{"id":1066,"date":"2013-08-06T18:29:12","date_gmt":"2013-08-06T18:29:12","guid":{"rendered":"http:\/\/nanovea.com\/?p=1066"},"modified":"2015-06-17T17:00:55","modified_gmt":"2015-06-17T17:00:55","slug":"karbon-fiber-yuzey-olcumu-kullanarak-3d-profilometri","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/carbon-fiber-surface-measurement-using-3d-profilometry\/","title":{"rendered":"3D Profilometri Kullanarak Y\u00fczey \u00d6l\u00e7\u00fcm\u00fc"},"content":{"rendered":"<p>Bu uygulamada Nanovea ST400 <a title=\"profilometre\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Profilomete<\/a>r, a\u00e7\u0131kta kalan bir karbon fiber par\u00e7as\u0131n\u0131n y\u00fczey \u00f6l\u00e7\u00fcm\u00fc i\u00e7in kullan\u0131l\u0131r. \u00d6l\u00e7\u00fclen alan rastgele se\u00e7ilmi\u015ftir ve a hakk\u0131nda varsay\u0131mlarda bulunmak i\u00e7in tahmin edilebilecek kadar b\u00fcy\u00fck oldu\u011fu varsay\u0131lm\u0131\u015ft\u0131r.<br \/>\n\u00e7ok daha b\u00fcy\u00fck bir y\u00fczey. Y\u00fczeyi karakterize etmek i\u00e7in y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc, y\u00fczey alan\u0131, dalga boyu, fraktal analiz ve di\u011fer y\u00fczey parametreleri kullan\u0131l\u0131r.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/carbon-fiber-measurement.pdf\">3D Profilometri Kullanarak Y\u00fczey \u00d6l\u00e7\u00fcm\u00fc<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application the Nanovea ST400 Profilometer is used for surface measurement of an exposed piece of carbon fiber. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a much larger surface. Surface roughness, surface area, wavelength, fractal analysis and other surface parameters [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1067,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[155],"class_list":["post-1066","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-surface-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1066","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=1066"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1066\/revisions"}],"predecessor-version":[{"id":1741,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1066\/revisions\/1741"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/1067"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=1066"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=1066"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=1066"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}