{"id":3357,"date":"2018-03-29T13:49:55","date_gmt":"2018-03-29T13:49:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=3357"},"modified":"2019-07-31T14:56:53","modified_gmt":"2019-07-31T14:56:53","slug":"gofret-kaplama-kalinlik-olcumu-kullanarak-3d-profilometri","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/wafer-coating-thickness-measurement-using-3d-profilometry\/","title":{"rendered":"3D Profilometri Kullanarak Wafer Kaplama Kal\u0131nl\u0131\u011f\u0131 \u00d6l\u00e7\u00fcm\u00fc"},"content":{"rendered":"<p>Wafer Kaplama Kal\u0131nl\u0131\u011f\u0131 \u00d6l\u00e7\u00fcm\u00fc kritik \u00f6neme sahiptir. Silikon gofretler, \u00e7ok say\u0131da end\u00fcstride kullan\u0131lan entegre devrelerin ve di\u011fer mikro cihazlar\u0131n yap\u0131m\u0131nda yayg\u0131n olarak kullan\u0131lmaktad\u0131r. Daha ince ve p\u00fcr\u00fczs\u00fcz gofretlere ve gofret kaplamalar\u0131na y\u00f6nelik s\u00fcrekli talep, Nanovea 3D temass\u0131z <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilometre<\/a> hemen hemen her y\u00fczeyin kaplama kal\u0131nl\u0131\u011f\u0131n\u0131 ve p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc \u00f6l\u00e7mek i\u00e7in harika bir ara\u00e7t\u0131r. Bu makaledeki \u00f6l\u00e7\u00fcmler, 3D Temass\u0131z Profilometremizin yeteneklerini g\u00f6stermek i\u00e7in kaplanm\u0131\u015f bir wafer \u00f6rne\u011finden al\u0131nm\u0131\u015ft\u0131r.<\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/thinfilmthicknessmeasurement.pdf\">3D Profilometri Kullanarak Wafer Kaplama Kal\u0131nl\u0131\u011f\u0131 \u00d6l\u00e7\u00fcm\u00fc<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Wafer Coating Thickness Measurement is critical. Silicon wafers are widely used in the making of integrated circuits and other micro devices used in a vast number of industries. A constant demand for thinner and smoother wafers and wafer coatings makes the Nanovea 3D non-contact Profilometer a great tool to quantify coating thickness and roughness of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3360,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,352],"tags":[308],"class_list":["post-3357","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-step-height-thickness","tag-wafer-coating-thickness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/3357","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=3357"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/3357\/revisions"}],"predecessor-version":[{"id":6628,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/3357\/revisions\/6628"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/3360"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=3357"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=3357"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=3357"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}