{"id":16977,"date":"2022-01-06T21:24:20","date_gmt":"2022-01-06T21:24:20","guid":{"rendered":"https:\/\/nanovea.com\/?p=16977"},"modified":"2025-05-22T20:23:16","modified_gmt":"2025-05-22T20:23:16","slug":"polimer-kayis-asinma-ve-surtunme-kullanim-tribometresi","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/polimer-kayis-asinma-ve-surtunme-kullanim-tribometresi\/","title":{"rendered":"Tribometre Kullanarak Polimer Kay\u0131\u015f A\u015f\u0131nmas\u0131 ve S\u00fcrt\u00fcnmesi"},"content":{"rendered":"
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POLI\u0307MER KAYI\u015eLAR<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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TR\u0130BOMETRE KULLANARAK A\u015eINMA VE KIRILMA<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Taraf\u0131ndan haz\u0131rlanm\u0131\u015ft\u0131r<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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DUANJIE LI, PhD<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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G\u0130R\u0130\u015e<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Kay\u0131\u015f tahriki, g\u00fcc\u00fc iletir ve iki veya daha fazla d\u00f6nen \u015faft aras\u0131ndaki g\u00f6receli hareketi izler. Minimum bak\u0131m gerektiren basit ve ucuz bir \u00e7\u00f6z\u00fcm olan kay\u0131\u015f tahrikleri, testereler, h\u0131zarlar, harman makineleri, silo \u00fcfleyiciler ve konvey\u00f6rler gibi \u00e7e\u015fitli uygulamalarda yayg\u0131n olarak kullan\u0131lmaktad\u0131r. Kay\u0131\u015f tahrikleri makineyi a\u015f\u0131r\u0131 y\u00fckten koruman\u0131n yan\u0131 s\u0131ra titre\u015fimi s\u00f6n\u00fcmler ve izole eder.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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A\u015eINMA DE\u011eERLENDI\u0307RMESI\u0307NI\u0307N \u00d6NEMI\u0307\nKAYI\u015e TAHRIKLERI I\u00c7IN<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Kay\u0131\u015f tahrikli bir makinedeki kay\u0131\u015flar i\u00e7in s\u00fcrt\u00fcnme ve a\u015f\u0131nma ka\u00e7\u0131n\u0131lmazd\u0131r. Yeterli s\u00fcrt\u00fcnme kayma olmadan etkili g\u00fc\u00e7 aktar\u0131m\u0131 sa\u011flar, ancak a\u015f\u0131r\u0131 s\u00fcrt\u00fcnme kay\u0131\u015f\u0131 h\u0131zla a\u015f\u0131nd\u0131rabilir. Kay\u0131\u015fla tahrik i\u015flemi s\u0131ras\u0131nda yorulma, a\u015f\u0131nma ve s\u00fcrt\u00fcnme gibi farkl\u0131 a\u015f\u0131nma t\u00fcrleri meydana gelir. Kay\u0131\u015f\u0131n \u00f6mr\u00fcn\u00fc uzatmak ve kay\u0131\u015f onar\u0131m\u0131 ve de\u011fi\u015fiminde maliyeti ve zaman\u0131 azaltmak i\u00e7in, kay\u0131\u015flar\u0131n a\u015f\u0131nma performans\u0131n\u0131n g\u00fcvenilir bir \u015fekilde de\u011ferlendirilmesi, kay\u0131\u015f \u00f6mr\u00fcn\u00fc, \u00fcretim verimlili\u011fini ve uygulama performans\u0131n\u0131 iyile\u015ftirmek i\u00e7in arzu edilir. Kay\u0131\u015f\u0131n s\u00fcrt\u00fcnme katsay\u0131s\u0131n\u0131n ve a\u015f\u0131nma oran\u0131n\u0131n do\u011fru \u00f6l\u00e7\u00fcm\u00fc, Ar-Ge'yi ve kay\u0131\u015f \u00fcretiminin kalite kontrol\u00fcn\u00fc kolayla\u015ft\u0131r\u0131r.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u00d6L\u00c7\u00dcM HEDEFI<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Bu \u00e7al\u0131\u015fmada, farkl\u0131 y\u00fczey dokular\u0131na sahip kay\u0131\u015flar\u0131n a\u015f\u0131nma davran\u0131\u015flar\u0131n\u0131 sim\u00fcle ettik ve kar\u015f\u0131la\u015ft\u0131rd\u0131k. <\/span>NANOVEA <\/span>T2000 Tribometre, kay\u0131\u015f\u0131n a\u015f\u0131nma s\u00fcrecini kontroll\u00fc ve izlenebilir bir \u015fekilde sim\u00fcle eder.