{"id":16045,"date":"2021-11-01T20:39:55","date_gmt":"2021-11-01T20:39:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=16045"},"modified":"2025-03-26T20:56:09","modified_gmt":"2025-03-26T20:56:09","slug":"zimpara-asinma-performans-kullanim-a-tribometre","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/zimpara-asinma-performans-kullanim-a-tribometre\/","title":{"rendered":"Tribometre Kullanarak Z\u0131mpara Ka\u011f\u0131d\u0131 A\u015f\u0131nma Performans\u0131"},"content":{"rendered":"
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ZIMPARA KA\u011eIDI A\u015eINMA PERFORMANSI<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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TRIBOMETRE KULLANARAK<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Taraf\u0131ndan haz\u0131rlanm\u0131\u015ft\u0131r<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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DUANJIE LI, PhD<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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G\u0130R\u0130\u015e<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Z\u0131mpara ka\u011f\u0131d\u0131, bir ka\u011f\u0131t veya bezin bir y\u00fcz\u00fcne yap\u0131\u015ft\u0131r\u0131lm\u0131\u015f a\u015f\u0131nd\u0131r\u0131c\u0131 par\u00e7ac\u0131klardan olu\u015fur. Par\u00e7ac\u0131klar i\u00e7in granat, silisyum karb\u00fcr, al\u00fcminyum oksit ve elmas gibi \u00e7e\u015fitli a\u015f\u0131nd\u0131r\u0131c\u0131 malzemeler kullan\u0131labilir. Z\u0131mpara ka\u011f\u0131d\u0131, ah\u015fap, metal ve al\u00e7\u0131pan \u00fczerinde belirli y\u00fczey kaplamalar\u0131 olu\u015fturmak i\u00e7in \u00e7e\u015fitli end\u00fcstriyel sekt\u00f6rlerde yayg\u0131n olarak uygulanmaktad\u0131r. Genellikle el veya elektrikli aletlerle uygulanan y\u00fcksek bas\u0131n\u00e7l\u0131 temas alt\u0131nda \u00e7al\u0131\u015f\u0131rlar.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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ZIMPARA KA\u011eIDININ A\u015eINMA PERFORMANSINI DE\u011eERLENDIRMENIN \u00d6NEMI<\/h3>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Z\u0131mpara ka\u011f\u0131d\u0131n\u0131n etkinli\u011fi genellikle farkl\u0131 ko\u015fullar alt\u0131ndaki a\u015f\u0131nd\u0131rma performans\u0131na g\u00f6re belirlenir. Kum boyutu, yani z\u0131mpara ka\u011f\u0131d\u0131na g\u00f6m\u00fcl\u00fc a\u015f\u0131nd\u0131r\u0131c\u0131 partik\u00fcllerin boyutu, z\u0131mparalanan malzemenin a\u015f\u0131nma oran\u0131n\u0131 ve \u00e7izik boyutunu belirler. Daha y\u00fcksek kum numaral\u0131 z\u0131mpara ka\u011f\u0131tlar\u0131 daha k\u00fc\u00e7\u00fck par\u00e7ac\u0131klara sahiptir, bu da daha d\u00fc\u015f\u00fck z\u0131mparalama h\u0131zlar\u0131 ve daha ince y\u00fczey kalitesi sa\u011flar. Ayn\u0131 kum numaras\u0131na sahip ancak farkl\u0131 malzemelerden yap\u0131lm\u0131\u015f z\u0131mpara ka\u011f\u0131tlar\u0131, kuru veya \u0131slak ko\u015fullar alt\u0131nda benzer olmayan davran\u0131\u015flara sahip olabilir. \u00dcretilen z\u0131mpara ka\u011f\u0131d\u0131n\u0131n istenen a\u015f\u0131nd\u0131r\u0131c\u0131 davran\u0131\u015fa sahip oldu\u011fundan emin olmak i\u00e7in g\u00fcvenilir tribolojik de\u011ferlendirmelere ihtiya\u00e7 vard\u0131r. Bu de\u011ferlendirmeler, kullan\u0131c\u0131lar\u0131n hedef uygulama i\u00e7in en iyi aday\u0131 se\u00e7mek amac\u0131yla farkl\u0131 z\u0131mpara ka\u011f\u0131d\u0131 t\u00fcrlerinin a\u015f\u0131nma davran\u0131\u015flar\u0131n\u0131 kontroll\u00fc ve izlenen bir \u015fekilde niceliksel olarak kar\u015f\u0131la\u015ft\u0131rmas\u0131na olanak tan\u0131r.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u00d6L\u00c7\u00dcM HEDEFI<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Bu \u00e7al\u0131\u015fmada, NANOVEA T2000 Y\u00fcksek Y\u00fckl\u00fc Pn\u00f6matik Tribometre'nin kuru ve \u0131slak ko\u015fullar alt\u0131nda \u00e7e\u015fitli z\u0131mpara ka\u011f\u0131d\u0131 \u00f6rneklerinin a\u015f\u0131nma performans\u0131n\u0131 nicel olarak de\u011ferlendirme yetene\u011fini sergiliyoruz.<\/em><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA T2000 Y\u00fcksek Y\u00fck
