{"id":11898,"date":"2021-06-25T16:05:59","date_gmt":"2021-06-25T16:05:59","guid":{"rendered":"https:\/\/nanovea.com\/?p=11898"},"modified":"2025-05-22T20:41:19","modified_gmt":"2025-05-22T20:41:19","slug":"yuzey-sinir-olcumu","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/yuzey-sinir-olcumu\/","title":{"rendered":"Y\u00fczey S\u0131n\u0131r \u00d6l\u00e7\u00fcm\u00fc"},"content":{"rendered":"
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3D Profilometri Kullanarak Y\u00fczey S\u0131n\u0131r \u00d6l\u00e7\u00fcm\u00fc<\/p>

Daha fazla bilgi edinin<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Y\u00dcZEY SINIR \u00d6L\u00c7\u00dcM\u00dc<\/span><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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3 BOYUTLU PROFILOMETRI KULLANARAK<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Taraf\u0131ndan haz\u0131rlanm\u0131\u015ft\u0131r<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Craig Leising<\/span><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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G\u0130R\u0130\u015e<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Y\u00fczey \u00f6zelliklerinin, desenlerin, \u015fekillerin vb. aray\u00fcz\u00fcn\u00fcn oryantasyon i\u00e7in de\u011ferlendirildi\u011fi \u00e7al\u0131\u015fmalarda, \u00f6l\u00e7\u00fcm profilinin tamam\u0131 \u00fczerinde ilgilenilen alanlar\u0131 h\u0131zl\u0131 bir \u015fekilde belirlemek faydal\u0131 olacakt\u0131r. Kullan\u0131c\u0131, bir y\u00fczeyi \u00f6nemli alanlara b\u00f6lerek, incelenen t\u00fcm y\u00fczey profilindeki i\u015flevsel rollerini anlamak i\u00e7in s\u0131n\u0131rlar\u0131, tepeleri, \u00e7ukurlar\u0131, alanlar\u0131, hacimleri ve di\u011ferlerini h\u0131zl\u0131 bir \u015fekilde de\u011ferlendirebilir. \u00d6rne\u011fin, metallerin tane s\u0131n\u0131r\u0131 g\u00f6r\u00fcnt\u00fclemesinde oldu\u011fu gibi, analizin \u00f6nemi bir\u00e7ok yap\u0131n\u0131n aray\u00fcz\u00fc ve bunlar\u0131n genel y\u00f6nelimidir. Her bir ilgi alan\u0131n\u0131n anla\u015f\u0131lmas\u0131yla, genel alan i\u00e7indeki kusurlar ve \/ veya anormallikler tan\u0131mlanabilir. Tane s\u0131n\u0131r\u0131 g\u00f6r\u00fcnt\u00fcleme tipik olarak Profilometre kapasitesini a\u015fan bir aral\u0131kta \u00e7al\u0131\u015f\u0131lmas\u0131na ve yaln\u0131zca 2D g\u00f6r\u00fcnt\u00fc analizi olmas\u0131na ra\u011fmen, burada g\u00f6sterilecek olan kavram\u0131 3D y\u00fczey \u00f6l\u00e7\u00fcm avantajlar\u0131yla birlikte daha b\u00fcy\u00fck \u00f6l\u00e7ekte g\u00f6stermek i\u00e7in yararl\u0131 bir referanst\u0131r.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Y\u00dcZEY AYIRMA \u00c7ALI\u015eMASI I\u0307\u00c7I\u0307N 3 BOYUTLU TEMASSIZ PROFI\u0307LOMETRENI\u0307N \u00d6NEMI\u0307 \n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Temasl\u0131 problar veya interferometri gibi di\u011fer tekniklerin aksine, 3D Temass\u0131z Profilometre<\/a>Eksenel kromatizmi kullanarak neredeyse her y\u00fczeyi \u00f6l\u00e7ebilir, a\u00e7\u0131k a\u015famaland\u0131rma nedeniyle numune boyutlar\u0131 b\u00fcy\u00fck \u00f6l\u00e7\u00fcde de\u011fi\u015febilir ve numune haz\u0131rlamaya gerek yoktur. Nanodan makroya kadar aral\u0131k, y\u00fczey profili \u00f6l\u00e7\u00fcm\u00fc s\u0131ras\u0131nda numune yans\u0131tma veya absorpsiyondan s\u0131f\u0131r etkiyle elde edilir, y\u00fcksek y\u00fczey a\u00e7\u0131lar\u0131n\u0131 \u00f6l\u00e7me konusunda geli\u015fmi\u015f bir yetene\u011fe sahiptir ve sonu\u00e7lar\u0131n yaz\u0131l\u0131mla manip\u00fclasyonu gerekmez. Herhangi bir malzemeyi kolayca \u00f6l\u00e7\u00fcn: \u015feffaf, opak, aynasal, da\u011f\u0131n\u0131k, cilal\u0131, p\u00fcr\u00fczl\u00fc vb. Temass\u0131z Profilometre tekni\u011fi, y\u00fczey s\u0131n\u0131r analizine ihtiya\u00e7 duyuldu\u011funda y\u00fczey \u00e7al\u0131\u015fmalar\u0131n\u0131 en \u00fcst d\u00fczeye \u00e7\u0131karmak i\u00e7in ideal, geni\u015f ve kullan\u0131c\u0131 dostu bir yetenek sa\u011flar; kombine 2D ve 3D yetene\u011finin avantajlar\u0131yla birlikte.