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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T2000<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tDAHA FAZLA BI\u0307LGI\u0307 EDI\u0307NI\u0307N<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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TEST PROSED\u00dcRLERI<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Farkl\u0131 y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcne ve dokusuna sahip iki kay\u0131\u015f\u0131n s\u00fcrt\u00fcnme katsay\u0131s\u0131, COF ve a\u015f\u0131nma direnci a\u015fa\u011f\u0131daki y\u00f6ntemlerle de\u011ferlendirilmi\u015ftir <\/span>NANOVEA <\/span>Y\u00fcksek Y\u00fck Tribometre <\/a>Do\u011frusal Pistonlu A\u015f\u0131nma Mod\u00fcl\u00fc kullanarak. Kar\u015f\u0131 malzeme olarak \u00c7elik 440 bilya (10 mm \u00e7ap\u0131nda) kullan\u0131ld\u0131. Y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc ve a\u015f\u0131nma izi entegre bir sistem kullan\u0131larak incelendi. 3D Temass\u0131z profilometre<\/a>. A\u015f\u0131nma oran\u0131, <\/span>K<\/span>form\u00fcl\u00fc kullan\u0131larak de\u011ferlendirilmi\u015ftir <\/span>K=Vl(Fxs)<\/span>, nerede <\/span>V <\/span>a\u015f\u0131nm\u0131\u015f hacimdir, <\/span>F <\/span>normal y\u00fck ve <\/span>s <\/span>kayma mesafesidir.<\/span><\/p>

\u00a0<\/p>

Bu \u00e7al\u0131\u015fmada \u00f6rnek olarak p\u00fcr\u00fczs\u00fcz bir \u00c7elik 440 bilye muadilinin kullan\u0131ld\u0131\u011f\u0131n\u0131, ger\u00e7ek uygulama durumunu sim\u00fcle etmek i\u00e7in \u00f6zel fikst\u00fcrler kullan\u0131larak farkl\u0131 \u015fekillere ve y\u00fczey kaplamas\u0131na sahip herhangi bir kat\u0131 malzemenin uygulanabilece\u011fini l\u00fctfen unutmay\u0131n.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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SONU\u00c7LAR & TARTI\u015eMA<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Dokulu Kay\u0131\u015f ve D\u00fcz Kay\u0131\u015f\u0131n y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc Ra s\u0131ras\u0131yla 33,5 ve 8,7 um'dir. <\/span>NANOVEA <\/span>3D Temass\u0131z Optik profilleyici. Test edilen iki kay\u0131\u015f\u0131n COF ve a\u015f\u0131nma oran\u0131, kay\u0131\u015flar\u0131n farkl\u0131 y\u00fcklerdeki a\u015f\u0131nma davran\u0131\u015f\u0131n\u0131 kar\u015f\u0131la\u015ft\u0131rmak i\u00e7in s\u0131ras\u0131yla 10 N ve 100 N'de \u00f6l\u00e7\u00fclm\u00fc\u015ft\u00fcr.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u015eEK\u0130L 1 <\/span>a\u015f\u0131nma testleri s\u0131ras\u0131nda kay\u0131\u015flar\u0131n COF'sinin geli\u015fimini g\u00f6stermektedir. Farkl\u0131 dokulara sahip kay\u0131\u015flar \u00f6nemli \u00f6l\u00e7\u00fcde farkl\u0131 a\u015f\u0131nma davran\u0131\u015flar\u0131 sergilemektedir. COF'nin kademeli olarak artt\u0131\u011f\u0131 al\u0131\u015ft\u0131rma d\u00f6neminden sonra, Dokulu Kay\u0131\u015f\u0131n 10 N ve 100 N y\u00fckler kullan\u0131larak yap\u0131lan her iki testte de ~0,5'lik daha d\u00fc\u015f\u00fck bir COF'ye ula\u015fmas\u0131 ilgin\u00e7tir. 10 N y\u00fck alt\u0131nda test edilen D\u00fcz Kay\u0131\u015f, COF sabitlendi\u011finde ~1,4'l\u00fck \u00f6nemli \u00f6l\u00e7\u00fcde daha y\u00fcksek bir COF sergilemekte ve testin geri kalan\u0131nda bu de\u011ferin \u00fczerinde kalmaktad\u0131r. D\u00fcz Kay\u0131\u015f 100 N y\u00fck alt\u0131nda test edildi\u011finde \u00e7elik 440 bilye taraf\u0131ndan h\u0131zla a\u015f\u0131nd\u0131r\u0131lm\u0131\u015f ve b\u00fcy\u00fck bir a\u015f\u0131nma izi olu\u015fturmu\u015ftur. Bu nedenle test 220 devirde durdurulmu\u015ftur.