{"id":1243,"date":"2012-01-07T00:25:06","date_gmt":"2012-01-07T00:25:06","guid":{"rendered":"http:\/\/nanovea.com\/?p=1243"},"modified":"2015-06-18T16:35:41","modified_gmt":"2015-06-18T16:35:41","slug":"connector-pin-inspection-with-3d-profilometry","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/connector-pin-inspection-with-3d-profilometry\/","title":{"rendered":"3D Profilometri ile Konnekt\u00f6r Pimi Kontrol\u00fc"},"content":{"rendered":"<p>Bu uygulamada, Nanovea ST400 <a title=\"profilometre\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Profilometre<\/a> bir konekt\u00f6r y\u00fczeyinin ve pimlerinin t\u00fcm alan\u0131n\u0131 \u00f6l\u00e7mek i\u00e7in kullan\u0131l\u0131r. Uygulama, Nanovea'n\u0131n tekni\u011fi ile \u00f6l\u00e7\u00fcm se\u00e7eneklerini vurgularken zorlu \u00f6zellikleri nedeniyle se\u00e7ildi. Y\u00fczey taramas\u0131ndan sonra otomatik olarak hesaplanabilen sonsuz bir y\u00fczey parametresi listesi vard\u0131r. Burada tam 3D profili, konnekt\u00f6r taban\u0131n\u0131n d\u00fczl\u00fc\u011f\u00fcn\u00fc, pimlerin e\u015f d\u00fczlemlili\u011fini ve bir pim ucunun p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fcn\u00fc inceleyece\u011fiz.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/connector-pin-inspection.pdf\">3D Profilometri ile Konnekt\u00f6r Pimi Kontrol\u00fc<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application, the Nanovea ST400 Profilometer is used to measure the full area of a connector surface and its pins. The application was chosen for its challenging features while highlighting the measurement options with Nanovea\u2019s technique. There is an endless list surface parameters that can be automatically calculated after the surface scan. Here we [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1244,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[183],"class_list":["post-1243","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-connector-pin"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1243","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=1243"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1243\/revisions"}],"predecessor-version":[{"id":1801,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1243\/revisions\/1801"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/1244"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=1243"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=1243"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=1243"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}