{"id":21138,"date":"2022-07-14T15:16:39","date_gmt":"2022-07-14T15:16:39","guid":{"rendered":"https:\/\/nanovea.com\/?p=21138"},"modified":"2025-05-22T19:13:23","modified_gmt":"2025-05-22T19:13:23","slug":"tasinabilir-3d-profilometre-kullanarak-kaynak-yuzey-incelemesi","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/tasinabilir-3d-profilometre-kullanarak-kaynak-yuzey-incelemesi\/","title":{"rendered":"Ta\u015f\u0131nabilir 3D Profilometre Kullanarak Kaynak Y\u00fczeyi Denetimi"},"content":{"rendered":"
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WELd y\u00fczey denetimi<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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portati\u0307f 3 boyutlu profi\u0307lometre kullanimi<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Taraf\u0131ndan haz\u0131rlanm\u0131\u015ft\u0131r<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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CRAIG LEISING<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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G\u0130R\u0130\u015e<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Tipik olarak g\u00f6rsel inceleme ile yap\u0131lan belirli bir kayna\u011f\u0131n a\u015f\u0131r\u0131 hassasiyetle incelenmesi kritik hale gelebilir. Hassas analiz i\u00e7in spesifik ilgi alanlar\u0131 aras\u0131nda, sonraki muayene prosed\u00fcrlerinden ba\u011f\u0131ms\u0131z olarak y\u00fczey \u00e7atlaklar\u0131, g\u00f6zeneklilik ve doldurulmam\u0131\u015f kraterler bulunur. Boyut\/\u015fekil, hacim, p\u00fcr\u00fczl\u00fcl\u00fck, boyut vb. gibi kaynak \u00f6zelliklerinin t\u00fcm\u00fc kritik de\u011ferlendirme i\u00e7in \u00f6l\u00e7\u00fclebilir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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KAYNAK Y\u00dcZEYI\u0307 DENETI\u0307MI\u0307NDE 3 BOYUTLU TEMASSIZ PROFI\u0307LOMETRENI\u0307N \u00d6NEMI\u0307<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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NANOVEA, dokunma problar\u0131 veya interferometri gibi di\u011fer tekniklerin aksine 3D Temass\u0131z Profilometre<\/a>Eksenel kromatizmi kullanarak neredeyse her y\u00fczeyi \u00f6l\u00e7ebilir, a\u00e7\u0131k a\u015famaland\u0131rma nedeniyle numune boyutlar\u0131 b\u00fcy\u00fck \u00f6l\u00e7\u00fcde de\u011fi\u015febilir ve numune haz\u0131rlamaya gerek yoktur. Nanodan makroya kadar aral\u0131k, y\u00fczey profili \u00f6l\u00e7\u00fcm\u00fc s\u0131ras\u0131nda numune yans\u0131mas\u0131ndan veya emiliminden s\u0131f\u0131r etkiyle elde edilir, y\u00fcksek y\u00fczey a\u00e7\u0131lar\u0131n\u0131 \u00f6l\u00e7me konusunda geli\u015fmi\u015f bir yetene\u011fe sahiptir ve sonu\u00e7lar\u0131n yaz\u0131l\u0131mla manip\u00fclasyonu yoktur. Herhangi bir malzemeyi kolayca \u00f6l\u00e7\u00fcn: \u015feffaf, opak, aynasal, da\u011f\u0131n\u0131k, cilal\u0131, p\u00fcr\u00fczl\u00fc vb. NANOVEA Ta\u015f\u0131nabilir Profilometrelerin 2D ve 2D yetenekleri, onlar\u0131 hem laboratuvarda hem de sahada tam kapsaml\u0131 kaynak y\u00fczeyi muayenesi i\u00e7in ideal cihazlar haline getirir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u00d6L\u00c7\u00dcM HEDEFI<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Bu uygulamada, NANOVEA JR25 Ta\u015f\u0131nabilir Profilleyici, bir kayna\u011f\u0131n y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc, \u015feklini ve hacmini ve ayr\u0131ca \u00e7evresindeki alan\u0131 \u00f6l\u00e7mek i\u00e7in kullan\u0131l\u0131r. Bu bilgiler, kayna\u011f\u0131n ve kaynak i\u015fleminin kalitesini do\u011fru bir \u015fekilde ara\u015ft\u0131rmak i\u00e7in kritik bilgiler sa\u011flayabilir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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JR25<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tDAHA FAZLA BI\u0307LGI\u0307 EDI\u0307NI\u0307N<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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TEST SONU\u00c7LARI<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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A\u015fa\u011f\u0131daki g\u00f6r\u00fcnt\u00fc, kayna\u011f\u0131n ve \u00e7evresindeki alan\u0131n tam 3D g\u00f6r\u00fcn\u00fcm\u00fcn\u00fc ve yaln\u0131zca kayna\u011f\u0131n y\u00fczey parametrelerini g\u00f6stermektedir. 