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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\u015eEK\u0130L 1:<\/span> Farkl\u0131 y\u00fcklerde kay\u0131\u015flar\u0131n COF'sinin evrimi.\n<\/span>\n<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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NANOVEA 3D temass\u0131z profilometre, a\u015f\u0131nma izlerinin ayr\u0131nt\u0131l\u0131 morfolojisini analiz etmek i\u00e7in bir ara\u00e7 sunarak a\u015f\u0131nma mekanizmas\u0131n\u0131n temel olarak anla\u015f\u0131lmas\u0131na y\u00f6nelik daha fazla bilgi sa\u011flar.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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TABLO 1:<\/span> A\u015f\u0131nma izi analizinin sonucu.\n<\/span>\n<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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\u015eEK\u0130L 2:<\/span> \u00a0\u0130ki kay\u0131\u015f\u0131n 3D g\u00f6r\u00fcn\u00fcm\u00fc
100 N'deki testlerden sonra.<\/span><\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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3D a\u015f\u0131nma izi profili, TABLO 1'de g\u00f6sterildi\u011fi gibi geli\u015fmi\u015f analiz yaz\u0131l\u0131m\u0131 taraf\u0131ndan hesaplanan a\u015f\u0131nma izi hacminin do\u011frudan ve do\u011fru bir \u015fekilde belirlenmesini sa\u011flar. D\u00fcz Kay\u0131\u015f, 220 devirlik bir a\u015f\u0131nma testinde 75,7 mm3 hacmiyle \u00e7ok daha b\u00fcy\u00fck ve derin bir a\u015f\u0131nma izine sahipken, 600 devirlik bir a\u015f\u0131nma testinden sonra Dokulu Kay\u0131\u015f i\u00e7in a\u015f\u0131nma hacmi 14,0 mm3't\u00fcr. D\u00fcz Kay\u0131\u015f\u0131n \u00e7elik bilyeye kar\u015f\u0131 \u00f6nemli \u00f6l\u00e7\u00fcde daha y\u00fcksek s\u00fcrt\u00fcnmesi, Dokulu Kay\u0131\u015fa k\u0131yasla 15 kat daha y\u00fcksek bir a\u015f\u0131nma oran\u0131na yol a\u00e7maktad\u0131r.<\/p>

\u00a0<\/p>

Dokulu Kay\u0131\u015f ile D\u00fcz Kay\u0131\u015f aras\u0131ndaki bu kadar ciddi bir COF fark\u0131 muhtemelen kay\u0131\u015f ile \u00e7elik bilye aras\u0131ndaki temas alan\u0131n\u0131n boyutuyla ilgilidir ve bu da farkl\u0131 a\u015f\u0131nma performanslar\u0131na yol a\u00e7maktad\u0131r. \u015eEK\u0130L 3, iki kay\u0131\u015f\u0131n optik mikroskop alt\u0131ndaki a\u015f\u0131nma izlerini g\u00f6stermektedir. A\u015f\u0131nma izi incelemesi, COF evrimine ili\u015fkin g\u00f6zlemle uyumludur: 0,5 gibi d\u00fc\u015f\u00fck bir COF de\u011ferini koruyan Dokulu Kay\u0131\u015f, 10 N y\u00fck alt\u0131ndaki a\u015f\u0131nma testinden sonra hi\u00e7bir a\u015f\u0131nma belirtisi g\u00f6stermez. 10 N'de D\u00fcz Kay\u0131\u015f k\u00fc\u00e7\u00fck bir a\u015f\u0131nma izi g\u00f6sterir. 100 N'de ger\u00e7ekle\u015ftirilen a\u015f\u0131nma testleri, hem Dokulu hem de D\u00fcz Kay\u0131\u015flarda \u00f6nemli \u00f6l\u00e7\u00fcde daha b\u00fcy\u00fck a\u015f\u0131nma izleri olu\u015fturur ve a\u015f\u0131nma oran\u0131, a\u015fa\u011f\u0131daki paragrafta tart\u0131\u015f\u0131laca\u011f\u0131 gibi 3D profiller kullan\u0131larak hesaplanacakt\u0131r.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u015eEK\u0130L 3:<\/span> \u00a0Optik mikroskop alt\u0131nda a\u015f\u0131nma izleri.<\/span>