<\/span>Pn\u00f6matik Tribometre<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\t\"NANOVEA\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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TEST PROSED\u00dcRLERI<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\u0130ki tip z\u0131mpara ka\u011f\u0131d\u0131n\u0131n s\u00fcrt\u00fcnme katsay\u0131s\u0131 (COF) ve a\u015f\u0131nma performans\u0131 NANOVEA T100 Tribometre ile de\u011ferlendirildi. Kar\u015f\u0131 malzeme olarak 440 paslanmaz \u00e7elik bilya kullan\u0131ld\u0131. Bilye a\u015f\u0131nma izleri, NANOVEA kullan\u0131larak her a\u015f\u0131nma testinden sonra incelendi. 3D Temass\u0131z Optik Profil Olu\u015fturucu<\/a> Hassas hacim kayb\u0131 \u00f6l\u00e7\u00fcmleri sa\u011flamak i\u00e7in.<\/p>

Kar\u015f\u0131la\u015ft\u0131rmal\u0131 bir \u00e7al\u0131\u015fma olu\u015fturmak i\u00e7in kar\u015f\u0131 malzeme olarak 440 paslanmaz \u00e7elik bilyenin se\u00e7ildi\u011fini, ancak farkl\u0131 bir uygulama ko\u015fulunu sim\u00fcle etmek i\u00e7in herhangi bir kat\u0131 malzemenin ikame edilebilece\u011fini l\u00fctfen unutmay\u0131n.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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TEST SONU\u00c7LARI VE TARTI\u015eMA<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\u015eEK\u0130L 1'de kuru ve \u0131slak ortam ko\u015fullar\u0131nda Z\u0131mpara Ka\u011f\u0131d\u0131 1 ve 2'nin COF kar\u015f\u0131la\u015ft\u0131rmas\u0131 g\u00f6sterilmektedir. Z\u0131mpara ka\u011f\u0131d\u0131 1, kuru ko\u015fullar alt\u0131nda, testin ba\u015f\u0131nda 0,4'l\u00fck bir COF g\u00f6stermekte ve bu de\u011fer giderek azalarak 0,3'te sabitlenmektedir. Islak ko\u015fullar alt\u0131nda, bu numune 0,27'lik daha d\u00fc\u015f\u00fck bir ortalama COF sergilemektedir. Buna kar\u015f\u0131l\u0131k, \u00d6rnek 2'nin COF sonu\u00e7lar\u0131 kuru COF de\u011ferinin 0,27 ve \u0131slak COF de\u011ferinin ~ 0,37 oldu\u011funu g\u00f6stermektedir.\u00a0<\/p>

L\u00fctfen t\u00fcm COF grafikleri i\u00e7in verilerdeki sal\u0131n\u0131m\u0131n, bilyenin p\u00fcr\u00fczl\u00fc z\u0131mpara ka\u011f\u0131d\u0131 y\u00fczeylerine kar\u015f\u0131 kayma hareketinden kaynaklanan titre\u015fimlerden kaynakland\u0131\u011f\u0131n\u0131 unutmay\u0131n.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\u015eEK\u0130L 1: <\/span>A\u015f\u0131nma testleri s\u0131ras\u0131nda COF'un evrimi.<\/span>
<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u015eEK\u0130L 2 a\u015f\u0131nma izi analizinin sonu\u00e7lar\u0131n\u0131 \u00f6zetlemektedir. A\u015f\u0131nma izleri bir optik mikroskop ve bir NANOVEA 3D Temass\u0131z Optik Profilleyici kullan\u0131larak \u00f6l\u00e7\u00fclm\u00fc\u015ft\u00fcr. \u015eEK\u0130L 3 ve \u015eEK\u0130L 4, Z\u0131mpara Ka\u011f\u0131d\u0131 1 ve 2 (\u0131slak ve kuru ko\u015fullar) \u00fczerindeki a\u015f\u0131nma testleri sonras\u0131nda a\u015f\u0131nm\u0131\u015f SS440 bilyelerin a\u015f\u0131nma izlerini kar\u015f\u0131la\u015ft\u0131rmaktad\u0131r. \u015eEK\u0130L 4'te g\u00f6sterildi\u011fi gibi, NANOVEA Optik Profilleyici d\u00f6rt bilyenin y\u00fczey topografisini ve ilgili a\u015f\u0131nma izlerini hassas bir \u015fekilde yakalar ve daha sonra hacim kayb\u0131n\u0131 ve a\u015f\u0131nma oran\u0131n\u0131 hesaplamak i\u00e7in NANOVEA Mountains Geli\u015fmi\u015f Analiz yaz\u0131l\u0131m\u0131 ile i\u015flenir. Bilyenin mikroskop ve profil g\u00f6r\u00fcnt\u00fcs\u00fcnde, Z\u0131mpara Ka\u011f\u0131d\u0131 1 (kuru) testi i\u00e7in kullan\u0131lan bilyenin 0,313 hacim kayb\u0131 ile di\u011ferlerine k\u0131yasla daha b\u00fcy\u00fck bir d\u00fczle\u015ftirilmi\u015f a\u015f\u0131nma izi sergiledi\u011fi g\u00f6zlemlenebilir.