2D kesit profili a\u015fa\u011f\u0131da g\u00f6sterilmi\u015ftir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\u00f6rneklem<\/strong><\/em><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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Yukar\u0131daki 2D kesit profili 3D'den \u00e7\u0131kar\u0131ld\u0131\u011f\u0131nda, kayna\u011f\u0131n boyutsal bilgileri a\u015fa\u011f\u0131da hesaplan\u0131r. A\u015fa\u011f\u0131da sadece kaynak i\u00e7in y\u00fczey alan\u0131 ve malzeme hacmi hesaplanm\u0131\u015ft\u0131r.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\u00a0<\/td>DEL\u0130K<\/strong><\/em><\/td>Z\u0130RVE<\/strong><\/em><\/td><\/tr>
Y\u00dcZEY<\/strong><\/em><\/td>1.01 mm2<\/sup><\/strong><\/em><\/td>14.0 mm2<\/sup><\/strong><\/em><\/td><\/tr>
HAC\u0130M<\/strong><\/em><\/td>8.799e-5 mm3<\/sup><\/strong><\/em><\/td>23,27 mm3<\/sup><\/strong><\/em><\/td><\/tr>
MAKSIMUM DERINLIK\/Y\u00dcKSEKLIK<\/strong><\/em><\/td>0,0276 mm<\/strong><\/em><\/td>0,6195 mm<\/strong><\/em><\/td><\/tr>
ORTALAMA DERINLIK\/Y\u00dcKSEKLIK<\/strong><\/em><\/td> 0.004024 mm<\/span> <\/strong><\/em><\/td> 0,2298 mm<\/span> <\/strong><\/em><\/td><\/tr><\/tbody><\/table>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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SONU\u00c7<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Bu uygulamada, NANOVEA 3D Temass\u0131z Profilleyicinin bir kayna\u011f\u0131n ve \u00e7evresindeki y\u00fczey alan\u0131n\u0131n kritik \u00f6zelliklerini nas\u0131l hassas bir \u015fekilde karakterize edebilece\u011fini g\u00f6sterdik. P\u00fcr\u00fczl\u00fcl\u00fck, boyutlar ve hacimden, kalite ve tekrarlanabilirlik i\u00e7in nicel bir y\u00f6ntem belirlenebilir ve \/ veya daha fazla ara\u015ft\u0131r\u0131labilir. Bu uygulama notundaki \u00f6rnek gibi \u00f6rnek kaynaklar, kurum i\u00e7i veya saha testleri i\u00e7in standart bir masa \u00fcst\u00fc veya ta\u015f\u0131nabilir NANOVEA Profilleyici ile kolayca analiz edilebilir<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

WELd surface inspection using a portable 3d profilometer Prepared by CRAIG LEISING INTRODUCTION It may become critical for a particular weld, typically done by visual inspection, to be investigated with an extreme level of precision. Specific areas of interest for precise analysis include surface cracks, porosity and unfilled craters, regardless of subsequent inspection procedures. Weld […]<\/p>","protected":false},"author":1,"featured_media":21140,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,354,350,351,355,335],"tags":[],"class_list":["post-21138","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-flatness-warpage","category-profilometry-geometry-shape","category-profilometry-roughness-finish","category-profilometry-volume-area","category-profilometry-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/21138","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=21138"}],"version-history":[{"count":28,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/21138\/revisions"}],"predecessor-version":[{"id":24696,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/21138\/revisions\/24696"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/21140"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=21138"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=21138"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=21138"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}