<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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SONU\u00c7<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Bu \u00e7al\u0131\u015fmada, NANOVEA T2000 Tribometre'nin kay\u0131\u015flar\u0131n s\u00fcrt\u00fcnme katsay\u0131s\u0131n\u0131 ve a\u015f\u0131nma oran\u0131n\u0131 iyi kontroll\u00fc ve nicel bir \u015fekilde de\u011ferlendirme kapasitesini sergiledik. Y\u00fczey dokusu, hizmet performanslar\u0131 s\u0131ras\u0131nda kay\u0131\u015flar\u0131n s\u00fcrt\u00fcnme ve a\u015f\u0131nma direncinde kritik bir rol oynamaktad\u0131r. Dokulu kay\u0131\u015f, ~0,5'lik sabit bir s\u00fcrt\u00fcnme katsay\u0131s\u0131 sergiler ve uzun bir kullan\u0131m \u00f6mr\u00fcne sahiptir, bu da tak\u0131m onar\u0131m\u0131 veya de\u011fi\u015fimi i\u00e7in daha az zaman ve maliyet sa\u011flar. Buna kar\u015f\u0131l\u0131k, d\u00fcz kay\u0131\u015f\u0131n \u00e7elik bilyeye kar\u015f\u0131 a\u015f\u0131r\u0131 s\u00fcrt\u00fcnmesi kay\u0131\u015f\u0131 h\u0131zla a\u015f\u0131nd\u0131r\u0131r. Ayr\u0131ca, kay\u0131\u015f \u00fczerindeki y\u00fckleme, hizmet \u00f6mr\u00fc a\u00e7\u0131s\u0131ndan hayati bir fakt\u00f6rd\u00fcr. A\u015f\u0131r\u0131 y\u00fck \u00e7ok y\u00fcksek s\u00fcrt\u00fcnme yaratarak kay\u0131\u015f\u0131n daha h\u0131zl\u0131 a\u015f\u0131nmas\u0131na neden olur.<\/p>\n

NANOVEA T2000 Tribometre, ISO ve ASTM uyumlu rotatif ve lineer modlar\u0131 kullanarak hassas ve tekrarlanabilir a\u015f\u0131nma ve s\u00fcrt\u00fcnme testleri sunar ve iste\u011fe ba\u011fl\u0131 y\u00fcksek s\u0131cakl\u0131k a\u015f\u0131nmas\u0131, ya\u011flama ve tribokorozyon mod\u00fclleri \u00f6nceden entegre edilmi\u015f tek bir sistemde mevcuttur. NANOVEA'n\u0131n <\/span>e\u015fsiz \u00fcr\u00fcn yelpazesi, ince veya kal\u0131n, yumu\u015fak veya sert kaplamalar\u0131n, filmlerin ve alt tabakalar\u0131n t\u00fcm tribolojik \u00f6zelliklerini belirlemek i\u00e7in ideal bir \u00e7\u00f6z\u00fcmd\u00fcr.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

TR\u0130BOMETRE KULLANILARAK POL\u0130MER KAYI\u015eLARIN A\u015eINMASI VE S\u00dcRT\u00dcNMES\u0130 Haz\u0131rlayan: DUANJIE LI, PhD G\u0130R\u0130\u015e Kay\u0131\u015f tahriki, g\u00fcc\u00fc iletir ve iki veya daha fazla d\u00f6nen \u015faft aras\u0131ndaki ba\u011f\u0131l hareketi izler. Minimum bak\u0131m gerektiren basit ve ucuz bir \u00e7\u00f6z\u00fcm olan kay\u0131\u015f tahrikleri, kara testereleri, kereste fabrikalar\u0131, harman makineleri, silo \u00fcfleyiciler ve [\u2026]<\/p>","protected":false},"author":1,"featured_media":16978,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,372,350,351,353,335,336],"tags":[],"class_list":["post-16977","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-linear-tribology","category-profilometry-geometry-shape","category-profilometry-roughness-finish","category-profilometry-texture-grain","category-profilometry-testing","category-tribology-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/16977","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=16977"}],"version-history":[{"count":44,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/16977\/revisions"}],"predecessor-version":[{"id":24711,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/16977\/revisions\/24711"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/16978"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=16977"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=16977"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=16977"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}