{"id":18527,"date":"2022-04-05T17:27:55","date_gmt":"2022-04-05T17:27:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=18527"},"modified":"2025-05-22T20:22:00","modified_gmt":"2025-05-22T20:22:00","slug":"frakografi-analizi-kullanarak-3d-profilometri","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/frakografi-analizi-kullanarak-3d-profilometri\/","title":{"rendered":"3D Profilometri Kullanarak Fraktografi Analizi"},"content":{"rendered":"
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FRAKTOGRAFI\u0307 ANALI\u0307ZI\u0307<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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3 BOYUTLU PROFILOMETRI KULLANARAK<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Taraf\u0131ndan haz\u0131rlanm\u0131\u015ft\u0131r<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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CRAIG LEISING<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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G\u0130R\u0130\u015e<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Fraktografi, k\u0131r\u0131k y\u00fczeylerdeki \u00f6zelliklerin incelenmesidir ve tarihsel olarak Mikroskop veya SEM arac\u0131l\u0131\u011f\u0131yla ara\u015ft\u0131r\u0131lm\u0131\u015ft\u0131r. \u00d6zelli\u011fin boyutuna ba\u011fl\u0131 olarak y\u00fczey analizi i\u00e7in mikroskop (makro \u00f6zellikler) veya SEM (nano ve mikro \u00f6zellikler) se\u00e7ilir. Her ikisi de sonu\u00e7ta k\u0131r\u0131lma mekanizmas\u0131 tipinin tan\u0131mlanmas\u0131na olanak sa\u011flar. Etkili olmas\u0131na ra\u011fmen, Mikroskopun a\u00e7\u0131k s\u0131n\u0131rlamalar\u0131 vard\u0131r ve \u00e7o\u011fu durumda SEM, atomik seviye analizi d\u0131\u015f\u0131nda, k\u0131r\u0131lma y\u00fczeyi \u00f6l\u00e7\u00fcm\u00fc i\u00e7in pratik de\u011fildir ve daha geni\u015f kullan\u0131m kapasitesinden yoksundur. Optik \u00f6l\u00e7\u00fcm teknolojisindeki geli\u015fmeler sayesinde NANOVEA 3D Temass\u0131z Profilometre<\/a> makro \u00f6l\u00e7ekli 2D ve 3D y\u00fczey \u00f6l\u00e7\u00fcmleri yoluyla nano sa\u011flama yetene\u011fiyle art\u0131k tercih edilen cihaz olarak kabul ediliyor<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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KIRIK I\u0307NCELEMESI\u0307 I\u0307\u00c7I\u0307N 3 BOYUTLU TEMASSIZ PROFI\u0307LOMETRENI\u0307N \u00d6NEMI\u0307<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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SEM'in aksine, 3D Temass\u0131z Profilometre neredeyse her y\u00fczeyi, numune boyutunu, minimum numune haz\u0131rl\u0131\u011f\u0131 ile \u00f6l\u00e7ebilir ve t\u00fcm bunlar bir SEM'e g\u00f6re \u00fcst\u00fcn dikey \/ yatay boyutlar sunar. Bir profilometre ile nano ile makro aras\u0131ndaki \u00f6zellikler, numune yans\u0131t\u0131c\u0131l\u0131\u011f\u0131ndan s\u0131f\u0131r etkilenerek tek bir \u00f6l\u00e7\u00fcmde yakalan\u0131r. Her t\u00fcrl\u00fc malzemeyi kolayca \u00f6l\u00e7\u00fcn: \u015feffaf, opak, spek\u00fcler, dif\u00fczif, cilal\u0131, p\u00fcr\u00fczl\u00fc vb. 3D Temass\u0131z Profilometre, SEM maliyetinin \u00e7ok alt\u0131nda bir maliyetle y\u00fczey k\u0131r\u0131lma \u00e7al\u0131\u015fmalar\u0131n\u0131 en \u00fcst d\u00fczeye \u00e7\u0131karmak i\u00e7in geni\u015f ve kullan\u0131c\u0131 dostu bir yetenek sa\u011flar.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u00d6L\u00c7\u00dcM HEDEFI<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Bu uygulamada, NANOVEA ST400 bir \u00e7elik numunenin k\u0131r\u0131lm\u0131\u015f y\u00fczeyini \u00f6l\u00e7mek i\u00e7in kullan\u0131lmaktad\u0131r. Bu \u00e7al\u0131\u015fmada, y\u00fczeyin 3D alan\u0131n\u0131, 2D profil \u00e7\u0131kar\u0131m\u0131n\u0131 ve y\u00fczey y\u00f6n haritas\u0131n\u0131 g\u00f6sterece\u011fiz.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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ST400<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tDAHA FAZLA BI\u0307LGI\u0307 EDI\u0307NI\u0307N<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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SONU\u00c7LAR<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\u00dcST Y\u00dcZEY<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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3B Y\u00fczey Doku Y\u00f6n\u00fc<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\u0130zotropi<\/td>51.26%<\/td><\/tr>
