0131 d\u00f6ng\u00fc y\u00fckleme sistemi, fren sistemlerinde g\u00f6r\u00fclen ger\u00e7ek hayat uygulamalar\u0131n\u0131 sim\u00fcle etmek i\u00e7in a\u015f\u0131nma testleri s\u0131ras\u0131nda normal y\u00fck\u00fc istenen bir de\u011fere de\u011fi\u015ftirebilir.<\/p>\n

Testler s\u0131ras\u0131nda kontrols\u00fcz titre\u015fim ko\u015fullar\u0131ndan etkilenmek yerine, Nanovea T2000 Dinamik-Y\u00fck Tribometresinin kullan\u0131c\u0131lar\u0131n farkl\u0131 kontroll\u00fc sal\u0131n\u0131m ko\u015fullar\u0131 alt\u0131nda malzemelerin tribolojik davran\u0131\u015flar\u0131n\u0131 nicel olarak de\u011ferlendirmelerini sa\u011flad\u0131\u011f\u0131n\u0131 g\u00f6sterdik. Titre\u015fimler, metal ve seramik kaplama numunelerinin a\u015f\u0131nma davran\u0131\u015f\u0131nda \u00f6nemli bir rol oynamaktad\u0131r.<\/p>\n

Paralel elektrom\u0131knat\u0131sl\u0131 sal\u0131n\u0131ml\u0131 y\u00fckleme mod\u00fcl\u00fc, ayarlanan genlik ve frekanslarda hassas bir \u015fekilde kontrol edilen sal\u0131n\u0131mlar sa\u011flayarak, kullan\u0131c\u0131lar\u0131n \u00e7evresel titre\u015fimlerin genellikle \u00f6nemli bir fakt\u00f6r oldu\u011fu ger\u00e7ek ya\u015fam ko\u015fullar\u0131nda a\u015f\u0131nma s\u00fcrecini sim\u00fcle etmelerine olanak tan\u0131r. A\u015f\u0131nma s\u0131ras\u0131nda uygulanan sal\u0131n\u0131mlar\u0131n varl\u0131\u011f\u0131nda, hem Cu hem de TiN kaplama numuneleri \u00f6nemli \u00f6l\u00e7\u00fcde artan a\u015f\u0131nma oran\u0131 sergilemektedir. Yerinde \u00f6l\u00e7\u00fclen s\u00fcrt\u00fcnme katsay\u0131s\u0131 ve u\u00e7 yer de\u011fi\u015ftirmesinin geli\u015fimi, tribolojik uygulamalar s\u0131ras\u0131nda malzemenin performans\u0131 i\u00e7in \u00f6nemli g\u00f6stergelerdir. Entegre 3D temass\u0131z profilometre, a\u015f\u0131nma hacmini hassas bir \u015fekilde \u00f6l\u00e7mek ve a\u015f\u0131nma izlerinin ayr\u0131nt\u0131l\u0131 morfolojisini saniyeler i\u00e7inde analiz etmek i\u00e7in bir ara\u00e7 sunarak a\u015f\u0131nma mekanizmas\u0131n\u0131n temel anlay\u0131\u015f\u0131na daha fazla bilgi sa\u011flar.<\/p>\n

T2000, 20 bit dahili h\u0131z ve 16 bit harici konum kodlay\u0131c\u0131ya sahip kendinden ayarl\u0131, y\u00fcksek kaliteli ve y\u00fcksek torklu bir motorla donat\u0131lm\u0131\u015ft\u0131r. Bu, tribometrenin 0,01 ila 5000 rpm aras\u0131nda kademeli s\u0131\u00e7ramalarla veya s\u00fcrekli oranlarda de\u011fi\u015febilen benzersiz bir d\u00f6nme h\u0131z\u0131 aral\u0131\u011f\u0131 sa\u011flamas\u0131na olanak tan\u0131r. Altta bulunan bir tork sens\u00f6r\u00fc kullanan sistemlerin aksine, Nanovea Tribometre s\u00fcrt\u00fcnme kuvvetlerini do\u011fru ve ayr\u0131 olarak \u00f6l\u00e7mek i\u00e7in \u00fcstte bulunan y\u00fcksek hassasiyetli bir y\u00fck h\u00fccresi kullan\u0131r.<\/p>\n

Nanovea Tribometers, ISO ve ASTM uyumlu rotatif ve lineer modlar\u0131 (4 bilyeli, bask\u0131 pulu ve halka \u00fczerinde blok testleri dahil) kullanarak hassas ve tekrarlanabilir a\u015f\u0131nma ve s\u00fcrt\u00fcnme testleri sunar ve iste\u011fe ba\u011fl\u0131 y\u00fcksek s\u0131cakl\u0131k a\u015f\u0131nma, ya\u011flama ve tribo-korozyon mod\u00fclleri \u00f6nceden entegre edilmi\u015f tek bir sistemde mevcuttur. Nanovea T2000'in e\u015fsiz \u00fcr\u00fcn yelpazesi, ince veya kal\u0131n, yumu\u015fak veya sert kaplamalar\u0131n, filmlerin ve alt tabakalar\u0131n t\u00fcm tribolojik \u00f6zelliklerini belirlemek i\u00e7in ideal bir \u00e7\u00f6z\u00fcmd\u00fcr.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

Dinamik Y\u00fck Tribolojisi Giri\u015f A\u015f\u0131nma hemen hemen her end\u00fcstriyel sekt\u00f6rde meydana gelir ve GSYH1'in ~0,75% tutar\u0131nda maliyete neden olur1. Triboloji ara\u015ft\u0131rmas\u0131, \u00fcretim verimlili\u011finin, uygulama performans\u0131n\u0131n iyile\u015ftirilmesinin yan\u0131 s\u0131ra malzeme, enerji ve \u00e7evrenin korunmas\u0131 a\u00e7\u0131s\u0131ndan da hayati \u00f6neme sahiptir. Titre\u015fim ve sal\u0131n\u0131m, \u00e7ok \u00e7e\u015fitli tribolojik uygulamalarda ka\u00e7\u0131n\u0131lmaz olarak ortaya \u00e7\u0131kar. A\u015f\u0131r\u0131 d\u0131\u015f titre\u015fim [\u2026]<\/p>","protected":false},"author":1,"featured_media":8052,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,355,335,373,336],"tags":[],"class_list":["post-7974","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-volume-area","category-profilometry-testing","category-rotational-tribology","category-tribology-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/7974","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=7974"}],"version-history":[{"count":45,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/7974\/revisions"}],"predecessor-version":[{"id":24785,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/7974\/revisions\/24785"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/8052"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=7974"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=7974"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=7974"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}