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\u00d6L\u00c7\u00dcM HEDEFI<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Bu uygulamada straforun y\u00fczey alan\u0131n\u0131 \u00f6l\u00e7mek i\u00e7in Nanovea ST400 Profilometre kullan\u0131lm\u0131\u015ft\u0131r. S\u0131n\u0131rlar, NANOVEA ST400 kullan\u0131larak e\u015f zamanl\u0131 olarak elde edilen topografya ile birlikte yans\u0131yan bir yo\u011funluk dosyas\u0131 birle\u015ftirilerek olu\u015fturulmu\u015ftur. Bu veriler daha sonra her bir strafor \"tanesinin\" farkl\u0131 \u015fekil ve boyut bilgilerini hesaplamak i\u00e7in kullan\u0131lm\u0131\u015ft\u0131r.<\/em><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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ST400<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\tBULGULAR VE TARTI\u015eMA: 2B Y\u00fczey S\u0131n\u0131r \u00d6l\u00e7\u00fcm\u00fc\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Tane s\u0131n\u0131rlar\u0131n\u0131 net bir \u015fekilde tan\u0131mlamak i\u00e7in yans\u0131yan yo\u011funluk g\u00f6r\u00fcnt\u00fcs\u00fc (sa\u011f altta) ile maskelenmi\u015f topografi g\u00f6r\u00fcnt\u00fcs\u00fc (sol altta). 565\u00b5m \u00e7ap\u0131n alt\u0131ndaki t\u00fcm taneler filtre uygulanarak g\u00f6z ard\u0131 edilmi\u015ftir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Toplam tah\u0131l say\u0131s\u0131: 167
\nTah\u0131llar taraf\u0131ndan i\u015fgal edilen toplam projeksiyon alan\u0131: 166,917 mm\u00b2 (64,5962 %)
\nS\u0131n\u0131rlar taraf\u0131ndan i\u015fgal edilen toplam \u00f6ng\u00f6r\u00fclen alan: (35.4038 %)
\nTane yo\u011funlu\u011fu: 0,646285 tane \/ mm2<\/p>\nAlan = 0,999500 mm\u00b2 +\/- 0,491846 mm\u00b2
\n\u00c7evre = 9114,15 \u00b5m +\/- 4570,38 \u00b5m
\nE\u015fde\u011fer \u00e7ap = 1098,61 \u00b5m +\/- 256,235 \u00b5m
\nOrtalama \u00e7ap = 945.373 \u00b5m +\/- 248.344 \u00b5m
\nMin \u00e7ap = 675.898 \u00b5m +\/- 246.850 \u00b5m
\nMaksimum \u00e7ap = 1312,43 \u00b5m +\/- 295,258 \u00b5m\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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BULGULAR VE TARTI\u015eMA: 3D Y\u00fczey S\u0131n\u0131r \u00d6l\u00e7\u00fcm\u00fc<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Elde edilen 3D topografi verileri kullan\u0131larak her bir tanenin hacmi, y\u00fcksekli\u011fi, tepe noktas\u0131, en-boy oran\u0131 ve genel \u015fekil bilgileri analiz edilebilmektedir. Kaplanan toplam 3D alan: 2.525mm3<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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SONU\u00c7<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Bu uygulamada, NANOVEA 3D Temass\u0131z Profilometrenin strafor y\u00fczeyini nas\u0131l hassas bir \u015fekilde karakterize edebilece\u011fini g\u00f6sterdik. \u0130statistiksel bilgiler, ilgilenilen y\u00fczeyin tamam\u0131nda veya ister tepe ister \u00e7ukur olsun, tek tek taneler \u00fczerinde elde edilebilir. Bu \u00f6rnekte, kullan\u0131c\u0131 taraf\u0131ndan tan\u0131mlanan boyuttan daha b\u00fcy\u00fck t\u00fcm taneler alan, \u00e7evre, \u00e7ap ve y\u00fcksekli\u011fi g\u00f6stermek i\u00e7in kullan\u0131lm\u0131\u015ft\u0131r. Burada g\u00f6sterilen \u00f6zellikler, biyo medikalden mikro i\u015fleme uygulamalar\u0131na ve di\u011fer bir\u00e7ok uygulamaya kadar do\u011fal ve \u00f6nceden imal edilmi\u015f y\u00fczeylerin ara\u015ft\u0131r\u0131lmas\u0131 ve kalite kontrol\u00fc i\u00e7in kritik \u00f6neme sahip olabilir.\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

3D Profilometri Kullanarak Y\u00fczey S\u0131n\u0131r \u00d6l\u00e7\u00fcm\u00fc Daha fazla bilgi<\/p>","protected":false},"author":1,"featured_media":12155,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,350,351,353,355,335],"tags":[],"class_list":["post-11898","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-geometry-shape","category-profilometry-roughness-finish","category-profilometry-texture-grain","category-profilometry-volume-area","category-profilometry-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/11898","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=11898"}],"version-history":[{"count":33,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/11898\/revisions"}],"predecessor-version":[{"id":24740,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/11898\/revisions\/24740"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/12155"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=11898"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=11898"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=11898"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}