Birinci Y\u00f6n<\/td>123.2\u00ba<\/td><\/tr>
\u0130kinci Y\u00f6n<\/td>116.3\u00ba<\/td><\/tr>
\u00dc\u00e7\u00fcnc\u00fc Y\u00f6n<\/td>0.1725\u00ba<\/td><\/tr><\/tbody><\/table>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Y\u00fczey Alan\u0131, Hacim, P\u00fcr\u00fczl\u00fcl\u00fck ve di\u011ferleri bu ekstraksiyondan otomatik olarak hesaplanabilir.<\/span> <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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2D Profil \u00c7\u0131karma<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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SONU\u00c7LAR<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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YAN Y\u00dcZEY<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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3B Y\u00fczey Doku Y\u00f6n\u00fc<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\u0130zotropi<\/td>15.55<\/span>%<\/td><\/tr>
Birinci Y\u00f6n<\/td>0.1617<\/span>\u00ba<\/td><\/tr>
\u0130kinci Y\u00f6n<\/td>110.5<\/span>\u00ba<\/td><\/tr>
\u00dc\u00e7\u00fcnc\u00fc Y\u00f6n<\/td>171.5<\/span>\u00ba<\/td><\/tr><\/tbody><\/table>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Y\u00fczey Alan\u0131, Hacim, P\u00fcr\u00fczl\u00fcl\u00fck ve di\u011ferleri bu ekstraksiyondan otomatik olarak hesaplanabilir.<\/span> <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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2D Profil \u00c7\u0131karma<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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SONU\u00c7<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Bu uygulamada, NANOVEA ST400 3D Temass\u0131z Profilometrenin k\u0131r\u0131lm\u0131\u015f bir y\u00fczeyin t\u00fcm topografyas\u0131n\u0131 (nano, mikro ve makro \u00f6zellikler) nas\u0131l hassas bir \u015fekilde karakterize edebilece\u011fini g\u00f6sterdik. 3D alandan y\u00fczey net bir \u015fekilde tan\u0131mlanabilir ve alt alanlar veya profiller \/ kesitler h\u0131zl\u0131 bir \u015fekilde \u00e7\u0131kar\u0131labilir ve sonsuz bir y\u00fczey hesaplamalar\u0131 listesi ile analiz edilebilir. Nanometre alt\u0131 y\u00fczey \u00f6zellikleri, entegre bir AFM mod\u00fcl\u00fc ile daha fazla analiz edilebilir.<\/p>

Ayr\u0131ca NANOVEA, Profilometre serisine, \u00f6zellikle k\u0131r\u0131k y\u00fczeyinin ta\u015f\u0131namaz oldu\u011fu saha \u00e7al\u0131\u015fmalar\u0131 i\u00e7in kritik olan ta\u015f\u0131nabilir bir versiyon eklemi\u015ftir. Bu geni\u015f y\u00fczey \u00f6l\u00e7\u00fcm yetenekleri listesiyle, k\u0131r\u0131k y\u00fczey analizi tek bir cihazla hi\u00e7 bu kadar kolay ve kullan\u0131\u015fl\u0131 olmam\u0131\u015ft\u0131.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

FRACTOGRAPHY ANALYSIS USING 3D PROFILOMETRY Prepared by CRAIG LEISING INTRODUCTION Fractography is the study of features on fractured surfaces and has historically been investigated via Microscope or SEM. Depending on the size of the feature, a microscope (macro features) or SEM (nano and micro features) are selected for the surface analysis. Both ultimately allowing for […]<\/p>","protected":false},"author":1,"featured_media":18534,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,350,351,353,355,335],"tags":[],"class_list":["post-18527","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-geometry-shape","category-profilometry-roughness-finish","category-profilometry-texture-grain","category-profilometry-volume-area","category-profilometry-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/18527","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=18527"}],"version-history":[{"count":29,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/18527\/revisions"}],"predecessor-version":[{"id":24705,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/18527\/revisions\/24705"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/18534"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=18527"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=18527"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=18527"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}