\u00a0mm<\/span>3<\/sup>. Buna kar\u015f\u0131l\u0131k, Z\u0131mpara Ka\u011f\u0131d\u0131 1 (\u0131slak) i\u00e7in hacim kayb\u0131 0,131\u00a0mm<\/span>3<\/sup>. Z\u0131mpara Ka\u011f\u0131d\u0131 2 (kuru) i\u00e7in hacim kayb\u0131 0,163't\u00fcr\u00a0mm<\/span>3<\/sup>\u00a0ve Z\u0131mpara Ka\u011f\u0131d\u0131 2 (\u0131slak) i\u00e7in hacim kayb\u0131 0,237'ye y\u00fckselmi\u015ftir\u00a0mm<\/span>3<\/sup>.<\/p>

Ayr\u0131ca, COF'nin z\u0131mpara ka\u011f\u0131tlar\u0131n\u0131n a\u015f\u0131nma performans\u0131nda \u00f6nemli bir rol oynad\u0131\u011f\u0131n\u0131 g\u00f6zlemlemek ilgin\u00e7tir. Z\u0131mpara ka\u011f\u0131d\u0131 1 kuru durumda daha y\u00fcksek COF sergilemi\u015f ve testte kullan\u0131lan SS440 bilye i\u00e7in daha y\u00fcksek bir a\u015f\u0131nma oran\u0131na yol a\u00e7m\u0131\u015ft\u0131r. Buna kar\u015f\u0131l\u0131k, Z\u0131mpara Ka\u011f\u0131d\u0131 2'nin \u0131slak ko\u015fuldaki daha y\u00fcksek COF'si daha y\u00fcksek bir a\u015f\u0131nma oran\u0131yla sonu\u00e7lanm\u0131\u015ft\u0131r. \u00d6l\u00e7\u00fcmlerden sonra z\u0131mpara ka\u011f\u0131tlar\u0131n\u0131n a\u015f\u0131nma izleri \u015eEK\u0130L 5'te g\u00f6sterilmektedir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Z\u0131mpara Ka\u011f\u0131tlar\u0131 1 ve 2'nin her ikisi de kuru ve \u0131slak ortamlarda \u00e7al\u0131\u015ft\u0131\u011f\u0131n\u0131 iddia ediyor. Ancak kuru ve \u0131slak ko\u015fullarda \u00f6nemli \u00f6l\u00e7\u00fcde farkl\u0131 a\u015f\u0131nma performans\u0131 sergilediler. NANOVEA tribometreler <\/a>tekrarlanabilir a\u015f\u0131nma de\u011ferlendirmeleri sa\u011flayan, iyi kontrol edilen, \u00f6l\u00e7\u00fclebilir ve g\u00fcvenilir a\u015f\u0131nma de\u011ferlendirme yetenekleri sa\u011flar. Dahas\u0131, yerinde COF \u00f6l\u00e7\u00fcm\u00fc kapasitesi, kullan\u0131c\u0131lar\u0131n bir a\u015f\u0131nma s\u00fcrecinin farkl\u0131 a\u015famalar\u0131n\u0131 COF'nin geli\u015fimi ile ili\u015fkilendirmesine olanak tan\u0131r; bu, a\u015f\u0131nma mekanizmas\u0131n\u0131n ve z\u0131mpara ka\u011f\u0131d\u0131n\u0131n tribolojik \u00f6zelliklerinin temel anlay\u0131\u015f\u0131n\u0131n geli\u015ftirilmesinde kritik \u00f6neme sahiptir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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\u015eEK\u0130L 2: <\/span>Bilyalar\u0131n a\u015f\u0131nma izi hacmi ve farkl\u0131 ko\u015fullar alt\u0131nda ortalama COF.<\/span>
<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\u015eEK\u0130L 3: <\/span>Testlerden sonra toplar\u0131n yara izleri.<\/span>
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\u015eEK\u0130L 4: <\/span>Bilyelerdeki a\u015f\u0131nma izlerinin 3D morfolojisi.<\/span>
<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"z\u0131mpara\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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\u015eEK\u0130L 5: <\/span>Farkl\u0131 ko\u015fullar alt\u0131nda z\u0131mpara ka\u011f\u0131tlar\u0131 \u00fczerindeki a\u015f\u0131nma izleri.<\/span>
<\/span><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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SONU\u00c7<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Bu \u00e7al\u0131\u015fmada, ayn\u0131 kum numaras\u0131na sahip iki tip z\u0131mpara ka\u011f\u0131d\u0131n\u0131n a\u015f\u0131nma performans\u0131 kuru ve \u0131slak ko\u015fullar alt\u0131nda de\u011ferlendirilmi\u015ftir. Z\u0131mpara ka\u011f\u0131d\u0131n\u0131n servis ko\u015fullar\u0131, \u00e7al\u0131\u015fma performans\u0131n\u0131n etkinli\u011finde kritik bir rol oynamaktad\u0131r. Z\u0131mpara ka\u011f\u0131d\u0131 1 kuru ko\u015fullar alt\u0131nda \u00f6nemli \u00f6l\u00e7\u00fcde daha iyi a\u015f\u0131nma davran\u0131\u015f\u0131na sahipken, Z\u0131mpara ka\u011f\u0131d\u0131 2 \u0131slak ko\u015fullar alt\u0131nda daha iyi performans g\u00f6stermi\u015ftir. Z\u0131mparalama i\u015flemi s\u0131ras\u0131ndaki s\u00fcrt\u00fcnme, a\u015f\u0131nma performans\u0131n\u0131 de\u011ferlendirirken g\u00f6z \u00f6n\u00fcnde bulundurulmas\u0131 gereken \u00f6nemli bir fakt\u00f6rd\u00fcr. NANOVEA Optik Profilleyici, bilye \u00fczerindeki a\u015f\u0131nma izleri gibi herhangi bir y\u00fczeyin 3D morfolojisini hassas bir \u015fekilde \u00f6l\u00e7erek bu \u00e7al\u0131\u015fmada z\u0131mpara ka\u011f\u0131d\u0131n\u0131n a\u015f\u0131nma performans\u0131 hakk\u0131nda g\u00fcvenilir bir de\u011ferlendirme yap\u0131lmas\u0131n\u0131 sa\u011flar. NANOVEA Tribometre, bir a\u015f\u0131nma testi s\u0131ras\u0131nda s\u00fcrt\u00fcnme katsay\u0131s\u0131n\u0131 yerinde \u00f6l\u00e7erek bir a\u015f\u0131nma s\u00fcrecinin farkl\u0131 a\u015famalar\u0131 hakk\u0131nda fikir verir. Ayr\u0131ca, ISO ve ASTM uyumlu rotatif ve lineer modlar\u0131 kullanarak tekrarlanabilir a\u015f\u0131nma ve s\u00fcrt\u00fcnme testleri sunar ve iste\u011fe ba\u011fl\u0131 y\u00fcksek s\u0131cakl\u0131k a\u015f\u0131nma ve ya\u011flama mod\u00fclleri \u00f6nceden entegre edilmi\u015f tek bir sistemde mevcuttur. Bu e\u015fsiz \u00fcr\u00fcn yelpazesi, kullan\u0131c\u0131lar\u0131n y\u00fcksek stres, a\u015f\u0131nma ve y\u00fcksek s\u0131cakl\u0131k vb. dahil olmak \u00fczere bilyal\u0131 rulmanlar\u0131n farkl\u0131 zorlu \u00e7al\u0131\u015fma ortamlar\u0131n\u0131 sim\u00fcle etmelerine olanak tan\u0131r. Ayr\u0131ca, y\u00fcksek y\u00fckler alt\u0131nda \u00fcst\u00fcn a\u015f\u0131nma diren\u00e7li malzemelerin tribolojik davran\u0131\u015flar\u0131n\u0131 nicel olarak de\u011ferlendirmek i\u00e7in ideal bir ara\u00e7 sa\u011flar.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

SANDPAPER ABRASION PERFORMANCE USING A TRIBOMETER Prepared by DUANJIE LI, PhD INTRODUCTION Sandpaper consists of abrasive particles glued to one face of a paper or cloth. Various abrasive materials can be used for the particles, such as garnet, silicon carbide, aluminum oxide and diamond. Sandpaper is widely applied in a variety of industrial sectors to […]<\/p>","protected":false},"author":1,"featured_media":16073,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,380,355,335,373,336],"tags":[],"class_list":["post-16045","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-liquid-tribology","category-profilometry-volume-area","category-profilometry-testing","category-rotational-tribology","category-tribology-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/16045","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=16045"}],"version-history":[{"count":66,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/16045\/revisions"}],"predecessor-version":[{"id":24581,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/16045\/revisions\/24581"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/16073"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=16045"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=16045"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=16045"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}